This map shows the geographic impact of Koichi Fukuda's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Koichi Fukuda with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Koichi Fukuda more than expected).
This network shows the impact of papers produced by Koichi Fukuda. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Koichi Fukuda. The network helps show where Koichi Fukuda may publish in the future.
Co-authorship network of co-authors of Koichi Fukuda
This figure shows the co-authorship network connecting the top 25 collaborators of Koichi Fukuda.
A scholar is included among the top collaborators of Koichi Fukuda based on the total number of
citations received by their joint publications. Widths of edges
represent the number of papers authors have co-authored together.
Node borders
signify the number of papers an author published with Koichi Fukuda. Koichi Fukuda is excluded from
the visualization to improve readability, since they are connected to all nodes in the network.
Fukuda, Koichi. (2014). On the short channel effects of tunnel FETs. The Japan Society of Applied Physics.54 indexed citations
8.
Morita, Yukinori, Takahiro Mori, Shinji Migita, et al.. (2013). Synthetic electric field tunnel FETs: Drain current multiplication demonstrated by wrapped gate electrode around ultrathin epitaxial channel. Symposium on VLSI Technology.23 indexed citations
Fukuda, Koichi, et al.. (2005). A 146mm2 8Gb NAND Flash Memory with 70nm CMOS Technology. IEICE Technical Report; IEICE Tech. Rep.. 105(1). 47–52.5 indexed citations
15.
Hayashi, Hirokazu, et al.. (2001). A Simplified Process Modeling for Reverse Short Channel Effect of Threshold Voltage of MOSFET. IEICE Transactions on Electronics. 84(9). 1234–1239.1 indexed citations
16.
Miura, Noriyuki, Hirokazu Hayashi, Koichi Fukuda, & Kenji Nishi. (2000). Systematic Yield Simulation Methodology Applied to Fully-Depleted SOI MOSFET Process. IEICE Transactions on Electronics. 83(8). 1288–1294.1 indexed citations
17.
Hayashi, Hirokazu, Hideaki Matsuhashi, Koichi Fukuda, & Kenji Nishi. (1999). Inverse Modeling and Its Application to MOSFET Channel Profile Extraction. IEICE Transactions on Electronics. 82(6). 862–869.4 indexed citations
18.
Hayashi, Hirokazu, et al.. (1995). An Efficient Extraction Method of MOSFET Channel Doping Profile Using Inverse Modeling Technique. 95(231). 23–28.1 indexed citations
19.
Saika, Shizuya, et al.. (1991). Immunohistochemical study of deposits on intraocular lenses explanted from human eyes.. PubMed. 35(1). 96–101.13 indexed citations
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive
bibliographic database. While OpenAlex provides broad and valuable coverage of the global
research landscape, it—like all bibliographic datasets—has inherent limitations. These include
incomplete records, variations in author disambiguation, differences in journal indexing, and
delays in data updates. As a result, some metrics and network relationships displayed in
Rankless may not fully capture the entirety of a scholar's output or impact.