D.J. Pearson
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing 3
-
- Semiconductor materials and devices 9
- Low-power high-performance VLSI design 7
- Advancements in Semiconductor Devices and Circuit Design 5
- Integrated Circuits and Semiconductor Failure Analysis 4
- Advancements in PLL and VCO Technologies 3
-
- Copper Interconnects and Reliability 4
- Biomedical Engineering top 5%
- Condensed Matter Physics top 10%
- Physics of Superconductivity and Magnetism 4
- Co-authors
- M. B. SmallF. B. KaufmanM. JasoW. L. GuthrieDaniel B. ThompsonD.J. FrankAnne GattikerWilfried Haensch
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringElectronic, Optical and Magnetic Materials
- Journals
- IBM Journal of Research and Development (3 papers)IEEE Journal of Solid-State Circuits (2 papers)Applied Physics Letters (2 papers)
- Partner nations
- United StatesSwitzerland
In The Last Decade
D.J. Pearson
19 papers receiving 1.3k citations
Hit Papers
Peers
Comparison fields: 5 of 54
- Hardware and Architecture 224
- Electrical and Electronic Engineering 1.0k
- Electronic, Optical and Magnetic Materials 237
- Biomedical Engineering 518
- Condensed Matter Physics 98
Countries citing papers authored by D.J. Pearson
This map shows the geographic impact of D.J. Pearson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.J. Pearson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.J. Pearson more than expected).
Fields of papers citing papers by D.J. Pearson
This network shows the impact of papers produced by D.J. Pearson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.J. Pearson. The network helps show where D.J. Pearson may publish in the future.
Co-authorship network
The 25 scholars most cited alongside D.J. Pearson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 14 | |
| 2 | 2008 | 9 | |
| 3 | 2007 | 97 | |
| 4 | High-performance CMOS variability in the 65-nm regime and beyondbreakdown → | 2006 | 390 |
| 5 | 2005 | 5 | |
| 6 | 2005 | 13 | |
| 7 | 2003 | 0 | |
| 8 | 2002 | 15 | |
| 9 | 2002 | 14 | |
| 10 | 2001 | 2 | |
| 11 | 1995 | 189 | |
| 12 | 1995 | 3 | |
| 13 | 1995 | 18 | |
| 14 | 1993 | 18 | |
| 15 | 1992 | 16 | |
| 16 | 1991 | 4 | |
| 17 | Chemical‐Mechanical Polishing for Fabricating Patterned W Metal Features as Chip Interconnectsbreakdown → | 1991 | 403 |
| 18 | 1991 | 87 | |
| 19 | 1990 | 68 | |
| 20 | 1989 | 11 |
About D.J. Pearson
D.J. Pearson is a scholar working on Hardware and Architecture, Condensed Matter Physics and Electrical and Electronic Engineering, having authored 20 papers that have together received 1.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (9 papers), Low-power high-performance VLSI design (7 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Physics of Superconductivity and Magnetism (4 papers), Copper Interconnects and Reliability (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), VLSI and Analog Circuit Testing (3 papers) and Advancements in PLL and VCO Technologies (3 papers). The work is most often cited by research in Hardware and Architecture (224 citations), Electrical and Electronic Engineering (1.0k citations) and Electronic, Optical and Magnetic Materials (237 citations). D.J. Pearson has collaborated with scholars based in United States and Switzerland. Frequent co-authors include M. B. Small, F. B. Kaufman, M. Jaso, W. L. Guthrie, Daniel B. Thompson, D.J. Frank, Anne Gattiker, Wilfried Haensch, Norman J. Rohrer and E. Nowak. Their work appears in journals such as IBM Journal of Research and Development, IEEE Journal of Solid-State Circuits, Applied Physics Letters, Thin Solid Films and IEEE Transactions on Semiconductor Manufacturing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.