H. Angermann

1.7k total citations
63 papers, 1.3k citations indexed

About

H. Angermann is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, H. Angermann has authored 63 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 58 papers in Electrical and Electronic Engineering, 35 papers in Materials Chemistry and 12 papers in Surfaces, Coatings and Films. Recurrent topics in H. Angermann's work include Silicon and Solar Cell Technologies (41 papers), Silicon Nanostructures and Photoluminescence (32 papers) and Thin-Film Transistor Technologies (31 papers). H. Angermann is often cited by papers focused on Silicon and Solar Cell Technologies (41 papers), Silicon Nanostructures and Photoluminescence (32 papers) and Thin-Film Transistor Technologies (31 papers). H. Angermann collaborates with scholars based in Germany, United States and Slovakia. H. Angermann's co-authors include M. Schmidt, Lars Korte, E. Conrad, W. Henrion, M. Rebien, A. Röseler, H. Flietner, Rolf Stangl, Bert Stegemann and Uta Stürzebecher and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and Applied Microbiology and Biotechnology.

In The Last Decade

H. Angermann

61 papers receiving 1.3k citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
H. Angermann 1.2k 643 403 235 50 63 1.3k
Daniel Amkreutz 1.1k 0.9× 713 1.1× 112 0.3× 237 1.0× 61 1.2× 66 1.2k
Hiroya Ikeda 584 0.5× 315 0.5× 223 0.6× 97 0.4× 58 1.2× 49 715
Justin R. Sparks 919 0.8× 241 0.4× 413 1.0× 178 0.8× 48 1.0× 41 1.1k
Koki Saito 478 0.4× 216 0.3× 376 0.9× 59 0.3× 21 0.4× 34 703
Mathieu Charrière 741 0.6× 430 0.7× 109 0.3× 342 1.5× 28 0.6× 12 855
H. Flietner 607 0.5× 399 0.6× 308 0.8× 140 0.6× 36 0.7× 44 711
N. G. Emerson 725 0.6× 258 0.4× 267 0.7× 194 0.8× 14 0.3× 22 806
A. Orpella 891 0.7× 390 0.6× 180 0.4× 107 0.5× 33 0.7× 72 959
Philipp Wagner 730 0.6× 704 1.1× 168 0.4× 137 0.6× 34 0.7× 32 1.1k
A. Sotiropoulos 1.1k 0.9× 515 0.8× 590 1.5× 143 0.6× 10 0.2× 24 1.2k

Countries citing papers authored by H. Angermann

Since Specialization
Citations

This map shows the geographic impact of H. Angermann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Angermann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Angermann more than expected).

Fields of papers citing papers by H. Angermann

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Angermann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Angermann. The network helps show where H. Angermann may publish in the future.

Co-authorship network of co-authors of H. Angermann

This figure shows the co-authorship network connecting the top 25 collaborators of H. Angermann. A scholar is included among the top collaborators of H. Angermann based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. Angermann. H. Angermann is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Angermann, H., et al.. (2016). Oxidation of Si Surfaces: Effect of Ambient Air and Water Treatments on Surface Charge and Interface State Density. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 255. 331–337. 2 indexed citations
2.
3.
Kegel, Jan, H. Angermann, Uta Stürzebecher, & Bert Stegemann. (2013). IPA-free Texturization of n-type Si Wafers: Correlation of Optical, Electronic and Morphological Surface Properties. Energy Procedia. 38. 833–842. 34 indexed citations
4.
Stegemann, Bert, Jan Kegel, Uta Stürzebecher, et al.. (2012). Conditioning of Textured Silicon Solar Cell Substrates by Wet-Chemical Treatments. EU PVSEC. 547–551. 4 indexed citations
5.
Angermann, H., et al.. (2012). Electronic interface properties of silicon substrates after ozone based wet-chemical oxidation studied by SPV measurements. Applied Surface Science. 258(21). 8387–8396. 19 indexed citations
6.
Laades, A., M. Bähr, Uta Stürzebecher, et al.. (2012). On the impact of interfacial SiOx‐layer on the passivation properties of PECVD synthesized aluminum oxide. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 9(10-11). 2120–2123. 10 indexed citations
7.
8.
Angermann, H., Marinus Kunst, A. Laades, et al.. (2010). Effect of wet‐chemical substrate pretreatment on electronic interface properties and recombination losses of a ‐Si:H/c ‐Si and a ‐SiNx:H/c ‐Si hetero‐interfaces. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 8(3). 879–882. 18 indexed citations
9.
Laades, A., Jörg Bräuer, Uta Stürzebecher, et al.. (2009). Wet-Chemical Treatment of Solar Grade CZ Silicon Prior to Surface Passivation. EU PVSEC. 1640–1644. 4 indexed citations
10.
Angermann, H., et al.. (2009). Wet-chemical treatment and electronic interface properties of silicon solar cell substrates. Open Physics. 7(2). 363–370. 18 indexed citations
11.
Angermann, H.. (2008). Passivation of structured p-type silicon interfaces: Effect of surface morphology and wet-chemical pre-treatment. Applied Surface Science. 254(24). 8067–8074. 42 indexed citations
12.
Angermann, H., et al.. (2007). Smoothing and passivation of special Si(111) substrates: studied by SPV, PL, AFM and SEM measurements. Analytical and Bioanalytical Chemistry. 390(6). 1463–1470. 9 indexed citations
13.
Angermann, H., Jörg Rappich, Lars Korte, et al.. (2007). Wet-chemical passivation of atomically flat and structured silicon substrates for solar cell application. Applied Surface Science. 254(12). 3615–3625. 49 indexed citations
14.
Angermann, H. & Jörg Rappich. (2007). Surface States and Recombination Loss on Wet-Chemically Passivated Si Studied by Surface Photovoltage (SPV) and Photoluminescence (PL). Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 134. 41–44. 1 indexed citations
15.
Conrad, E., Karsten von Maydell, H. Angermann, C. Schubert, & M. Schmidt. (2006). Optimization of Interface Properties in a-Si:H/c-Si Heterojunction Solar Cells. 1263–1266. 6 indexed citations
16.
Angermann, H.. (2005). Interface State Densities and Surface Charge on Wet-Chemically Prepared Si(100) Surfaces. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 103-104. 23–26. 10 indexed citations
17.
Rebien, M., W. Henrion, H. Angermann, & A. Röseler. (2000). Ellipsometric comparison of the native oxides of silicon and semiconducting iron disilicide (β-FeSi2). Surface Science. 462(1-3). 143–150. 18 indexed citations
18.
Henrion, W., A. Röseler, H. Angermann, & M. Rebien. (1999). Application of UV-VIS and FTIR Spectroscopic Ellipsometry to the Characterization of Wet-Chemically Treated Si Surfaces. physica status solidi (a). 175(1). 121–128. 9 indexed citations
19.
20.
Angermann, H., Th. Dittrich, & H. Flietner. (1994). Investigation of native-oxide growth on HF-treated Si(111) surfaces by measuring the surface-state distribution. Applied Physics A. 59(2). 193–197. 36 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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