István Mohácsi

636 total citations
25 papers, 414 citations indexed

About

István Mohácsi is a scholar working on Radiation, Structural Biology and Electrical and Electronic Engineering. According to data from OpenAlex, István Mohácsi has authored 25 papers receiving a total of 414 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Radiation, 16 papers in Structural Biology and 9 papers in Electrical and Electronic Engineering. Recurrent topics in István Mohácsi's work include Advanced X-ray Imaging Techniques (23 papers), Advanced Electron Microscopy Techniques and Applications (16 papers) and Advancements in Photolithography Techniques (8 papers). István Mohácsi is often cited by papers focused on Advanced X-ray Imaging Techniques (23 papers), Advanced Electron Microscopy Techniques and Applications (16 papers) and Advancements in Photolithography Techniques (8 papers). István Mohácsi collaborates with scholars based in Switzerland, Germany and France. István Mohácsi's co-authors include Christian Dávid, Ismo Vartiainen, Vitaliy A. Guzenko, Yasin Ekinci, Manuel Guizar‐Sicairos, Petri Karvinen, Cameron M. Kewish, Andréa Somogyi, Benedikt Rösner and Martin V. Holt and has published in prestigious journals such as Applied Physics Letters, Scientific Reports and Optics Letters.

In The Last Decade

István Mohácsi

25 papers receiving 400 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
István Mohácsi Switzerland 12 306 159 129 72 65 25 414
Andrew J. Morgan Germany 12 314 1.0× 225 1.4× 47 0.4× 117 1.6× 90 1.4× 31 446
P. Montanez United States 5 218 0.7× 77 0.5× 61 0.5× 92 1.3× 36 0.6× 11 333
Chan Kim Germany 11 258 0.8× 155 1.0× 52 0.4× 78 1.1× 15 0.2× 37 362
Richard Bean Germany 11 385 1.3× 173 1.1× 67 0.5× 105 1.5× 23 0.4× 38 532
D. Hambach Germany 10 199 0.7× 94 0.6× 125 1.0× 33 0.5× 53 0.8× 16 365
Levent Cibik Germany 11 281 0.9× 36 0.2× 124 1.0× 54 0.8× 38 0.6× 37 442
D. Mezza Switzerland 12 230 0.8× 76 0.5× 74 0.6× 93 1.3× 18 0.3× 28 371
Maxim Polikarpov Russia 13 285 0.9× 69 0.4× 64 0.5× 115 1.6× 14 0.2× 40 419
M. Franklin Rose Germany 11 164 0.5× 74 0.5× 59 0.5× 67 0.9× 12 0.2× 37 329
Bjoern Enders United States 10 386 1.3× 160 1.0× 46 0.4× 23 0.3× 25 0.4× 23 478

Countries citing papers authored by István Mohácsi

Since Specialization
Citations

This map shows the geographic impact of István Mohácsi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by István Mohácsi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites István Mohácsi more than expected).

Fields of papers citing papers by István Mohácsi

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by István Mohácsi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by István Mohácsi. The network helps show where István Mohácsi may publish in the future.

Co-authorship network of co-authors of István Mohácsi

This figure shows the co-authorship network connecting the top 25 collaborators of István Mohácsi. A scholar is included among the top collaborators of István Mohácsi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with István Mohácsi. István Mohácsi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Makita, Mikako, M. Nakatsutsumi, T. A. Pikuz, et al.. (2022). Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument. Journal of Synchrotron Radiation. 30(1). 208–216. 2 indexed citations
2.
Martiel, Isabelle, A. Mozzanica, Ezequiel Panepucci, et al.. (2020). X-ray fluorescence detection for serial macromolecular crystallography using a JUNGFRAU pixel detector. Journal of Synchrotron Radiation. 27(2). 329–339. 4 indexed citations
3.
Warmer, Martin, István Mohácsi, V. Hennicke, et al.. (2020). Multimodal X-ray imaging of nanocontainer-treated macrophages and calcium distribution in the perilacunar bone matrix. Scientific Reports. 10(1). 1784–1784. 7 indexed citations
4.
Tolstikova, A., Matteo Levantino, Oleksandr Yefanov, et al.. (2019). 1 kHz fixed-target serial crystallography using a multilayer monochromator and an integrating pixel detector. IUCrJ. 6(5). 927–937. 35 indexed citations
5.
Mohácsi, István, Mikako Makita, Daniel Castaño‐Díez, et al.. (2018). Demonstration of femtosecond X-ray pump X-ray probe diffraction on protein crystals. Structural Dynamics. 5(5). 54303–54303. 9 indexed citations
6.
Mochi, Iacopo, et al.. (2017). RESCAN: an actinic lensless microscope for defect inspection of EUV reticles. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10143. 101431O–101431O. 4 indexed citations
7.
Mochi, Iacopo, et al.. (2017). RESCAN: an actinic lensless microscope for defect inspection of EUV reticles. Journal of Micro/Nanolithography MEMS and MOEMS. 16(4). 41003–41003. 23 indexed citations
8.
Mochi, Iacopo, István Mohácsi, S. Redford, et al.. (2017). Towards a stand-alone high-throughput EUV actinic photomask inspection tool: RESCAN. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10145. 101450N–101450N. 14 indexed citations
9.
Mohácsi, István, Ismo Vartiainen, Benedikt Rösner, et al.. (2017). Interlaced zone plate optics for hard X-ray imaging in the 10 nm range. Scientific Reports. 7(1). 85 indexed citations
10.
Ekinci, Yasin, et al.. (2016). Scanning coherent scattering methods for actinic EUV mask inspection. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9985. 99851P–99851P. 6 indexed citations
11.
Mohácsi, István, et al.. (2016). Scanning coherent diffractive imaging methods for actinic extreme ultraviolet mask metrology. Journal of Micro/Nanolithography MEMS and MOEMS. 15(3). 34006–34006. 19 indexed citations
12.
Mohácsi, István, et al.. (2016). Scanning scattering contrast microscopy for actinic EUV mask inspection. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9778. 97781O–97781O. 11 indexed citations
13.
Chong, Karen S. L., Li Wang, Christian Dais, et al.. (2016). High-resolution, high-aspect-ratio iridium–nickel composite nanoimprint molds. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 34(6). 5 indexed citations
14.
Dávid, Christian, Petri Karvinen, Marcin Sikorski, et al.. (2015). Following the dynamics of matter with femtosecond precision using the X-ray streaking method. Scientific Reports. 5(1). 7644–7644. 23 indexed citations
15.
Vartiainen, Ismo, Christian Holzner, István Mohácsi, et al.. (2015). Artifact characterization and reduction in scanning X-ray Zernike phase contrast microscopy. Optics Express. 23(10). 13278–13278. 9 indexed citations
16.
Mohácsi, István, Ismo Vartiainen, J. H. Meyer, et al.. (2015). Influence of finite spatial coherence on ptychographic reconstruction. Applied Physics Letters. 107(1). 15 indexed citations
17.
Mohácsi, István, Petri Karvinen, Ismo Vartiainen, et al.. (2014). High-efficiency zone-plate optics for multi-keV X-ray focusing. Journal of Synchrotron Radiation. 21(3). 497–501. 34 indexed citations
18.
Lovrić, Goran, et al.. (2014). A robust tool for photon source geometry measurements using the fractional Talbot effect. Optics Express. 22(3). 2745–2745. 10 indexed citations
19.
Mohácsi, István, Petri Karvinen, Ismo Vartiainen, et al.. (2013). High efficiency x-ray nanofocusing by the blazed stacking of binary zone plates. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8851. 88510Z–88510Z. 8 indexed citations
20.
Mohácsi, István, P. Petrík, M. Fried, et al.. (2010). Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si. Thin Solid Films. 519(9). 2847–2851. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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