Dah-Bin Kao

759 total citations
14 papers, 560 citations indexed

About

Dah-Bin Kao is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Dah-Bin Kao has authored 14 papers receiving a total of 560 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Electrical and Electronic Engineering, 6 papers in Materials Chemistry and 2 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Dah-Bin Kao's work include Semiconductor materials and devices (11 papers), Silicon and Solar Cell Technologies (5 papers) and Silicon Nanostructures and Photoluminescence (5 papers). Dah-Bin Kao is often cited by papers focused on Semiconductor materials and devices (11 papers), Silicon and Solar Cell Technologies (5 papers) and Silicon Nanostructures and Photoluminescence (5 papers). Dah-Bin Kao collaborates with scholars based in United States. Dah-Bin Kao's co-authors include Krishna C. Saraswat, J.P. McVittie, William D. Nix, C. R. Helms, B. E. Deal, W.G. Oldham, William A. Tiller, L. M. Landsberger, W.D. Nix and Edward R. Myers and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and Applied Surface Science.

In The Last Decade

Dah-Bin Kao

13 papers receiving 529 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Dah-Bin Kao United States	7	424	235	229	111	48	14	560
T. Akatsu France	14	453 1.1×	119 0.5×	131 0.6×	167 1.5×	16 0.3×	20	522
A. Plößl Germany	8	437 1.0×	133 0.6×	99 0.4×	195 1.8×	13 0.3×	14	536
G. Kissinger Germany	13	591 1.4×	108 0.5×	240 1.0×	204 1.8×	16 0.3×	105	677
L. Nesbit United States	10	311 0.7×	115 0.5×	264 1.2×	78 0.7×	17 0.4×	14	452
Y. Arimoto Japan	12	876 2.1×	247 1.1×	318 1.4×	96 0.9×	18 0.4×	67	1.1k
F. Letertre France	17	938 2.2×	227 1.0×	218 1.0×	214 1.9×	52 1.1×	57	1.0k
J.B. McKitterick United States	8	837 2.0×	222 0.9×	89 0.4×	117 1.1×	43 0.9×	23	907
A. Jean Canada	9	341 0.8×	67 0.3×	288 1.3×	82 0.7×	54 1.1×	21	496
C.C.G. Visser Netherlands	8	357 0.8×	169 0.7×	130 0.6×	129 1.2×	10 0.2×	23	440
C. Deguet France	14	494 1.2×	197 0.8×	144 0.6×	142 1.3×	9 0.2×	34	565

Countries citing papers authored by Dah-Bin Kao

Since Specialization

Citations

This map shows the geographic impact of Dah-Bin Kao's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dah-Bin Kao with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dah-Bin Kao more than expected).

Fields of papers citing papers by Dah-Bin Kao

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Dah-Bin Kao. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dah-Bin Kao. The network helps show where Dah-Bin Kao may publish in the future.

Co-authorship network of co-authors of Dah-Bin Kao

This figure shows the co-authorship network connecting the top 25 collaborators of Dah-Bin Kao. A scholar is included among the top collaborators of Dah-Bin Kao based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Dah-Bin Kao. Dah-Bin Kao is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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14 of 14 papers shown

Hanson, D.A., et al.. (2005). Analysis Of The Controllability Of A Sub-Micron CMOS Process Using TCAD. 34. 85–89. 2 indexed citations

Kao, Dah-Bin, et al.. (1998). Two-dimensional effects in titanium silicidation. IEEE Transactions on Electron Devices. 45(1). 187–193.

Kao, Dah-Bin, et al.. (1991). The Effect of Aqueous Chemical Cleaning on Si (100) Dry Oxidation Kinetics. Journal of The Electrochemical Society. 138(8). 2353–2361. 7 indexed citations

Kao, Dah-Bin, et al.. (1989). Effect of SiO2 surface chemistry on the oxidation of silicon. Applied Physics Letters. 54(8). 715–717. 34 indexed citations

Kao, Dah-Bin, et al.. (1989). A Study of the Breakdown Testing of Thermal Silicon Oxides and the Efects of Preoxidation Surface Treatment. Reliability physics. 9–16. 6 indexed citations

Helms, C. R., et al.. (1989). Parallel oxidation model for Si including both molecular and atomic oxygen mechanisms. Applied Surface Science. 39(1-4). 89–102. 6 indexed citations

Landsberger, L. M., Dah-Bin Kao, & William A. Tiller. (1988). Conformal Two‐Dimensional SiO2 Layers on Silicon Grown by Low Temperature Corona Discharge. Journal of The Electrochemical Society. 135(7). 1766–1771. 5 indexed citations

Kao, Dah-Bin, J.P. McVittie, William D. Nix, & Krishna C. Saraswat. (1988). Two-dimensional thermal oxidation of silicon. II. Modeling stress effects in wet oxides. IEEE Transactions on Electron Devices. 35(1). 25–37. 277 indexed citations

Kao, Dah-Bin, J.P. McVittie, William D. Nix, & Krishna C. Saraswat. (1987). Two-dimensional thermal oxidation of silicon—I. Experiments. IEEE Transactions on Electron Devices. 34(5). 1008–1017. 165 indexed citations

10.

Helms, C. R., et al.. (1987). Effect of silicon surface cleaning procedures on oxidation kinetics and surface chemistry. Applied Surface Science. 30(1-4). 17–24. 13 indexed citations

11.

Oldham, W.G., et al.. (1987). Modeling of stress-effects in silicon oxidation including the non-linear viscosity of oxide. 264–267. 17 indexed citations

12.

Kao, Dah-Bin, J.P. McVittie, William D. Nix, & Krishna C. Saraswat. (1985). Two-dimensional silicon oxidation experiments and theory. 388–391. 22 indexed citations

13.

Kao, Dah-Bin, Krishna C. Saraswat, & J.P. McVittie. (1985). Annealing of oxide fixed charges in scaled polysilicon gate MOS structures. IEEE Transactions on Electron Devices. 32(5). 918–925. 1 indexed citations

14.

Kao, Dah-Bin, Krishna C. Saraswat, J.P. McVittie, & W.D. Nix. (1985). IIB-1 the role of stress in two-dimensional silicon oxidation. IEEE Transactions on Electron Devices. 32(11). 2530–2531. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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