F. Azaı̈s
Impact in
- Hardware and Architecture top 1%
- VLSI and Analog Circuit Testing
-
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in PLL and VCO Technologies
- Advanced MEMS and NEMS Technologies
- Electrostatic Discharge in Electronics
- Advancements in Semiconductor Devices and Circuit Design
- Radio Frequency Integrated Circuit Design
Papers in
-
- VLSI and Analog Circuit Testing 85
-
- Integrated Circuits and Semiconductor Failure Analysis 68
- Advancements in PLL and VCO Technologies 27
- Radio Frequency Integrated Circuit Design 24
- Electrostatic Discharge in Electronics 21
- Advanced MEMS and NEMS Technologies 20
- Advancements in Semiconductor Devices and Circuit Design 18
- Co-authors
- M. RenovellSerge BernardYves BertrandPascal NouetMariane ComteNorbert DumasLaurent LatorreF. Mailly
In The Last Decade
F. Azaı̈s
134 papers receiving 1.0k citations
Peers
Comparison fields: 5 of 49
- Hardware and Architecture 630
- Electrical and Electronic Engineering 982
- Biomedical Engineering 330
- Computer Networks and Communications 89
- Control and Systems Engineering 77
Countries citing papers authored by F. Azaı̈s
This map shows the geographic impact of F. Azaı̈s's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Azaı̈s with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Azaı̈s more than expected).
Fields of papers citing papers by F. Azaı̈s
This network shows the impact of papers produced by F. Azaı̈s. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Azaı̈s. The network helps show where F. Azaı̈s may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Azaı̈s, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 0 | |
| 2 | 2024 | 0 | |
| 3 | 2024 | 1 | |
| 4 | 2023 | 3 | |
| 5 | Self-test and self-calibration of a MEMS convective accelerometer | 2013 | 4 |
| 6 | A study of package effects on the behavior of MEMS convective accelerometers | 2010 | 5 |
| 7 | 2010 | 15 | |
| 8 | 2009 | 2 | |
| 9 | Use of a Statistical Approach for Efficient Implementation of Oscillation-Based Test Strategy | 2008 | 2 |
| 10 | Determining DfT Hardware by VHDL-AMS Fault Simulation for Biological Micro-Electronic Fluidic Arrays | 2005 | 1 |
| 11 | 2004 | 5 | |
| 12 | 2003 | 4 | |
| 13 | 2003 | 3 | |
| 14 | Automatic Generation of LH-BIST Architecture for ADC Testing | 2003 | 2 |
| 15 | 2002 | 49 | |
| 16 | 2002 | 7 | |
| 17 | 2001 | 9 | |
| 18 | 2000 | 1 | |
| 19 | 1999 | 27 | |
| 20 | 1998 | 1 |
About F. Azaı̈s
F. Azaı̈s is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Biomedical Engineering, Computer Networks and Communications and Media Technology, having authored 150 papers that have together received 1.1k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (85 papers), Integrated Circuits and Semiconductor Failure Analysis (68 papers), Advancements in PLL and VCO Technologies (27 papers), Radio Frequency Integrated Circuit Design (24 papers), Analog and Mixed-Signal Circuit Design (22 papers), Electrostatic Discharge in Electronics (21 papers), Advanced MEMS and NEMS Technologies (20 papers) and Advancements in Semiconductor Devices and Circuit Design (18 papers). The work is most often cited by research in Hardware and Architecture (630 citations), Electrical and Electronic Engineering (982 citations), Biomedical Engineering (330 citations), Computer Networks and Communications (89 citations) and Control and Systems Engineering (77 citations). F. Azaı̈s has collaborated with scholars based in France, Tunisia and Brazil. Frequent co-authors include M. Renovell, Serge Bernard, Yves Bertrand, Pascal Nouet, Mariane Comte, Norbert Dumas, Laurent Latorre, F. Mailly, Vincent Kerzérho and Y. Bertrand. Their work appears in journals such as Microelectronics Reliability, Journal of Electronic Testing, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Nanotechnology and IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.