D. Theirich
- Surfaces, Coatings and Films top 5%
- Surface Modification and Superhydrophobicity 9
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- Semiconductor materials and devices 12
- Plasma Diagnostics and Applications 8
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- Diamond and Carbon-based Materials Research 5
- ZnO doping and properties 3
- Mechanics of Materials top 10%
- Metal and Thin Film Mechanics 8
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- Copper Interconnects and Reliability 4
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- Ion-surface interactions and analysis 3
- Co-authors
- J. EngemannThomas RiedlD. KorzecLukas HoffmannDetlef RogallaKai Oliver BrinkmannFlorian WernerJ. Rapp
In The Last Decade
D. Theirich
25 papers receiving 576 citations
Peers
Comparison fields: 5 of 53
- Surfaces, Coatings and Films 154
- Electrical and Electronic Engineering 398
- Materials Chemistry 300
- Mechanics of Materials 120
- Polymers and Plastics 66
Countries citing papers authored by D. Theirich
This map shows the geographic impact of D. Theirich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Theirich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Theirich more than expected).
Fields of papers citing papers by D. Theirich
This network shows the impact of papers produced by D. Theirich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Theirich. The network helps show where D. Theirich may publish in the future.
Co-authorship network
The 25 scholars most cited alongside D. Theirich, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 11 | |
| 2 | 2022 | 1 | |
| 3 | 2020 | 15 | |
| 4 | 2018 | 3 | |
| 5 | 2018 | 26 | |
| 6 | 2017 | 34 | |
| 7 | 2017 | 50 | |
| 8 | 2015 | 21 | |
| 9 | 2013 | 14 | |
| 10 | 2008 | 1 | |
| 11 | 2003 | 46 | |
| 12 | 1999 | 16 | |
| 13 | 1998 | 29 | |
| 14 | 1997 | 10 | |
| 15 | 1996 | 13 | |
| 16 | 1995 | 57 | |
| 17 | 1995 | 75 | |
| 18 | 1995 | 21 | |
| 19 | 1994 | 34 | |
| 20 | 1991 | 4 |
About D. Theirich
D. Theirich is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Mechanics of Materials, Materials Chemistry and Electronic, Optical and Magnetic Materials, having authored 25 papers that have together received 597 indexed citations. Recurring topics across this work include Semiconductor materials and devices (12 papers), Surface Modification and Superhydrophobicity (9 papers), Metal and Thin Film Mechanics (8 papers), Plasma Diagnostics and Applications (8 papers), Diamond and Carbon-based Materials Research (5 papers), Copper Interconnects and Reliability (4 papers), Ion-surface interactions and analysis (3 papers) and ZnO doping and properties (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (154 citations), Electrical and Electronic Engineering (398 citations), Materials Chemistry (300 citations), Mechanics of Materials (120 citations) and Polymers and Plastics (66 citations). D. Theirich has collaborated with scholars based in Germany, Slovakia and Ireland. Frequent co-authors include J. Engemann, Thomas Riedl, D. Korzec, Lukas Hoffmann, Detlef Rogalla, Kai Oliver Brinkmann, Florian Werner, J. Rapp, Tim Becker and Ivan Shutsko. Their work appears in journals such as Surface and Coatings Technology, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, ACS Applied Materials & Interfaces, Vacuum and Chemical Communications.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.