Naganori Ishihara

535 total citations
42 papers, 408 citations indexed

About

Naganori Ishihara is a scholar working on Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Condensed Matter Physics. According to data from OpenAlex, Naganori Ishihara has authored 42 papers receiving a total of 408 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Atomic and Molecular Physics, and Optics, 14 papers in Surfaces, Coatings and Films and 13 papers in Condensed Matter Physics. Recurrent topics in Naganori Ishihara's work include Electron and X-Ray Spectroscopy Techniques (14 papers), Physics of Superconductivity and Magnetism (13 papers) and Surface and Thin Film Phenomena (8 papers). Naganori Ishihara is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (14 papers), Physics of Superconductivity and Magnetism (13 papers) and Surface and Thin Film Phenomena (8 papers). Naganori Ishihara collaborates with scholars based in Japan and France. Naganori Ishihara's co-authors include Heizō Tokutaka, Satoru Kishida, Ryo Nishimura, Kentaro Nishimori, Imam Robandi, Yoshihide Watanabe, Hiroshi Fujimoto, H. Hiraga, Hirofumi Sumi and Takayuki Yamamoto and has published in prestigious journals such as Applied Physics Letters, Applied Surface Science and Surface Science.

In The Last Decade

Naganori Ishihara

39 papers receiving 384 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Naganori Ishihara Japan 12 144 137 133 81 70 42 408
D. Scholl United States 14 234 1.6× 71 0.5× 75 0.6× 105 1.3× 73 1.0× 20 455
Satoshi Sumi Japan 10 257 1.8× 179 1.3× 54 0.4× 134 1.7× 104 1.5× 63 380
R. Sugita Japan 12 413 2.9× 92 0.7× 119 0.9× 74 0.9× 213 3.0× 91 502
M.A. Gibbon United Kingdom 9 185 1.3× 359 2.6× 55 0.4× 68 0.8× 57 0.8× 22 423
P. Kamiński Poland 14 140 1.0× 351 2.6× 35 0.3× 138 1.7× 32 0.5× 68 455
R. Mock Germany 13 193 1.3× 126 0.9× 123 0.9× 88 1.1× 78 1.1× 28 519
Kochan Ju United States 10 357 2.5× 183 1.3× 68 0.5× 73 0.9× 173 2.5× 33 485
S.B. Luitjens Netherlands 13 309 2.1× 66 0.5× 115 0.9× 46 0.6× 209 3.0× 43 425
S. Anami Japan 12 234 1.6× 427 3.1× 63 0.5× 85 1.0× 16 0.2× 81 576
O. Cugat France 13 106 0.7× 166 1.2× 60 0.5× 29 0.4× 95 1.4× 23 379

Countries citing papers authored by Naganori Ishihara

Since Specialization
Citations

This map shows the geographic impact of Naganori Ishihara's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Naganori Ishihara with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Naganori Ishihara more than expected).

Fields of papers citing papers by Naganori Ishihara

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Naganori Ishihara. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Naganori Ishihara. The network helps show where Naganori Ishihara may publish in the future.

Co-authorship network of co-authors of Naganori Ishihara

This figure shows the co-authorship network connecting the top 25 collaborators of Naganori Ishihara. A scholar is included among the top collaborators of Naganori Ishihara based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Naganori Ishihara. Naganori Ishihara is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Fujimura, Kikuo, et al.. (2005). Automatic tuning method of membership functions in simulation of driving control of a model car. 3. 2937–2940. 1 indexed citations
2.
Robandi, Imam, Kentaro Nishimori, Ryo Nishimura, & Naganori Ishihara. (2001). Optimal feedback control design using genetic algorithm in multimachine power system. International Journal of Electrical Power & Energy Systems. 23(4). 263–271. 60 indexed citations
3.
Kishida, Satoru, et al.. (1993). Crystal Growth of Bi-Sr-Ca-Cu-O (c0=39 Å) Single Crystals. Japanese Journal of Applied Physics. 32(3B). L398–L398. 17 indexed citations
4.
Kishida, Satoru, et al.. (1991). X-Ray Photoelectron Spectroscopy Studies of 7 K-Phase Bi-System Single Crystals. Japanese Journal of Applied Physics. 30(5R). 926–926. 1 indexed citations
5.
Kishida, Satoru, et al.. (1991). Preparation conditions of flat 80 K phase Bi Sr Ca Cu O thin films by RF magnetron sputtering. Applied Surface Science. 48-49. 446–449.
6.
Kishida, Satoru, et al.. (1991). Growth of 80K-phase (Bi,Pb)(Sr,Ca)CuO single crystals. Physica C Superconductivity. 185-189. 443–444. 2 indexed citations
7.
Nishimori, Kentaro, et al.. (1991). Surface study of single-crystal 80 K Bi Sr Ca Cu O superconductor with Si and Nb by RHEED and XPS depth profile. Applied Surface Science. 48-49. 450–453. 1 indexed citations
8.
Tokutaka, Heizō, et al.. (1991). The Comparison of three Background Subtraction Methods in XPS Spectra.. Shinku. 34(6). 547–552. 1 indexed citations
9.
Kishida, Satoru, et al.. (1990). XPS Studies of 80 K-Phase Bi-Sr-Ca-Cu-O Single Crystals. Japanese Journal of Applied Physics. 29(3A). L438–L438. 7 indexed citations
10.
Kishida, Satoru, et al.. (1989). LEED-AES and XPS Studies of Bi-Sr-Ca-Cu-O Single Crystal Surfaces. Japanese Journal of Applied Physics. 28(3A). L406–L406. 24 indexed citations
11.
Nishimori, Kentaro, et al.. (1989). Reflection high-energy electron diffraction intensity oscillation induced by electric current during Si epitaxial growth on Si (001) 2×1 surfaces. Applied Physics Letters. 55(17). 1715–1717. 3 indexed citations
12.
Tokutaka, Heizō, et al.. (1989). Surface Analysis of YBa2Cu3Ox and Bi-Sr-Ca-Cu-O Superconductors by Auger Electron Spectroscopy. Japanese Journal of Applied Physics. 28(2A). L222–L222. 5 indexed citations
13.
Tokutaka, Heizō, et al.. (1989). Observation of Si(100) 2*1 surface structure and Si homoepitaxial growth by RHEED.. Shinku. 32(3). 119–122. 1 indexed citations
14.
Kishida, Satoru, et al.. (1989). XPS Studies of Bi-Sr-Ca-Cu-O Single Crystal and Ceramics Surfaces. Japanese Journal of Applied Physics. 28(6A). L949–L949. 15 indexed citations
15.
Kishida, Satoru, et al.. (1988). Effects of Water on the Resistance-Temperature Characteristics of YBa2Cu3O7-y Oxides. Japanese Journal of Applied Physics. 27(9A). L1616–L1616. 7 indexed citations
16.
Watanabe, Yoshihide, et al.. (1988). Surface composition analysis of Au-Cu alloy by a scanning auger electron microscope.. Shinku. 31(5). 386–389. 1 indexed citations
17.
Tokutaka, Heizō, et al.. (1987). Metal/SiC interface reaction observed by auger electron spectroscopy.. Shinku. 30(5). 265–269. 2 indexed citations
18.
Tokutaka, Heizō, et al.. (1987). Surface composition analysis of Au-Cu alloy by a micro-auger electron spectroscopy.. Shinku. 30(5). 247–250. 1 indexed citations
19.
Tokutaka, Heizō, et al.. (1986). A Micro-Quantitative AES Analysis Using SEM-SAM Apparatus (Applied to Ag/Si Interfaces on Si(111) and Si(100) Surfaces). Japanese Journal of Applied Physics. 25(10R). 1584–1584. 2 indexed citations
20.
Fukami, Akira, et al.. (1970). Pressurized Specimen Chamber for Electron Microscope. Proceedings annual meeting Electron Microscopy Society of America. 28. 546–547. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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