K. Maass
- Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis 7
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 6
- Condensed Matter Physics top 10%
- Crystallography and Radiation Phenomena 9
- Computational Mechanics top 10%
- Ion-surface interactions and analysis 4
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- Atomic and Molecular Physics 4
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- Silicon and Solar Cell Technologies 4
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- MXene and MAX Phase Materials 4
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- Inorganic Chemistry and Materials 4
K. Maass
23 papers receiving 424 citations
Peers
Comparison fields: 5 of 33
- Radiation 125
- Surfaces, Coatings and Films 94
- Condensed Matter Physics 99
- Computational Mechanics 130
- Atomic and Molecular Physics, and Optics 184
Countries citing papers authored by K. Maass
This map shows the geographic impact of K. Maass's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Maass with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Maass more than expected).
Fields of papers citing papers by K. Maass
This network shows the impact of papers produced by K. Maass. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Maass. The network helps show where K. Maass may publish in the future.
Co-authorship network
The 25 scholars most cited alongside K. Maass, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 22 | |
| 2 | 2013 | 2 | |
| 3 | 2011 | 32 | |
| 4 | 2005 | 25 | |
| 5 | 2004 | 48 | |
| 6 | 2004 | 15 | |
| 7 | 2003 | 25 | |
| 8 | 2002 | 14 | |
| 9 | 2002 | 4 | |
| 10 | 2001 | 21 | |
| 11 | 2000 | 13 | |
| 12 | 1996 | 7 | |
| 13 | 1985 | 9 | |
| 14 | 1985 | 1 | |
| 15 | 1984 | 112 | |
| 16 | 1983 | 21 | |
| 17 | 1970 | 20 | |
| 18 | 1970 | 15 | |
| 19 | 1970 | 9 | |
| 20 | 1968 | 5 |
About K. Maass
K. Maass is a scholar working on Radiation, Surfaces, Coatings and Films, Condensed Matter Physics, Inorganic Chemistry and Atomic and Molecular Physics, and Optics, having authored 23 papers that have together received 444 indexed citations. Recurring topics across this work include Crystallography and Radiation Phenomena (9 papers), X-ray Spectroscopy and Fluorescence Analysis (7 papers), Electron and X-Ray Spectroscopy Techniques (6 papers), Ion-surface interactions and analysis (4 papers), Silicon and Solar Cell Technologies (4 papers), MXene and MAX Phase Materials (4 papers), Inorganic Chemistry and Materials (4 papers) and Atomic and Molecular Physics (4 papers). The work is most often cited by research in Radiation (125 citations), Surfaces, Coatings and Films (94 citations), Condensed Matter Physics (99 citations), Computational Mechanics (130 citations) and Atomic and Molecular Physics, and Optics (184 citations). K. Maass has collaborated with scholars based in Germany, Austria and Switzerland. Frequent co-authors include K. Irmscher, H. Klose, H. Winter, A. Mertens, F. Aumayr, S. Wethekam, Andreas Schüller, H. Winter, S. Lederer and H. Winter. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Physical review. B, Condensed matter, Physical Review A, Journal of Crystal Growth and Journal of Physics B Atomic Molecular and Optical Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.