Elina Färm

1.4k total citations
26 papers, 1.2k citations indexed

About

Elina Färm is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Radiation. According to data from OpenAlex, Elina Färm has authored 26 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 11 papers in Materials Chemistry and 9 papers in Radiation. Recurrent topics in Elina Färm's work include Advanced X-ray Imaging Techniques (9 papers), Semiconductor materials and devices (9 papers) and Molecular Junctions and Nanostructures (6 papers). Elina Färm is often cited by papers focused on Advanced X-ray Imaging Techniques (9 papers), Semiconductor materials and devices (9 papers) and Molecular Junctions and Nanostructures (6 papers). Elina Färm collaborates with scholars based in Finland, Switzerland and France. Elina Färm's co-authors include Mikko Ritala, Markku Leskelä, Marianna Kemell, Ana Díaz, Oliver Bunk, Christian Dávid, Petri Karvinen, Manuel Guizar‐Sicairos, Emma Härkönen and Vitaliy A. Guzenko and has published in prestigious journals such as Angewandte Chemie International Edition, Chemistry of Materials and Journal of The Electrochemical Society.

In The Last Decade

Elina Färm

26 papers receiving 1.1k citations

Peers

Elina Färm
Kouji Inagaki Japan
Hugh T. Philipp United States
Mauro Prasciolu Italy
Dina Carbone France
S. O. Hruszkewycz United States
Hyon Chol Kang South Korea
E. Johnson United States
D. H. Bilderback United States
Stanislav Stoupin United States
A. Homs France
Kouji Inagaki Japan
Elina Färm
Citations per year, relative to Elina Färm Elina Färm (= 1×) peers Kouji Inagaki

Countries citing papers authored by Elina Färm

Since Specialization
Citations

This map shows the geographic impact of Elina Färm's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Elina Färm with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Elina Färm more than expected).

Fields of papers citing papers by Elina Färm

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Elina Färm. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Elina Färm. The network helps show where Elina Färm may publish in the future.

Co-authorship network of co-authors of Elina Färm

This figure shows the co-authorship network connecting the top 25 collaborators of Elina Färm. A scholar is included among the top collaborators of Elina Färm based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Elina Färm. Elina Färm is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Bakoš, L., Krisztina László, János L. Lábár, et al.. (2020). Photocatalytic and Gas Sensitive Multiwalled Carbon Nanotube/TiO2-ZnO and ZnO-TiO2 Composites Prepared by Atomic Layer Deposition. Nanomaterials. 10(2). 252–252. 18 indexed citations
2.
Färm, Elina, Soroush Mehravar, Khanh Kieu, et al.. (2019). Controlling the refractive index and third-order nonlinearity of polyimide/Ta2O5 nanolaminates for optical applications. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 37(6). 5 indexed citations
3.
Färm, Elina, Mikko Heikkilä, Marko Vehkamäki, et al.. (2016). As2S3 thin films deposited by atomic layer deposition. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 35(1). 11 indexed citations
4.
Dávid, Christian, Petri Karvinen, Marcin Sikorski, et al.. (2015). Following the dynamics of matter with femtosecond precision using the X-ray streaking method. Scientific Reports. 5(1). 7644–7644. 23 indexed citations
5.
Kang, Guoguo, Antti Matikainen, Elina Färm, et al.. (2015). High Aspect-Ratio Iridium-Coated Nanopillars for Highly Reproducible Surface-Enhanced Raman Scattering (SERS). ACS Applied Materials & Interfaces. 7(21). 11452–11459. 27 indexed citations
6.
Autere, Anton, Lasse Karvonen, Antti Säynätjoki, et al.. (2015). Slot waveguide ring resonators coated by an atomic layer deposited organic/inorganic nanolaminate. Optics Express. 23(21). 26940–26940. 11 indexed citations
7.
Holler, Mirko, Ana Díaz, Manuel Guizar‐Sicairos, et al.. (2014). X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution. Scientific Reports. 4(1). 3857–3857. 267 indexed citations
8.
Szilágyi, Imre Miklós, Emma Härkönen, Elina Färm, et al.. (2013). Programming nanostructured soft biological surfaces by atomic layer deposition. Nanotechnology. 24(24). 245701–245701. 24 indexed citations
9.
Färm, Elina, Marko Vehkamäki, Mikko Ritala, & Markku Leskelä. (2012). Passivation of copper surfaces for selective-area ALD using a thiol self-assembled monolayer. Semiconductor Science and Technology. 27(7). 74004–74004. 46 indexed citations
10.
Dávid, Christian, Sergey Gorelick, Simon Rutishauser, et al.. (2011). Nanofocusing of hard X-ray free electron laser pulses using diamond based Fresnel zone plates. Scientific Reports. 1(1). 57–57. 102 indexed citations
11.
Färm, Elina. (2011). Selective-Area Atomic Layer Deposition. Työväentutkimus Vuosikirja. 1 indexed citations
12.
Färm, Elina, Seppo Lindroos, Mikko Ritala, & Markku Leskelä. (2011). Microcontact Printed RuOx Film as an Activation Layer for Selective-Area Atomic Layer Deposition of Ruthenium. Chemistry of Materials. 24(2). 275–278. 41 indexed citations
13.
Vila‐Comamala, Joan, Sergey Gorelick, Elina Färm, et al.. (2011). Zone-Doubled Fresnel Zone Plates for Scanning Transmission X-ray Microscopy. AIP conference proceedings. 192–195. 1 indexed citations
14.
Vila‐Comamala, Joan, Sergey Gorelick, Elina Färm, et al.. (2010). Ultra-high resolution zone-doubled 
diffractive X-ray optics for the multi-keV regime. Optics Express. 19(1). 175–175. 102 indexed citations
15.
Vila‐Comamala, Joan, Sergey Gorelick, Vitaliy A. Guzenko, et al.. (2010). Dense high aspect ratio hydrogen silsesquioxane nanostructures by 100 keV electron beam lithography. Nanotechnology. 21(28). 285305–285305. 41 indexed citations
16.
Nygård, Kim, Sergey Gorelick, Joan Vila‐Comamala, et al.. (2010). Beam-induced damage on diffractive hard X-ray optics. Journal of Synchrotron Radiation. 17(6). 786–790. 8 indexed citations
17.
Färm, Elina, Marianna Kemell, Eero Santala, Mikko Ritala, & Markku Leskelä. (2009). Selective-Area Atomic Layer Deposition Using Poly(vinyl pyrrolidone) as a Passivation Layer. Journal of The Electrochemical Society. 157(1). K10–K10. 65 indexed citations
18.
Haapala, Markus, Lauri Sainiemi, Sami Franssila, et al.. (2008). Selective Surface Patterning with an Electric Discharge in the Fabrication of Microfluidic Structures. Angewandte Chemie International Edition. 47(39). 7442–7445. 8 indexed citations
19.
Kemell, Marianna, Elina Färm, Mikko Ritala, & Markku Leskelä. (2008). Surface modification of thermoplastics by atomic layer deposition of Al2O3 and TiO2 thin films. European Polymer Journal. 44(11). 3564–3570. 84 indexed citations
20.
Färm, Elina, Marianna Kemell, Mikko Ritala, & Markku Leskelä. (2006). Self‐Assembled Octadecyltrimethoxysilane Monolayers Enabling Selective‐Area Atomic Layer Deposition of Iridium. Chemical Vapor Deposition. 12(7). 415–417. 56 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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