K. Navrátil
Impact in
- Surfaces, Coatings and Films top 5%
- Optical Coatings and Gratings
- Computational Mechanics top 5%
- Surface Roughness and Optical Measurements
Papers in
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- Thin-Film Transistor Technologies 8
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- Surface Roughness and Optical Measurements 19
- Co-authors
- Ivan Ohlı́dal (20 shared papers)F. Lukeš (8 shared papers)J. Humlı́ček (8 shared papers)S. Nešpůrek (3 shared papers)J. Šik (1 shared paper)P. Pánek (1 shared paper)David Stifter (1 shared paper)H. Sitter (1 shared paper)
In The Last Decade
K. Navrátil
44 papers receiving 471 citations
Peers
Comparison fields: 5 of 46
- Surfaces, Coatings and Films 118
- Computational Mechanics 230
- Ceramics and Composites 25
- Materials Chemistry 164
- Atomic and Molecular Physics, and Optics 99
Countries citing papers authored by K. Navrátil
This map shows the geographic impact of K. Navrátil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Navrátil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Navrátil more than expected).
Fields of papers citing papers by K. Navrátil
This network shows the impact of papers produced by K. Navrátil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Navrátil. The network helps show where K. Navrátil may publish in the future.
Co-authors
The 25 scholars most cited alongside K. Navrátil, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 44 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1974 | 77 | |
| 2 | 1971 | 65 | |
| 3 | 1996 | 38 | |
| 4 | 1994 | 32 | |
| 5 | 1968 | 28 | |
| 6 | 1999 | 23 | |
| 7 | 1989 | 20 | |
| 8 | 1988 | 17 | |
| 9 | 1976 | 15 | |
| 10 | 1996 | 12 | |
| 11 | 1971 | 11 | |
| 12 | 1977 | 10 | |
| 13 | 1985 | 9 | |
| 14 | 2001 | 9 | |
| 15 | 1988 | 9 | |
| 16 | 1987 | 9 | |
| 17 | 1990 | 9 | |
| 18 | 1979 | 8 | |
| 19 | 1985 | 7 | |
| 20 | 1980 | 6 |
About K. Navrátil
K. Navrátil is a scholar working on Electrical and Electronic Engineering, Computational Mechanics, Materials Chemistry, Surfaces, Coatings and Films and Computer Vision and Pattern Recognition, having authored 44 papers that have together received 498 indexed citations. Recurring topics across this work include Surface Roughness and Optical Measurements (19 papers), Thin-Film Transistor Technologies (8 papers), Optical Coatings and Gratings (7 papers), Advanced Measurement and Metrology Techniques (6 papers), Phase-change materials and chalcogenides (6 papers), Optical measurement and interference techniques (6 papers), Semiconductor Quantum Structures and Devices (4 papers) and Silicon Nanostructures and Photoluminescence (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (118 citations), Computational Mechanics (230 citations), Ceramics and Composites (25 citations), Materials Chemistry (164 citations) and Atomic and Molecular Physics, and Optics (99 citations). K. Navrátil has collaborated with scholars based in Czechia, Slovakia and Russia. Frequent co-authors include Ivan Ohlı́dal, F. Lukeš, J. Humlı́ček, S. Nešpůrek, J. Šik, P. Pánek, David Stifter, H. Sitter, M. Garriga and Miloslav Ohlídal. Their work appears in journals such as Thin Solid Films, Surface and Interface Analysis, Applied Physics A, Optical Materials and Journal of the Optical Society of America A.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.