K. Navrátil

652 total citations
44 papers, 498 citations indexed

About

K. Navrátil is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Materials Chemistry. According to data from OpenAlex, K. Navrátil has authored 44 papers receiving a total of 498 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 19 papers in Computational Mechanics and 19 papers in Materials Chemistry. Recurrent topics in K. Navrátil's work include Surface Roughness and Optical Measurements (19 papers), Thin-Film Transistor Technologies (8 papers) and Optical Coatings and Gratings (7 papers). K. Navrátil is often cited by papers focused on Surface Roughness and Optical Measurements (19 papers), Thin-Film Transistor Technologies (8 papers) and Optical Coatings and Gratings (7 papers). K. Navrátil collaborates with scholars based in Czechia, Slovakia and Russia. K. Navrátil's co-authors include Ivan Ohlı́dal, F. Lukeš, J. Humlı́ček, S. Nešpůrek, J. Šik, David Stifter, P. Pánek, H. Sitter, M. Garriga and Miloslav Ohlídal and has published in prestigious journals such as Physical review. B, Condensed matter, Surface Science and Thin Solid Films.

In The Last Decade

K. Navrátil

44 papers receiving 471 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
K. Navrátil Czechia 11 230 180 164 137 118 44 498
D. K. Burge United States 9 112 0.5× 154 0.9× 125 0.8× 173 1.3× 84 0.7× 17 444
Joungchel Lee United States 12 116 0.5× 239 1.3× 320 2.0× 177 1.3× 46 0.4× 19 551
Anne-Marie Cazabat France 10 375 1.6× 315 1.8× 115 0.7× 153 1.1× 253 2.1× 14 688
F. C. Ho Taiwan 11 181 0.8× 398 2.2× 273 1.7× 140 1.0× 157 1.3× 30 673
Akiko Harasaki Japan 5 173 0.8× 208 1.2× 122 0.7× 165 1.2× 14 0.1× 10 654
Russell B. Goodman United States 13 66 0.3× 386 2.1× 126 0.8× 237 1.7× 94 0.8× 31 532
Kazuo Kajiwara Japan 13 148 0.6× 307 1.7× 171 1.0× 96 0.7× 76 0.6× 45 470
E. Jiran Canada 6 287 1.2× 144 0.8× 244 1.5× 66 0.5× 51 0.4× 8 463
J. Ihlemann Germany 10 238 1.0× 91 0.5× 75 0.5× 148 1.1× 39 0.3× 16 360
G. M. Shedd United States 10 122 0.5× 200 1.1× 119 0.7× 107 0.8× 81 0.7× 16 472

Countries citing papers authored by K. Navrátil

Since Specialization
Citations

This map shows the geographic impact of K. Navrátil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Navrátil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Navrátil more than expected).

Fields of papers citing papers by K. Navrátil

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Navrátil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Navrátil. The network helps show where K. Navrátil may publish in the future.

Co-authorship network of co-authors of K. Navrátil

This figure shows the co-authorship network connecting the top 25 collaborators of K. Navrátil. A scholar is included among the top collaborators of K. Navrátil based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Navrátil. K. Navrátil is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Navrátil, K., et al.. (2008). Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 5(5). 1176–1179. 2 indexed citations
2.
Navrátil, K., et al.. (2005). Effect of Structural Imperfections on the Characteristics ofYSZ Dielectric Layers Grown by E-beam Evaporation fron theCrystalline Taggets. 55(3). 247–259. 5 indexed citations
3.
Navrátil, K., et al.. (2004). Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane). Thin Solid Films. 455-456. 278–282. 3 indexed citations
4.
Hartmanová, M., M. Jergel, K. Navrátil, et al.. (2004). CORRELATION BETWEEN MICROSCOPIC AND MACROSCOPIC PROPERTIES OF YTTRIA-STABILIZED ZIRCONIA THIN FILMS. 158–168. 1 indexed citations
5.
Ohlı́dal, Ivan, Daniel Franta, Miloslav Ohlídal, & K. Navrátil. (2001). Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances. Applied Optics. 40(31). 5711–5711. 9 indexed citations
6.
Navrátil, K., J. Šik, J. Humlı́ček, & S. Nešpůrek. (1999). Optical properties of thin films of poly(methyl–phenylsilylene). Optical Materials. 12(1). 105–113. 23 indexed citations
7.
Navrátil, K., et al.. (1996). Optical anisotropy of SrLaAIO4 and SrLaAl0.75Ga0.25O4 single crystals. physica status solidi (b). 195(2). 625–635. 6 indexed citations
8.
Navrátil, K., et al.. (1994). Interpretation of Infrared Transmittance Spectra of SiO2 Thin Films. Applied Spectroscopy. 48(1). 113–120. 32 indexed citations
9.
Závětovà, M., et al.. (1989). Optical properties of natural glasses-moldavites. Journal of Non-Crystalline Solids. 108(3). 294–300. 1 indexed citations
10.
Ohlı́dal, Ivan, K. Navrátil, & V. Holý. (1988). Immersion spectroscopic reflectometry of multilayer systems II. Journal of the Optical Society of America A. 5(4). 465–465. 6 indexed citations
11.
Ohlı́dal, Ivan & K. Navrátil. (1985). Analysis of the basic statistical properties of randomly rough curved surfaces by shearing interferometry. Applied Optics. 24(16). 2690–2690. 7 indexed citations
12.
Ohlı́dal, Ivan, K. Navrátil, & Jana Musilová. (1985). A new method for the complete optical analysis of weakly absorbing thin films: Application to polycrystalline silicon films. Thin Solid Films. 127(3-4). 191–203. 9 indexed citations
13.
Ohlı́dal, Ivan & K. Navrátil. (1980). Optical analysis of non-absorbing double layers by means of immersion reflectometry I: Liquid immersion method. Thin Solid Films. 67(2). 245–251. 6 indexed citations
14.
Ohlı́dal, Ivan, K. Navrátil, & F. Lukeš. (1979). The optical analysis of non-absorbing thin films with randomly rough boundaries by means of immersion spectrophotometry. Thin Solid Films. 57(1). 179–184. 1 indexed citations
15.
Navrátil, K., Ivan Ohlı́dal, & F. Lukeš. (1977). A model of oxide film originating at thermal oxidation of GaAs. Czechoslovak Journal of Physics. 27(6). 672–681. 2 indexed citations
16.
Ohlı́dal, Ivan & K. Navrátil. (1977). Method for determining the refractive index and thickness of a non-absorbing thin film with randomly rough boundaries. Thin Solid Films. 44(3). 313–321. 3 indexed citations
17.
Ohlı́dal, Ivan, et al.. (1977). RUGOSITÉTHE PROBLEM OF SURFACE ROUGHNESS IN ELLIPSOMETRY AND REFLECTOMETRY. Le Journal de Physique Colloques. 38(C5). C5–77. 10 indexed citations
18.
Ohlı́dal, Ivan & K. Navrátil. (1976). Influence of the properties of thin films on the determination of the relative reflectance of a randomly rough surface. Thin Solid Films. 31(3). 223–234. 15 indexed citations
19.
Ohlı́dal, Ivan, K. Navrátil, & F. Lukeš. (1971). Reflection of Light by a System of Nonabsorbing Isotropic Film–Nonabsorbing Isotropic Substrate with Randomly Rough Boundaries. Journal of the Optical Society of America. 61(12). 1630–1630. 65 indexed citations
20.
Navrátil, K.. (1968). Thermal oxidation of gallium arsenide. Czechoslovak Journal of Physics. 18(2). 266–274. 28 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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