S. Hofmann

10.1k total citations
239 papers, 8.0k citations indexed

About

S. Hofmann is a scholar working on Computational Mechanics, Electrical and Electronic Engineering and Materials Chemistry. According to data from OpenAlex, S. Hofmann has authored 239 papers receiving a total of 8.0k indexed citations (citations by other indexed papers that have themselves been cited), including 120 papers in Computational Mechanics, 120 papers in Electrical and Electronic Engineering and 74 papers in Materials Chemistry. Recurrent topics in S. Hofmann's work include Ion-surface interactions and analysis (118 papers), Semiconductor materials and devices (73 papers) and Metal and Thin Film Mechanics (67 papers). S. Hofmann is often cited by papers focused on Ion-surface interactions and analysis (118 papers), Semiconductor materials and devices (73 papers) and Metal and Thin Film Mechanics (67 papers). S. Hofmann collaborates with scholars based in Germany, Czechia and Slovenia. S. Hofmann's co-authors include Pavel Lejček, J. M. Sanz, A. Zalar, Hermann Jehn, J. Steffen, J.B. Malherbe, R. Kirchheim, P. Armbruster, H. Ewald and W. Faust and has published in prestigious journals such as Journal of Applied Physics, Analytical Chemistry and Acta Materialia.

In The Last Decade

S. Hofmann

234 papers receiving 7.6k citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
S. Hofmann 3.5k 3.3k 2.6k 2.3k 1.5k 239 8.0k
W. Möller 5.9k 1.7× 3.3k 1.0× 3.5k 1.3× 3.5k 1.5× 481 0.3× 362 9.6k
J.P. Biersack 4.4k 1.3× 3.8k 1.2× 5.2k 2.0× 1.3k 0.6× 843 0.5× 110 9.6k
J. A. Knapp 4.0k 1.1× 1.8k 0.5× 913 0.3× 2.1k 0.9× 934 0.6× 165 7.1k
Herbert M. Urbassek 4.8k 1.4× 1.4k 0.4× 3.7k 1.4× 2.9k 1.3× 404 0.3× 423 8.8k
N.P. Barradas 2.7k 0.8× 2.2k 0.7× 1.2k 0.4× 1.0k 0.4× 777 0.5× 334 6.1k
M. Nastasi 4.6k 1.3× 1.6k 0.5× 1.3k 0.5× 1.9k 0.8× 209 0.1× 250 6.8k
J. Keinonen 6.0k 1.7× 3.5k 1.1× 2.4k 0.9× 1.1k 0.5× 288 0.2× 309 10.0k
M. Mayer 6.0k 1.7× 1.0k 0.3× 1.7k 0.6× 1.4k 0.6× 407 0.3× 250 7.7k
R. S. Averback 8.2k 2.4× 2.3k 0.7× 4.5k 1.7× 1.4k 0.6× 226 0.1× 308 11.8k
Daniel Primetzhofer 2.4k 0.7× 1.5k 0.5× 1.1k 0.4× 1.4k 0.6× 459 0.3× 318 4.7k

Countries citing papers authored by S. Hofmann

Since Specialization
Citations

This map shows the geographic impact of S. Hofmann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Hofmann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Hofmann more than expected).

Fields of papers citing papers by S. Hofmann

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Hofmann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Hofmann. The network helps show where S. Hofmann may publish in the future.

Co-authorship network of co-authors of S. Hofmann

This figure shows the co-authorship network connecting the top 25 collaborators of S. Hofmann. A scholar is included among the top collaborators of S. Hofmann based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Hofmann. S. Hofmann is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hofmann, S., et al.. (2023). Dynamic character of compositional sputter depth profiling by SIMS: A comparison of different models for quantitative profile evaluation. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 41(1). 1 indexed citations
2.
Hofmann, S., et al.. (2019). Preferential sputtering effects in depth profiling of multilayers with SIMS, XPS and AES. Applied Surface Science. 483. 140–155. 14 indexed citations
3.
4.
Hofmann, S., et al.. (2018). Depth resolution and preferential sputtering in depth profiling of delta layers. Applied Surface Science. 455. 1045–1056. 9 indexed citations
5.
6.
Lejček, Pavel & S. Hofmann. (2016). Interstitial and substitutional solute segregation at individual grain boundaries ofα-iron: data revisited. Journal of Physics Condensed Matter. 28(6). 64001–64001. 31 indexed citations
7.
Lejček, Pavel & S. Hofmann. (2009). Thermodynamic state functions of interfacial segregation and their role in the compensation effect. REVIEWS ON ADVANCED MATERIALS SCIENCE. 21. 27–34. 1 indexed citations
8.
Mayerhoefer, Marius E., M. Breitenseher, Josef Kramer, et al.. (2005). Texture analysis for tissue discrimination on T1‐weighted MR images of the knee joint in a multicenter study: Transferability of texture features and comparison of feature selection methods and classifiers. Journal of Magnetic Resonance Imaging. 22(5). 674–680. 47 indexed citations
9.
Hofmann, S., et al.. (2003). Progress in quantitative sputter depth profiling using the MRI-model. Max Planck Institute for Plasma Physics. 10(1). 52–57. 12 indexed citations
10.
Wagner, Thomas, et al.. (2003). Sputter depth profiling in AES and XPS. Max Planck Institute for Plasma Physics. 619–649. 5 indexed citations
11.
Rar, A. & S. Hofmann. (1999). Quantification of Dimer (Al2+, Ga2+) SIMS Depth Profiles of a GaAs/AlAs Multilayer Structure usign the MRI-model. Journal of Surface Analysis. 6(1). 29–33. 2 indexed citations
12.
Hofmann, S.. (1998). Sputter Depth Profiling of Thin Films. High Temperature Materials and Processes. 17(1-2). 13–28. 11 indexed citations
13.
Lejček, Pavel & S. Hofmann. (1995). Thermodynamics and structural aspects of grain boundary segregation. Critical reviews in solid state and materials sciences. 20(1). 1–85. 215 indexed citations
14.
Ecke, G., et al.. (1995). Interpretation of sputter depth profiles by mixing simulations. Analytical and Bioanalytical Chemistry. 353(3-4). 307–310. 9 indexed citations
15.
Zalar, A., et al.. (1993). A study of thermally activated interfacial reactions in an Ni/Cr/Si multilayer structure. Thin Solid Films. 228(1-2). 149–153. 7 indexed citations
16.
Steffen, J. & S. Hofmann. (1988). Oxidation of NiCr and NiCrFe alloys at room temperature. Surface and Interface Analysis. 12(7). 437–438. 1 indexed citations
17.
Hofmann, S.. (1986). Practical surface analysis: state of the art and recent developments in AES, XPS, ISS and SIMS. Surface and Interface Analysis. 9(1). 3–20. 85 indexed citations
18.
Hofmann, S.. (1979). Surface and thin-film analysis: Concepts, capabilities and limitations. Talanta. 26(8). 665–673. 11 indexed citations
19.
Geißel, H., et al.. (1978). Discrimination between different ions using thin scintillator films as time-of-flight detectors. Nuclear Instruments and Methods. 154(2). 239–243. 5 indexed citations
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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