Julius J. Muray
- Electrical and Electronic Engineering
- Biomedical Engineering
- Atomic and Molecular Physics, and Optics
- Materials Chemistry
- Computational Mechanics
- Co-authors
- I. BrodieMasaaki AndoFred E. NicodemusNigel WilliamsE.R. WesterbergPaul L. CsonkaR. Scholl
- Topics
- Advancements in Photolithography Techniques (4 papers)Electron and X-Ray Spectroscopy Techniques (4 papers)Advanced Semiconductor Detectors and Materials (2 papers)
- Journals
- Journal of Applied PhysicsIEEE Transactions on Electron DevicesIEEE Transactions on Aerospace and Electronic Systems
- Partner nations
- United StatesChina
In The Last Decade
Julius J. Muray
19 papers receiving 214 citations
Peers
Comparison fields: 5 of 51
- Electrical and Electronic Engineering 130
- Biomedical Engineering 71
- Atomic and Molecular Physics, and Optics 60
- Materials Chemistry 51
- Computational Mechanics 51
Countries citing papers authored by Julius J. Muray
This map shows the geographic impact of Julius J. Muray's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Julius J. Muray with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Julius J. Muray more than expected).
Fields of papers citing papers by Julius J. Muray
This network shows the impact of papers produced by Julius J. Muray. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Julius J. Muray. The network helps show where Julius J. Muray may publish in the future.
Co-authorship network of co-authors of Julius J. Muray
This figure shows the co-authorship network connecting the top 25 collaborators of Julius J. Muray. A scholar is included among the top collaborators of Julius J. Muray based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Julius J. Muray. Julius J. Muray is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 58 | |
| 2 | 1 | |
| 3 | 1 | |
| 4 | 4 | |
| 5 | 2 | |
| 6 | 96 | |
| 7 | 12 | |
| 8 | 10 | |
| 9 | 1 | |
| 10 | 15 | |
| 11 | 1 | |
| 12 | 4 | |
| 13 | 5 | |
| 14 | 5 | |
| 15 | 2 | |
| 16 | 4 | |
| 17 | 1 | |
| 18 | 15 | |
| 19 | 8 |
About Julius J. Muray
Julius J. Muray is a scholar working on Surfaces, Coatings and Films, Radiation and Instrumentation, having authored 19 papers that have together received 245 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (4 papers), Electron and X-Ray Spectroscopy Techniques (4 papers) and Advanced Semiconductor Detectors and Materials (2 papers). The work is most often cited by research in Structural Biology (10 citations), Surfaces, Coatings and Films (42 citations) and Computational Mechanics (51 citations). Julius J. Muray has collaborated with scholars based in United States and China. Frequent co-authors include I. Brodie, Masaaki Ando, Fred E. Nicodemus, Nigel Williams, E.R. Westerberg, Paul L. Csonka and R. Scholl. Their work appears in journals such as Journal of Applied Physics, IEEE Transactions on Electron Devices and IEEE Transactions on Aerospace and Electronic Systems.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.