Hanying Feng
- Electrical and Electronic Engineering
- Computer Vision and Pattern Recognition
- Industrial and Manufacturing Engineering
- Media Technology
- Computer Networks and Communications
- Co-authors
- Michelle EffrosR. F. W. PeaseJun YeQian ZhaoK. ZegerZhipan LiJiangwei LiWei Yuan
- Topics
- Industrial Vision Systems and Defect Detection (8 papers)Advancements in Photolithography Techniques (6 papers)Advanced Data Compression Techniques (6 papers)
- Cited by
- Media TechnologyIndustrial and Manufacturing EngineeringComputer Vision and Pattern Recognition
- Journals
- IEEE Transactions on Information TheoryPatternsJournal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
- Partner nations
- United StatesSwedenJapan
In The Last Decade
Hanying Feng
18 papers receiving 99 citations
Peers
Comparison fields: 5 of 31
- Electrical and Electronic Engineering 54
- Computer Vision and Pattern Recognition 42
- Industrial and Manufacturing Engineering 26
- Media Technology 25
- Computer Networks and Communications 23
Countries citing papers authored by Hanying Feng
This map shows the geographic impact of Hanying Feng's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hanying Feng with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hanying Feng more than expected).
Fields of papers citing papers by Hanying Feng
This network shows the impact of papers produced by Hanying Feng. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hanying Feng. The network helps show where Hanying Feng may publish in the future.
Co-authorship network of co-authors of Hanying Feng
This figure shows the co-authorship network connecting the top 25 collaborators of Hanying Feng. A scholar is included among the top collaborators of Hanying Feng based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hanying Feng. Hanying Feng is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | 15 | |
| 3 | 0 | |
| 4 | 5 | |
| 5 | 3 | |
| 6 | 5 | |
| 7 | 3 | |
| 8 | 5 | |
| 9 | 2 | |
| 10 | 6 | |
| 11 | 2 | |
| 12 | 14 | |
| 13 | 7 | |
| 14 | 4 | |
| 15 | 6 | |
| 16 | 13 | |
| 17 | 5 | |
| 18 | 6 | |
| 19 | 2 |
About Hanying Feng
Hanying Feng is a scholar working on Industrial and Manufacturing Engineering, Structural Biology and Surfaces, Coatings and Films, having authored 19 papers that have together received 108 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (8 papers), Advancements in Photolithography Techniques (6 papers) and Advanced Data Compression Techniques (6 papers). The work is most often cited by research in Media Technology (25 citations), Industrial and Manufacturing Engineering (26 citations) and Computer Vision and Pattern Recognition (42 citations). Hanying Feng has collaborated with scholars based in United States, Sweden and Japan. Frequent co-authors include Michelle Effros, R. F. W. Pease, Jun Ye, Jun Ye, Qian Zhao, K. Zeger, Zhipan Li, Jiangwei Li, Wei Yuan and Liang Li. Their work appears in journals such as IEEE Transactions on Information Theory, Patterns and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.