M. Rebien

905 total citations
32 papers, 755 citations indexed

About

M. Rebien is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, M. Rebien has authored 32 papers receiving a total of 755 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Electrical and Electronic Engineering, 17 papers in Atomic and Molecular Physics, and Optics and 7 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in M. Rebien's work include Semiconductor materials and interfaces (16 papers), Semiconductor materials and devices (12 papers) and Surface and Thin Film Phenomena (10 papers). M. Rebien is often cited by papers focused on Semiconductor materials and interfaces (16 papers), Semiconductor materials and devices (12 papers) and Surface and Thin Film Phenomena (10 papers). M. Rebien collaborates with scholars based in Germany, Italy and United States. M. Rebien's co-authors include W. Henrion, H. Angermann, A. Röseler, J. P. Mannáerts, M. Fleischer, O. Jepsen, P. Stauß, H. Lange, J.‐T. Zettler and Ch.‐H. Fischer and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

M. Rebien

32 papers receiving 729 citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
M. Rebien 444 429 299 243 95 32 755
Valdas Jokubavičius 535 1.2× 405 0.9× 114 0.4× 210 0.9× 70 0.7× 61 747
N.B. Ibrahim 470 1.1× 341 0.8× 133 0.4× 221 0.9× 42 0.4× 53 621
Mau‐Phon Houng 580 1.3× 379 0.9× 224 0.7× 152 0.6× 113 1.2× 76 781
Jinwu Wei 244 0.5× 338 0.8× 473 1.6× 359 1.5× 75 0.8× 38 751
Sylwia Gierałtowska 562 1.3× 558 1.3× 109 0.4× 203 0.8× 121 1.3× 57 822
Bouraoui Ilahi 665 1.5× 499 1.2× 412 1.4× 85 0.3× 277 2.9× 95 923
Xiangjun Xing 288 0.6× 222 0.5× 346 1.2× 234 1.0× 90 0.9× 60 679
Zaibing Guo 341 0.8× 770 1.8× 272 0.9× 403 1.7× 119 1.3× 55 1.1k
R. Gregory 988 2.2× 542 1.3× 164 0.5× 162 0.7× 60 0.6× 46 1.1k
Lior Kornblum 488 1.1× 554 1.3× 124 0.4× 273 1.1× 51 0.5× 56 786

Countries citing papers authored by M. Rebien

Since Specialization
Citations

This map shows the geographic impact of M. Rebien's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Rebien with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Rebien more than expected).

Fields of papers citing papers by M. Rebien

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Rebien. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Rebien. The network helps show where M. Rebien may publish in the future.

Co-authorship network of co-authors of M. Rebien

This figure shows the co-authorship network connecting the top 25 collaborators of M. Rebien. A scholar is included among the top collaborators of M. Rebien based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Rebien. M. Rebien is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
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Birdwell, A. Glen, C. L. Littler, R. Glosser, et al.. (2008). Evidence for an indirect gap in β−FeSi2 epilayers by photoreflectance spectroscopy. Applied Physics Letters. 92(21). 3 indexed citations
3.
Yamamoto, Akira, M. Rebien, W. Henrion, et al.. (2005). Growth and morphological properties of β-FeSi2 layers. Applied Surface Science. 244(1-4). 326–329. 2 indexed citations
4.
Birdwell, A. Glen, D. Chandler‐Horowitz, M. Rebien, et al.. (2004). Excitonic transitions in β-FeSi2 epitaxial films and single crystals. Journal of Applied Physics. 95(5). 2441–2447. 10 indexed citations
5.
Angermann, H., W. Henrion, M. Rebien, & A. Röseler. (2004). Wet-chemical passivation and characterization of silicon interfaces for solar cell applications. Solar Energy Materials and Solar Cells. 83(4). 331–346. 31 indexed citations
6.
Мигас, Д. Б., Leo Miglio, M. Rebien, et al.. (2004). Structural, electronic, and optical properties ofβ−(Fe1−xCox)Si2. Physical Review B. 69(11). 2 indexed citations
7.
Angermann, H., W. Henrion, M. Rebien, & A. Röseler. (2004). Wet-chemical preparation and spectroscopic characterization of Si interfaces. Applied Surface Science. 235(3). 322–339. 46 indexed citations
8.
Angermann, H., W. Henrion, M. Rebien, & A. Röseler. (2003). Effect of Preparation-Induced Surface Morphology on the Stability of H-Terminated Si(111) and Si(100) Surfaces. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 92. 179–182. 4 indexed citations
9.
Rebien, M., et al.. (2002). Optical properties of ZnO thin films: Ion layer gas reaction compared to sputter deposition. Applied Physics Letters. 80(19). 3518–3520. 38 indexed citations
10.
Henrion, W., M. Rebien, H. Angermann, & A. Röseler. (2002). Spectroscopic investigations of hydrogen termination, oxide coverage, roughness, and surface state density of silicon during native oxidation in air. Applied Surface Science. 202(3-4). 199–205. 55 indexed citations
11.
Мигас, Д. Б., Leo Miglio, W. Henrion, et al.. (2001). Electronic and optical properties of isostructuralβ−FeSi2andOsSi2. Physical review. B, Condensed matter. 64(7). 33 indexed citations
12.
Lengsfeld, Philipp, Silke Christiansen, M. Nerding, et al.. (2001). Excimer Laser Crystallization of Doped and Undoped a-Si:H for Solar Cells. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 80-81. 181–186. 4 indexed citations
13.
Rebien, M., W. Henrion, H. Angermann, & A. Röseler. (2000). Ellipsometric comparison of the native oxides of silicon and semiconducting iron disilicide (β-FeSi2). Surface Science. 462(1-3). 143–150. 18 indexed citations
14.
Selvan, J. A. Anna, Detlev Grützmacher, E. Müller, et al.. (2000). Comparison of low temperature growth of Si thin films on amorphous substrates by MBE and PECVD methods. MRS Proceedings. 609. 1 indexed citations
15.
Henrion, W., A. Röseler, H. Angermann, & M. Rebien. (1999). Application of UV-VIS and FTIR Spectroscopic Ellipsometry to the Characterization of Wet-Chemically Treated Si Surfaces. physica status solidi (a). 175(1). 121–128. 9 indexed citations
16.
Angermann, H., W. Henrion, A. Röseler, & M. Rebien. (1999). Wet-Chemically Passivated Silicon Interfaces: Characterization by Surface Photovoltage Measurements, and Spectroscopic Ellipsometry Methods. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 67-68. 515–520. 3 indexed citations
17.
Antonov, V. N., O. Jepsen, W. Henrion, et al.. (1998). Electronic structure and optical properties ofβ-FeSi2. Physical review. B, Condensed matter. 57(15). 8934–8938. 46 indexed citations
18.
Henrion, W., M. Rebien, V. N. Antonov, O. Jepsen, & H. Lange. (1998). Optical characterization of Ru2Si3 by spectroscopic ellipsometry, UV-VIS-NIR spectroscopy and band structure calculations. Thin Solid Films. 313-314. 218–221. 13 indexed citations
19.
Angermann, H., W. Henrion, M. Rebien, et al.. (1998). H-terminated silicon: spectroscopic ellipsometry measurements correlated to the surface electronic properties. Thin Solid Films. 313-314. 552–556. 27 indexed citations
20.

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