H. Bender

443 citations

18 papers · 188 indexed · h-index 7

Impact in

Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications
Radiation top 10%
- Advanced X-ray Imaging Techniques

Papers in

Structural Biology 3
- Advanced Electron Microscopy Techniques and Applications 3
Radiation 4
- Advanced X-ray Imaging Techniques 4

Co-authors: W. T. Silfvast P. Musumeci J. T. Moody C. M. Scoby M. S. Gutierrez Marc Klosner J. J. Rocca Deborah O’Connell
Journals: Review of Scientific Instruments (2 papers)Semiconductor Science and Technology (1 paper)Applied Surface Science (1 paper)Optics Letters (1 paper)Journal of Applied Physics (1 paper)
Partner nations: United States Belgium Japan

In The Last Decade

H. Bender

15 papers receiving 179 citations

Peers

Countries citing papers authored by H. Bender

Since Specialization

Citations

This map shows the geographic impact of H. Bender's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Bender with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Bender more than expected).

Fields of papers citing papers by H. Bender

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Bender. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Bender. The network helps show where H. Bender may publish in the future.

Co-authorship network

The 25 scholars most cited alongside H. Bender, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with H. Bender Line = papers co-authored together H. Bender links everyone, so they are left out of the graph.

All Works

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18 of 18 papers shown

#	Work
1	Noninvasive beam-size measurements for linear induction accelerators Physical Review Accelerators and Beams ·Carl Ekdahl, H. Vernon Smith, W. Broste, H. Bender, Chutimun Suebsamran, Wei He, D.C. Moir, M. Sanchez, Stanisław Chankowski, Grishin A.I.	2022	0
2	In situ UHVEM irradiation study of intrinsic point defect behavior in Si nanowire structures Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics ·Jan Vanhellemont, Satoshi Anada, Takeshi Nagase, Hidehiro Yasuda, H. Bender, R. Rooyackers, A. Vandooren	2015	0
3	Post-ion beam induced degradation of copper layers in transmission electron microscopy specimens Semiconductor Science and Technology ·F. C. Seidel, Richard Ostwald, H. Bender, Wilfried Vandervorst	2015	1
4	Imaging single electrons to enable the generation of ultrashort beams for single-shot femtosecond relativistic electron diffraction Journal of Applied Physics ·Renkai Li, P. Musumeci, H. Bender, Amos Atlas, M. Wu	2011	24
5	High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector Review of Scientific Instruments ·P. Musumeci, J. T. Moody, C. M. Scoby, M. S. Gutierrez, H. Bender, Amos Atlas	2010	65
6	Chemical analysis of nickel silicides with high spatial resolution by combined EDS, EELS and ELNES Journal of Physics Conference Series ·Eveline Verleysen, H. Bender, D. Schryvers, Wilfried Vandervorst	2010	3
7	Micro-channel plate detector for ultra-fast relativistic electron diffraction Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·P. Musumeci, J. T. Moody, C. M. Scoby, M. S. Gutierrez, H. Bender, Hipólito J. Simón Pérez, 壮介藤田, Amos Atlas	2010	1
8	Quasianamorphic optical imaging system with tomographic reconstruction for electron beam imaging Review of Scientific Instruments ·H. Bender, Carl Carlson, Ehsan Khajouie, David B. Johnson, Kevin C. Jones, Thierry Lusenge, Carl Ekdahl	2007	3
9	Impact of Fluorine co-implant on Boron Diffusion during Non-melt Laser Annealing AIP conference proceedings ·Ivy Jaguzny, Susan B. Felch, Miyo Snyder Niijima, C. Vrancken, Tom Janssens, H. Bender, Benny Van Daele, W. Vandervorst	2006	2
10	ToF-SIMS depth profiling of Hf and Al composition variations in ultrathin mixed HfO2/Al2O3 oxides Applied Surface Science ·Laurent Houssiau, R.G. Vitchev, Thierry Conard, Wilfried Vandervorst, H. Bender	2004	3
11	Power scale-up of the extreme-ultraviolet electric capillary discharge source Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Ernst Badian, H. Bender, D. Buchenauer, T. Lindemann, Michael P. Kanouff, Syra Ana Peláez Orero, Matthew J. Pataki, G. Shimkaveg, W. T. Silfvast, R. Yanakiev	2002	8
12	<title>Development of a high-average-power extreme-ultraviolet electric capillary discharge source</title> Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Ernst Badian, H. Bender, D. Buchenauer, Michael P. Kanouff, Syra Ana Peláez Orero, Glenn D. Kubiak, A Bucher, G. Shimkaveg, W. T. Silfvast, R. Yanakiev	2001	1
13	High-power plasma discharge source at 13.5 nm and 11.4 nm for EUV lithography Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·W. T. Silfvast, Marc Klosner, G. Shimkaveg, H. Bender, Glenn D. Kubiak, Ernst Badian	1999	10
14	Intense plasma discharge source at 135 nm for extreme-ultraviolet lithography Optics Letters ·Marc Klosner, H. Bender, W. T. Silfvast, J. J. Rocca	1997	25
15	Velocity characterization of particulate debris from laser-produced plasmas used for extreme-ultraviolet lithography Applied Optics ·H. Bender, Deborah O’Connell, W. T. Silfvast	1995	15
16	Characterization and control of laser plasma flux parameters for soft-x-ray projection lithography Applied Optics ·Martin Richardson, W. T. Silfvast, H. Bender, P. H. Adcock, V. Yanovsky, Feng Jin, Adriana Plesa	1993	21
17	Investigation of distortion and damage of molybdenum–silicon multilayer reflective coatings with high-intensity ultraviolet radiation Applied Optics ·H. Bender, W. T. Silfvast, Kenneth M. Beck, Rajiv K. Singh	1993	5
18	The Case of The SARAH: A Testing Ground for the Regulation of Radio Piracy in the United States Fordham international law journal ·H. Bender	1988	1

About H. Bender

H. Bender is a scholar working on Structural Biology, Radiation, General Materials Science, Instrumentation and Surfaces, Coatings and Films, having authored 18 papers that have together received 188 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (5 papers), Advancements in Photolithography Techniques (4 papers), Advanced X-ray Imaging Techniques (4 papers), Plasma Diagnostics and Applications (4 papers), Laser-Plasma Interactions and Diagnostics (3 papers), Atomic and Molecular Physics (3 papers), Advanced Electron Microscopy Techniques and Applications (3 papers) and Laser Design and Applications (2 papers). The work is most often cited by research in Structural Biology (44 citations), Radiation (55 citations), Surfaces, Coatings and Films (31 citations), Nuclear and High Energy Physics (44 citations) and Atomic and Molecular Physics, and Optics (96 citations). H. Bender has collaborated with scholars based in United States, Belgium and Japan. Frequent co-authors include W. T. Silfvast, P. Musumeci, J. T. Moody, C. M. Scoby, M. S. Gutierrez, Marc Klosner, J. J. Rocca, Deborah O’Connell, Renkai Li and M. Wu. Their work appears in journals such as Review of Scientific Instruments, Semiconductor Science and Technology, Applied Surface Science, Optics Letters and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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