H.C. Kirsch

970 total citations · 1 hit paper
17 papers, 749 citations indexed

About

H.C. Kirsch is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, H.C. Kirsch has authored 17 papers receiving a total of 749 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 3 papers in Condensed Matter Physics and 2 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in H.C. Kirsch's work include Advancements in Semiconductor Devices and Circuit Design (12 papers), Semiconductor materials and devices (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). H.C. Kirsch is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (12 papers), Semiconductor materials and devices (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). H.C. Kirsch collaborates with scholars based in United States and Taiwan. H.C. Kirsch's co-authors include Rainer Bachmann, T. H. Geballe, C. N. King, Richard Howard, F. J. DiSalvo, R. L. Greene, R. E. Schwall, R. Zubeck, S.J. Hillenius and C.-Y. Lu and has published in prestigious journals such as IEEE Transactions on Electron Devices, Review of Scientific Instruments and Solid State Communications.

In The Last Decade

H.C. Kirsch

16 papers receiving 715 citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Heat Capacity Measurements on Small Samples at Low Temperatures

1972 436 citations Rainer Bachmann, F. J. DiSalvo et al. Review of Scientific Instruments profile →

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author						Papers	Cites
H.C. Kirsch	281	271	247	203	156	17	749
C. N. King	310 1.1×	399 1.5×	151 0.6×	198 1.0×	150 1.0×	23	760
R. A. Craven	188 0.7×	282 1.0×	201 0.8×	318 1.6×	225 1.4×	26	638
H. Homma	278 1.0×	359 1.3×	196 0.8×	141 0.7×	325 2.1×	35	776
R. Zubeck	426 1.5×	283 1.0×	64 0.3×	224 1.1×	178 1.1×	20	803
R. Lagnier	269 1.0×	221 0.8×	87 0.4×	348 1.7×	114 0.7×	31	584
E.W. Fenton	460 1.6×	202 0.7×	177 0.7×	335 1.7×	500 3.2×	70	888
H. T. Weaver	289 1.0×	246 0.9×	418 1.7×	171 0.8×	333 2.1×	78	1.0k
Paul F. Sullivan	264 0.9×	293 1.1×	50 0.2×	191 0.9×	175 1.1×	10	680
Barry M. Klein	228 0.8×	422 1.6×	110 0.4×	105 0.5×	333 2.1×	36	757
B. Szigeti	116 0.4×	307 1.1×	158 0.6×	177 0.9×	309 2.0×	25	623

Countries citing papers authored by H.C. Kirsch

Since Specialization

Citations

This map shows the geographic impact of H.C. Kirsch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H.C. Kirsch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H.C. Kirsch more than expected).

Fields of papers citing papers by H.C. Kirsch

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H.C. Kirsch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H.C. Kirsch. The network helps show where H.C. Kirsch may publish in the future.

Co-authorship network of co-authors of H.C. Kirsch

This figure shows the co-authorship network connecting the top 25 collaborators of H.C. Kirsch. A scholar is included among the top collaborators of H.C. Kirsch based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H.C. Kirsch. H.C. Kirsch is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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17 of 17 papers shown

Lage, Craig, et al.. (1995). The SCC BJT: a high-performance bipolar transistor compatible with high-density deep-submicrometer BiCMOS SRAM technologies. IEEE Transactions on Electron Devices. 42(7). 1277–1286. 2 indexed citations

Mazuré, C., et al.. (1994). Scaling of poly-encapsulated LOCOS for 0.35 μm CMOS technology. IEEE Transactions on Electron Devices. 41(1). 56–62. 9 indexed citations

Hayden, J.D., C. Mazuré, C.D. Gunderson, et al.. (1994). A quadruple well, quadruple polysilicon BiCMOS process for fast 16 Mb SRAM's. IEEE Transactions on Electron Devices. 41(12). 2318–2325. 7 indexed citations

Pfiester, J.R., J.D. Hayden, H.C. Kirsch, H.‐H. Tseng, & Umberto Ravaioli. (1993). An ultra-shallow buried-channel PMOST using boron penetration. IEEE Transactions on Electron Devices. 40(1). 207–213. 6 indexed citations

Roth, S., et al.. (1993). PELOX integrated PBL. IEEE Transactions on Semiconductor Manufacturing. 6(3). 246–250. 3 indexed citations

Roth, S., et al.. (1992). Characterization of polysilicon-encapsulated local oxidation. IEEE Transactions on Electron Devices. 39(5). 1085–1089. 13 indexed citations

Lu, C.-Y., et al.. (1991). Process limitation and device design tradeoffs of self-aligned TiSi/sub 2/ junction formation in submicrometer CMOS devices. IEEE Transactions on Electron Devices. 38(2). 246–254. 48 indexed citations

Roth, S., et al.. (1991). Recessed polysilicon encapsulated local oxidation. IEEE Electron Device Letters. 12(10). 515–517.

Roth, S., et al.. (1991). Polysilicon encapsulated local oxidation. IEEE Electron Device Letters. 12(3). 92–94. 19 indexed citations

10.

Lu, C.-Y., et al.. (1989). High-performance salicide shallow-junction CMOS devices for submicrometer VLSI application in twin-tub VI. IEEE Transactions on Electron Devices. 36(11). 2530–2536. 19 indexed citations

11.

Lu, C.-Y., J.M. Sung, H.C. Kirsch, et al.. (1989). Anomalous C-V characteristics of implanted poly MOS structure in n/sup +//p/sup +/ dual-gate CMOS technology. IEEE Electron Device Letters. 10(5). 192–194. 62 indexed citations

12.

Yaney, D.S., et al.. (1985). Technology for the fabrication of A 1 MB CMOS DRAM. 698–701. 8 indexed citations

13.

Kirsch, H.C., et al.. (1985). A 1Mb CMOS DRAM. 256–257. 14 indexed citations

14.

Bachmann, Rainer, F. J. DiSalvo, T. H. Geballe, et al.. (1972). Heat Capacity Measurements on Small Samples at Low Temperatures. Review of Scientific Instruments. 43(2). 205–214. 436 indexed citations breakdown →

15.

Bachmann, Rainer, H.C. Kirsch, & T. H. Geballe. (1971). Optical properties and superconductivity of NbSe2. Solid State Communications. 9(1). 57–60. 44 indexed citations

16.

King, C. N., H.C. Kirsch, & T. H. Geballe. (1971). The low temperature heat capacity and electrical resistivity of ReO3. Solid State Communications. 9(12). 907–910. 38 indexed citations

17.

Bachmann, Rainer, H.C. Kirsch, & T. H. Geballe. (1970). Low Temperature Silicon Thermometer and Bolometer. Review of Scientific Instruments. 41(4). 547–549. 21 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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