E. Trischler
- Hardware and Architecture top 2%
- Electrical and Electronic Engineering top 10%
- Software top 10%
- Computational Theory and Mathematics top 10%
- Control and Systems Engineering
- Co-authors
- Michael SchulzA.P. AmblerMats I. Johansson
- Topics
- VLSI and Analog Circuit Testing (10 papers)Integrated Circuits and Semiconductor Failure Analysis (9 papers)Engineering and Test Systems (5 papers)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsJournal of Electronic TestingIEEE Design & Test of Computers
- Partner nations
- GermanyUnited StatesUnited Kingdom
In The Last Decade
E. Trischler
9 papers receiving 422 citations
Peers
Comparison fields: 5 of 23
- Hardware and Architecture 433
- Electrical and Electronic Engineering 410
- Software 48
- Computational Theory and Mathematics 40
- Control and Systems Engineering 37
Countries citing papers authored by E. Trischler
This map shows the geographic impact of E. Trischler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Trischler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Trischler more than expected).
Fields of papers citing papers by E. Trischler
This network shows the impact of papers produced by E. Trischler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Trischler. The network helps show where E. Trischler may publish in the future.
Co-authorship network of co-authors of E. Trischler
This figure shows the co-authorship network connecting the top 25 collaborators of E. Trischler. A scholar is included among the top collaborators of E. Trischler based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Trischler. E. Trischler is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 4 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 5 | |
| 5 | 3 | |
| 6 | DOM: a defect occurrence model for evaluating the life cycle costs of test strategies | 1 |
| 7 | 7 | |
| 8 | 417 | |
| 9 | ATWIG, an automatic test pattern generator with inherent guidance | 8 |
| 10 | 5 | |
| 11 | 2 |
About E. Trischler
E. Trischler is a scholar working on Hardware and Architecture, Software and Control and Systems Engineering, having authored 11 papers that have together received 452 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (10 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Engineering and Test Systems (5 papers). The work is most often cited by research in Hardware and Architecture (433 citations), Software (48 citations) and Electrical and Electronic Engineering (410 citations). E. Trischler has collaborated with scholars based in Germany, United States and United Kingdom. Frequent co-authors include Michael Schulz, A.P. Ambler and Mats I. Johansson. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Journal of Electronic Testing and IEEE Design & Test of Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.