L. Marchut
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Metals and Alloys top 10%
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 5
- Co-authors
- T.M. BuckG.H. WheatleyC. J. McMahonI. StensgaardAlbert ChinI. CamlibelF. ErmanisM. A. DiGiuseppe
- Journals
- Microelectronics Reliability (4 papers)Surface Science (2 papers)Journal of Applied Physics (2 papers)IEEE Transactions on Electron Devices (1 paper)Electronics Letters (1 paper)
- Partner nations
- United States
In The Last Decade
L. Marchut
15 papers receiving 433 citations
Peers
Comparison fields: 5 of 42
- Surfaces, Coatings and Films 96
- Metals and Alloys 25
- General Materials Science 21
- Radiation 57
- Atomic and Molecular Physics, and Optics 186
Countries citing papers authored by L. Marchut
This map shows the geographic impact of L. Marchut's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Marchut with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Marchut more than expected).
Fields of papers citing papers by L. Marchut
This network shows the impact of papers produced by L. Marchut. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Marchut. The network helps show where L. Marchut may publish in the future.
Co-authorship network
The 25 scholars most cited alongside L. Marchut, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 1 | |
| 2 | 2011 | 4 | |
| 3 | 2010 | 1 | |
| 4 | Machine model ESD tester for enhanced capacitor reliability | 2009 | 1 |
| 5 | 2008 | 1 | |
| 6 | 2007 | 0 | |
| 7 | 2005 | 1 | |
| 8 | 1990 | 6 | |
| 9 | 1987 | 8 | |
| 10 | 1986 | 2 | |
| 11 | 1985 | 6 | |
| 12 | 1984 | 26 | |
| 13 | 1984 | 1 | |
| 14 | 1983 | 12 | |
| 15 | 1983 | 213 | |
| 16 | 1983 | 22 | |
| 17 | 1981 | 21 | |
| 18 | 1980 | 39 | |
| 19 | 1978 | 94 |
About L. Marchut
L. Marchut is a scholar working on Surfaces, Coatings and Films, Instrumentation, Radiation, Electrical and Electronic Engineering and Computational Mechanics, having authored 19 papers that have together received 459 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (6 papers), Electron and X-Ray Spectroscopy Techniques (5 papers), Ion-surface interactions and analysis (3 papers), Electromagnetic Compatibility and Noise Suppression (3 papers), Electrostatic Discharge in Electronics (3 papers), Electronic Packaging and Soldering Technologies (3 papers), Silicon and Solar Cell Technologies (2 papers) and Semiconductor Quantum Structures and Devices (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (96 citations), Metals and Alloys (25 citations), General Materials Science (21 citations), Radiation (57 citations) and Atomic and Molecular Physics, and Optics (186 citations). L. Marchut has collaborated with scholars based in United States. Frequent co-authors include T.M. Buck, G.H. Wheatley, C. J. McMahon, I. Stensgaard, Albert Chin, I. Camlibel, F. Ermanis, M. A. DiGiuseppe, R. L. Opila and W. M. Augustyniak. Their work appears in journals such as Microelectronics Reliability, Surface Science, Journal of Applied Physics, IEEE Transactions on Electron Devices and Electronics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.