H.J. Möller

1.3k total citations
62 papers, 963 citations indexed

About

H.J. Möller is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, H.J. Möller has authored 62 papers receiving a total of 963 indexed citations (citations by other indexed papers that have themselves been cited), including 47 papers in Electrical and Electronic Engineering, 17 papers in Biomedical Engineering and 11 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in H.J. Möller's work include Silicon and Solar Cell Technologies (23 papers), Thin-Film Transistor Technologies (21 papers) and Silicon Carbide Semiconductor Technologies (14 papers). H.J. Möller is often cited by papers focused on Silicon and Solar Cell Technologies (23 papers), Thin-Film Transistor Technologies (21 papers) and Silicon Carbide Semiconductor Technologies (14 papers). H.J. Möller collaborates with scholars based in Germany, United States and Greece. H.J. Möller's co-authors include C. Funke, Markus Rinio, Martin Eickhoff, G. Krötz, Ε. Obermeier, Wolfgang Braun, Meinhard Kuna, J. Stoëmenos, Y.–H. Zhang and Stefan Zappe and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

H.J. Möller

58 papers receiving 922 citations

Peers

Countries citing papers authored by H.J. Möller

Since Specialization

Citations

This map shows the geographic impact of H.J. Möller's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H.J. Möller with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H.J. Möller more than expected).

Fields of papers citing papers by H.J. Möller

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H.J. Möller. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H.J. Möller. The network helps show where H.J. Möller may publish in the future.

Co-authorship network of co-authors of H.J. Möller

This figure shows the co-authorship network connecting the top 25 collaborators of H.J. Möller. A scholar is included among the top collaborators of H.J. Möller based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H.J. Möller. H.J. Möller is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Femtosecond laser and reactive ion etching based treatments for nanoscale surface texturing of porous silicon carbide 2018 ·IRIS Research product catalog (Sapienza University of Rome) ·A. Notargiacomo, Luca Laghi, Antonio Rinaldi, H.J. Möller, (unknown), Rodolfo Araneo, Marialilia Pea, L. Di Gaspare, M. De Seta, A. Bellucci, M. Girolami, S. Orlando, D.M. Trucchi	2
2	Simulation of the Dislocation Density During Multicrystalline Silicon Ingot Growth 2011 ·EU PVSEC ·R. Helbig, C. Funke, H.J. Möller	2
3	Solar Cell Emitters Fabricated by Flash Lamp Millisecond Annealing 2011 ·Acta Physica Polonica A ·Sławomir Prucnal, (unknown), W. Skorupa, Barbara Abendroth, (unknown), H.J. Möller	11
4	Investigation of Polyglycol Based Slurries for Multi Wire Sawing with Lower Forces and Less Hygroscopicity 2010 ·EU PVSEC ·(unknown), Antti Senf, (unknown), (unknown), T. Wágner, C. Funke, H.J. Möller	2
5	Determination of Dopant Concentrations in UMG - Silicon by FT-IR Spectroscopy, Hall- and Resistivity Measurements 2010 ·EU PVSEC ·(unknown), (unknown), H.J. Möller	3
6	Optimization of the Wire Sawing Process Using Force- and Temperature- Measurements 2008 ·EU PVSEC ·(unknown), Torsten Wagner, (unknown), H.J. Möller	6
7	A 3D Wire Saw Model of the Slurry Flow to Predict Forces Exerted Upon Silicon Ingots During Cutting 2008 ·EU PVSEC ·Thomas Wagner, H.J. Möller	5
8	Influence of crystal quality on the electronic properties of n-type 3C-SiC grown by low temperature low pressure chemical vapor deposition 2004 ·Journal of Applied Physics ·Martin Eickhoff, H.J. Möller, J. Stoëmenos, Stefan Zappe, (unknown), M. Stutzmann	19
9	A modular system of SiC-based microhotplates for the application in metal oxide gas sensors 2000 ·Sensors and Actuators B Chemical ·Florian Solzbacher, Cuk Imawan, H. Steffes, Ε. Obermeier, H.J. Möller	31
10	Accurate growth rate determination on rotating substrates using electron diffraction dynamics 1999 ·Applied Physics Letters ·Wolfgang Braun, H.J. Möller, Y.-H. Zhang	5
11	The evolution of cavities in Si at the 3C-SiC/Si interface during 3C-SiC deposition by LPCVD 1999 ·Materials Science and Engineering B ·Vasilios Papaioannou, H.J. Möller, M. Rapp, (unknown), Martin Eickhoff, G. Krötz, J. Stoëmenos	5
12	Influence of the silicon overlayer thickness of SOI unibond substrates on β-SIC heteroepitaxy 1999 ·Materials Science and Engineering B ·H.J. Möller, Martin Eickhoff, (unknown), M. Rapp, G. Krötz, Vasilios Papaioannou, J. Stoëmenos	5
13	High quality β-SiC films obtained by low-temperature heteroepitaxy combined with a fast carbonization step 1999 ·Applied Physics A ·H.J. Möller, Martin Eickhoff, M. Rapp, (unknown), G. Krötz	11
14	Heteroepitaxial growth of 3C-SiC on SOI for sensor applications 1999 ·Materials Science and Engineering B ·G. Krötz, H.J. Möller, Martin Eickhoff, Stefan Zappe, (unknown), Ε. Obermeier, J. Stoëmenos	24
15	Stabilization of the 3C-SiC/SOI system by an intermediate silicon nitride layer 1999 ·Materials Science and Engineering B ·Stefan Zappe, Ε. Obermeier, J. Stoëmenos, H.J. Möller, G. Krötz, H. Wirth, W. Skorupa	6
16	Reflection high-energy electron diffraction during substrate rotation: A new dimension forin situcharacterization 1998 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Wolfgang Braun, H.J. Möller, Y.–H. Zhang	30
17	In-situ observation of chemical vapour deposition growth of epitaxial SiGe thin films by reflexion supported pyrometric interferometry 1995 ·Journal of Crystal Growth ·G. Ritter, Bernd Tillack, (unknown), P. Zaumseil, (unknown), Brigitte Hertel, H.J. Möller	5
18	Real time, in situ measurement of film thickness with reflexion supported pyrometric interferometry (RSPI) 1994 ·(unknown), Brigitte Hertel, H.J. Möller, (unknown), G. Ritter	1
19	Simultaneous in situ measurement of film thickness and temperature by using multiple wavelengths pyrometric interferometry (MWPI) 1993 ·IEEE Transactions on Semiconductor Manufacturing ·(unknown), H.J. Möller	9
20	Simultaneous in-situ measurement of film thickness and temperature by using multiple wavelength pyrometric interferometry (MWPI) 1992 ·(unknown), H.J. Möller	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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