F. Lukeš

1.1k total citations
61 papers, 943 citations indexed

About

F. Lukeš is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, F. Lukeš has authored 61 papers receiving a total of 943 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 24 papers in Atomic and Molecular Physics, and Optics and 24 papers in Materials Chemistry. Recurrent topics in F. Lukeš's work include Surface Roughness and Optical Measurements (14 papers), Semiconductor Quantum Structures and Devices (13 papers) and Semiconductor materials and interfaces (12 papers). F. Lukeš is often cited by papers focused on Surface Roughness and Optical Measurements (14 papers), Semiconductor Quantum Structures and Devices (13 papers) and Semiconductor materials and interfaces (12 papers). F. Lukeš collaborates with scholars based in Czechia, Slovakia and Germany. F. Lukeš's co-authors include Ivan Ohlı́dal, K. Navrátil, E. Schmidt, J. Humlı́ček, K. Vedam, M. Cardona, Sudha Gopalan, Ram Naresh, K. Ploog and Ramanathan Srinivasan and has published in prestigious journals such as Physical review. B, Condensed matter, Journal of Materials Science and Applied Surface Science.

In The Last Decade

F. Lukeš

61 papers receiving 855 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
F. Lukeš Czechia	17	438	358	321	298	239	61	943
Philip Baumeister United States	17	580 1.3×	191 0.5×	217 0.7×	370 1.2×	213 0.9×	64	1.1k
John R. McNeil United States	19	758 1.7×	462 1.3×	215 0.7×	270 0.9×	376 1.6×	95	1.2k
K. Navrátil Czechia	11	180 0.4×	230 0.6×	164 0.5×	99 0.3×	137 0.6×	44	498
A. Piegari Italy	18	494 1.1×	116 0.3×	264 0.8×	240 0.8×	155 0.6×	80	793
Horst Schreiber Germany	16	376 0.9×	73 0.2×	169 0.5×	221 0.7×	115 0.5×	55	644
F. C. Ho Taiwan	11	398 0.9×	181 0.5×	273 0.9×	149 0.5×	140 0.6×	30	673
Michael J. Runkel United States	14	276 0.6×	602 1.7×	218 0.7×	213 0.7×	424 1.8×	39	987
Seijiro Furukawa Japan	20	952 2.2×	254 0.7×	398 1.2×	618 2.1×	138 0.6×	99	1.3k
G. A. Al‐Jumaily United States	13	321 0.7×	165 0.5×	235 0.7×	82 0.3×	72 0.3×	40	529
Mikio Takai Japan	18	687 1.6×	414 1.2×	429 1.3×	233 0.8×	292 1.2×	129	1.2k

Countries citing papers authored by F. Lukeš

Since Specialization

Citations

This map shows the geographic impact of F. Lukeš's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Lukeš with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Lukeš more than expected).

Fields of papers citing papers by F. Lukeš

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Lukeš. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Lukeš. The network helps show where F. Lukeš may publish in the future.

Co-authorship network of co-authors of F. Lukeš

This figure shows the co-authorship network connecting the top 25 collaborators of F. Lukeš. A scholar is included among the top collaborators of F. Lukeš based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Lukeš. F. Lukeš is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Jurek, K., M. Guglielmi, Gabriela Kuncová, et al.. (1992). Characterization of TiO2 and ZrO2 coatings on silica slabs and fibres. Journal of Materials Science. 27(9). 2549–2555. 20 indexed citations

Humlı́ček, J., F. Lukeš, & K. Ploog. (1991). Reflectance and photoreflectance spectra of GaAs/AlAs superlattices. Superlattices and Microstructures. 9(1). 133–136. 4 indexed citations

Lukeš, F.. (1991). Temperature Dependence of the Dielectric Function of Orthorhombic GeS. physica status solidi (b). 166(2). 491–501. 1 indexed citations

Schmid, U., F. Lukeš, N. E. Christensen, et al.. (1991). Dielectric response of strained GeSi superlattices: Theory and experiment. Materials Science and Engineering B. 9(1-3). 233–236. 2 indexed citations

Lukeš, F.. (1987). Temperature Dependence of Ellipsometric Angles of Silicon. physica status solidi (a). 102(2). 803–814. 6 indexed citations

Lukeš, F., et al.. (1987). The structure of As2S3 thin films. Journal of Non-Crystalline Solids. 97-98. 439–441. 5 indexed citations

Ohlı́dal, Ivan & F. Lukeš. (1984). Optical analysis of absorbing double layers by combined reflection and transmission ellipsometry. Thin Solid Films. 115(4). 269–282. 5 indexed citations

Ohlı́dal, Ivan, K. Navrátil, & F. Lukeš. (1979). The optical analysis of non-absorbing thin films with randomly rough boundaries by means of immersion spectrophotometry. Thin Solid Films. 57(1). 179–184. 1 indexed citations

Navrátil, K., Ivan Ohlı́dal, & F. Lukeš. (1977). A model of oxide film originating at thermal oxidation of GaAs. Czechoslovak Journal of Physics. 27(6). 672–681. 2 indexed citations

10.

Lukeš, F.. (1977). Electroreflectance spectrum of inas in the range of E₀ and E₀ + δ₀ transitions. physica status solidi (b). 84(2). 10 indexed citations

11.

Ohlídal, Miloslav, Ivan Ohlı́dal, & F. Lukeš. (1976). Ellipsometric studies of polished silicon surfaces. Surface Science. 55(2). 467–476. 19 indexed citations

12.

Humlı́ček, J. & F. Lukeš. (1976). Direct identification of the L′₃ → L₁ transition in Ge. physica status solidi (b). 77(2). 731–738. 4 indexed citations

13.

Ohlı́dal, Ivan & F. Lukeš. (1973). Calculation of the ellipsometric parameters characterizing a randomly rough surface by means of the Stratton-Chu-Silver integral. Optics Communications. 7(1). 76–79. 11 indexed citations

14.

Lukeš, F.. (1972). Oxidation of Si and GaAs in air at room temperature. Surface Science. 30(1). 91–100. 133 indexed citations

15.

Ohlı́dal, Ivan & F. Lukeš. (1972). Ellipsometric Parameters of Rough Surfaces and of a System Substrate-Thin Film with Rough Boundaries. Optica Acta International Journal of Optics. 19(10). 817–843. 91 indexed citations

16.

Ohlı́dal, Ivan, K. Navrátil, & F. Lukeš. (1971). Reflection of Light by a System of Nonabsorbing Isotropic Film–Nonabsorbing Isotropic Substrate with Randomly Rough Boundaries. Journal of the Optical Society of America. 61(12). 1630–1630. 65 indexed citations

17.

Lukeš, F., et al.. (1969). Ellipsometric liquid immersion method for the determination of all the optical parameters of the system: Nonabsorbing film on an absorbing substrate. Surface Science. 16. 112–125. 34 indexed citations

18.

Lukeš, F. & E. Schmidt. (1965). The oxidation of silicon in dry oxygen. Journal of Physics and Chemistry of Solids. 26(9). 1353–1357. 8 indexed citations

19.

Lukeš, F.. (1960). Optical constants of thin germanium films. Czechoslovak Journal of Physics. 10(1). 59–65. 4 indexed citations

20.

Lukeš, F.. (1956). ФОТОЭЛЕКТРИЧЕСКИЕ С ВОЙСТВА АНТИМОНИДА ГАЛЛИЯ. Czechoslovak Journal of Physics. 6(4). 359–363. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact