R. Reiche

858 total citations
30 papers, 747 citations indexed

About

R. Reiche is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, R. Reiche has authored 30 papers receiving a total of 747 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 13 papers in Materials Chemistry and 12 papers in Surfaces, Coatings and Films. Recurrent topics in R. Reiche's work include Electron and X-Ray Spectroscopy Techniques (12 papers), Semiconductor materials and devices (12 papers) and Semiconductor materials and interfaces (7 papers). R. Reiche is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (12 papers), Semiconductor materials and devices (12 papers) and Semiconductor materials and interfaces (7 papers). R. Reiche collaborates with scholars based in Germany, Spain and India. R. Reiche's co-authors include Steffen Oswald, K. Wetzig, M. Zier, J.P. Espinós, Agustín R. González‐Elipe, Roland Thielsch, F. Yubero, Thomas Böhme, D. Schläfer and H. Böttcher and has published in prestigious journals such as Journal of Applied Physics, The Journal of Physical Chemistry B and Applied Surface Science.

In The Last Decade

R. Reiche

29 papers receiving 724 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R. Reiche Germany 17 474 393 140 128 126 30 747
L. Cota‐Araiza Mexico 19 424 0.9× 619 1.6× 91 0.7× 91 0.7× 88 0.7× 92 896
J. A. Kelber United States 16 385 0.8× 368 0.9× 48 0.3× 150 1.2× 129 1.0× 36 636
C. J. Blomfield United Kingdom 11 258 0.5× 285 0.7× 152 1.1× 54 0.4× 92 0.7× 18 574
A. Ermolieff France 14 510 1.1× 382 1.0× 52 0.4× 93 0.7× 95 0.8× 38 723
Rongguang Zeng China 14 558 1.2× 542 1.4× 141 1.0× 70 0.5× 85 0.7× 43 920
R. E. Cook United States 13 302 0.6× 478 1.2× 31 0.2× 136 1.1× 124 1.0× 33 853
J. Sapjeta United States 10 799 1.7× 370 0.9× 81 0.6× 119 0.9× 168 1.3× 29 951
Nobuo Kieda Japan 11 151 0.3× 320 0.8× 136 1.0× 53 0.4× 62 0.5× 40 616
C. Ottermann Germany 14 438 0.9× 451 1.1× 56 0.4× 106 0.8× 51 0.4× 33 784
J. Lascovich Italy 10 201 0.4× 520 1.3× 98 0.7× 47 0.4× 80 0.6× 16 741

Countries citing papers authored by R. Reiche

Since Specialization
Citations

This map shows the geographic impact of R. Reiche's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Reiche with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Reiche more than expected).

Fields of papers citing papers by R. Reiche

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Reiche. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Reiche. The network helps show where R. Reiche may publish in the future.

Co-authorship network of co-authors of R. Reiche

This figure shows the co-authorship network connecting the top 25 collaborators of R. Reiche. A scholar is included among the top collaborators of R. Reiche based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Reiche. R. Reiche is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Weinreich, Wenke, R. Reiche, M. Lemberger, et al.. (2009). Impact of interface variations on J–V and C–V polarity asymmetry of MIM capacitors with amorphous and crystalline Zr(1−)Al O2 films. Microelectronic Engineering. 86(7-9). 1826–1829. 58 indexed citations
2.
Oswald, Steffen, M. Zier, R. Reiche, & K. Wetzig. (2006). Angle‐resolved XPS: a critical evaluation for various applications. Surface and Interface Analysis. 38(4). 590–594. 23 indexed citations
3.
Strehle, Steffen, R. Reiche, Volker Hoffmann, et al.. (2006). Sulfur incorporation in electroplated Cu(Ag) thin films. Microchimica Acta. 156(1-2). 167–172. 9 indexed citations
4.
Мансилла, C., F. Yubero, M. Zier, et al.. (2006). First stages of growth of cerium oxide deposited on alumina and reduced titania surfaces. Surface and Interface Analysis. 38(4). 510–513. 6 indexed citations
5.
Zier, M., Steffen Oswald, R. Reiche, & K. Wetzig. (2005). XPS and ARXPS investigations of ultra thin TaN films deposited on SiO2 and Si. Applied Surface Science. 252(1). 234–239. 39 indexed citations
6.
Oswald, Steffen, R. Reiche, M. Zier, S. Baunack, & K. Wetzig. (2005). Depth profile and interface analysis in the nm-range. Applied Surface Science. 252(1). 3–10. 27 indexed citations
7.
Reiche, R., et al.. (2004). Analytical investigations of tunnel magnetoresistance layers. Analytical and Bioanalytical Chemistry. 379(4). 576–81. 2 indexed citations
8.
Zier, M., et al.. (2004). Interface formation and reactions at Ta–Si and Ta–SiO2 interfaces studied by XPS and ARXPS. Journal of Electron Spectroscopy and Related Phenomena. 137-140. 229–233. 45 indexed citations
9.
Reiche, R., et al.. (2004). Quantitative ARXPS investigation of systems with ultrathin aluminium oxide layers. Surface and Interface Analysis. 36(13). 1600–1608. 28 indexed citations
10.
Hübner, René, R. Reiche, M. Hecker, et al.. (2004). Void formation in the Cu layer during thermal treatment of SiNx/Cu/Ta73Si27/SiO2/Si systems. Crystal Research and Technology. 40(1-2). 135–142. 6 indexed citations
11.
Zier, M., Steffen Oswald, R. Reiche, & K. Wetzig. (2003). XPS investigations of thin tantalum films on a silicon surface. Analytical and Bioanalytical Chemistry. 375(7). 902–905. 36 indexed citations
12.
Oswald, Steffen, et al.. (2003). Are measured values of the Auger parameter always independent of charging effects?. Surface and Interface Analysis. 35(12). 991–997. 8 indexed citations
13.
Reiche, R., Juan P. Holgado, F. Yubero, J.P. Espinós, & Agustín R. González‐Elipe. (2003). Characterization of Sb 2 O 3 subjected to different ion and plasma surface treatments. Surface and Interface Analysis. 35(3). 256–262. 12 indexed citations
14.
Reiche, R., Dorota Dobler, Juan P. Holgado, et al.. (2003). The Auger parameter and the study of chemical and electronic interactions at the Sb2Ox/SnO2 and Sb2Ox/Al2O3 interfaces. Surface Science. 537(1-3). 228–240. 17 indexed citations
15.
Raju, V. R. K., U. Kühn, Ulrike Wolff, et al.. (2002). Corrosion behaviour of Zr-based bulk glass-forming alloys containing Nb or Ti. Materials Letters. 57(1). 173–177. 72 indexed citations
16.
Oswald, Steffen & R. Reiche. (2001). Binding state information from XPS depth profiling: capabilities and limits. Applied Surface Science. 179(1-4). 307–315. 38 indexed citations
17.
Reiche, R., Roland Thielsch, Steffen Oswald, & K. Wetzig. (1999). XPS studies and factor analysis of PbS nanocrystal-doped SiO2 thin films. Journal of Electron Spectroscopy and Related Phenomena. 104(1-3). 161–171. 33 indexed citations
18.
Reiche, R., et al.. (1999). Bombardment-induced silicide formation at rhenium-silicon interfaces studied by XPS and TEM. Fresenius Journal of Analytical Chemistry. 365(1-3). 76–82. 16 indexed citations
19.
Reiche, R., Steffen Oswald, H. Vinzelberg, et al.. (1997). Investigation of argon ion bombarded Re x Si 1-x thin film composites by XPS, SEM and AES. Fresenius Journal of Analytical Chemistry. 358(1-2). 329–332. 5 indexed citations
20.
Reiche, R.. (1977). Neues Material zu den altdeutschen Nesso-Sprüchen. Archiv für Kulturgeschichte. 59(jg). 1–24. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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