D. Nest

726 total citations
17 papers, 666 citations indexed

About

D. Nest is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Mechanics of Materials. According to data from OpenAlex, D. Nest has authored 17 papers receiving a total of 666 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Electrical and Electronic Engineering, 8 papers in Computational Mechanics and 5 papers in Mechanics of Materials. Recurrent topics in D. Nest's work include Plasma Diagnostics and Applications (9 papers), Ion-surface interactions and analysis (8 papers) and Semiconductor materials and devices (6 papers). D. Nest is often cited by papers focused on Plasma Diagnostics and Applications (9 papers), Ion-surface interactions and analysis (8 papers) and Semiconductor materials and devices (6 papers). D. Nest collaborates with scholars based in United States, Austria and Bulgaria. D. Nest's co-authors include David B. Graves, G. S. Oehrlein, Robert L. Bruce, Sebastian Engelmann, F. Weilnboeck, R. J. Phaneuf, Eric A. Hudson, Cecily Andes, Brian K. Long and C. Grant Willson and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of Physics D Applied Physics.

In The Last Decade

D. Nest

17 papers receiving 653 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
D. Nest United States 15 497 243 226 174 131 17 666
F. Weilnboeck United States 13 376 0.8× 174 0.7× 180 0.8× 112 0.6× 107 0.8× 21 505
M. C. Peignon France 12 362 0.7× 38 0.2× 186 0.8× 164 0.9× 129 1.0× 16 531
Peter A. Atanasov Bulgaria 12 258 0.5× 125 0.5× 184 0.8× 72 0.4× 173 1.3× 61 524
D. Theirich Germany 15 398 0.8× 28 0.1× 300 1.3× 120 0.7× 79 0.6× 25 597
Felix Mitschker Germany 15 332 0.7× 27 0.1× 247 1.1× 113 0.6× 59 0.5× 33 483
M. Naddaf Syria 13 259 0.5× 23 0.1× 325 1.4× 162 0.9× 126 1.0× 45 518
A. C. Fozza Canada 8 248 0.5× 52 0.2× 140 0.6× 59 0.3× 81 0.6× 9 502
Silvia Varagnolo United Kingdom 15 323 0.6× 259 1.1× 186 0.8× 72 0.4× 183 1.4× 24 662
Lionel Teulé‐Gay France 13 209 0.4× 43 0.2× 196 0.9× 184 1.1× 40 0.3× 30 379
Catherine B. Labelle United States 14 365 0.7× 16 0.1× 225 1.0× 163 0.9× 104 0.8× 34 551

Countries citing papers authored by D. Nest

Since Specialization
Citations

This map shows the geographic impact of D. Nest's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Nest with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Nest more than expected).

Fields of papers citing papers by D. Nest

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Nest. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Nest. The network helps show where D. Nest may publish in the future.

Co-authorship network of co-authors of D. Nest

This figure shows the co-authorship network connecting the top 25 collaborators of D. Nest. A scholar is included among the top collaborators of D. Nest based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. Nest. D. Nest is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

17 of 17 papers shown
1.
Bruce, Robert L., F. Weilnboeck, T. Lin, et al.. (2010). Relationship between nanoscale roughness and ion-damaged layer in argon plasma exposed polystyrene films. Journal of Applied Physics. 107(8). 90 indexed citations
2.
Nest, D., David B. Graves, F. Weilnboeck, et al.. (2010). Electron, ion and vacuum ultraviolet photon effects in 193 nm photoresist surface roughening. Journal of Physics D Applied Physics. 43(27). 272001–272001. 18 indexed citations
3.
Nest, D., David B. Graves, Robert L. Bruce, et al.. (2010). Role of polymer structure and ceiling temperature in polymer roughening and degradation during plasma processing: a beam system study of P4MS and PαMS. Journal of Physics D Applied Physics. 43(8). 85204–85204. 13 indexed citations
4.
Weilnboeck, F., Robert L. Bruce, Sebastian Engelmann, et al.. (2010). Photoresist modifications by plasma vacuum ultraviolet radiation: The role of polymer structure and plasma chemistry. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 28(5). 993–1004. 44 indexed citations
5.
Nest, D., et al.. (2009). Comparing 193 nm photoresist roughening in an inductively coupled plasma system and vacuum beam system. Journal of Physics D Applied Physics. 42(24). 245205–245205. 28 indexed citations
6.
Engelmann, Sebastian, Robert L. Bruce, F. Weilnboeck, et al.. (2009). Dependence of Polymer Surface Roughening Rate on Deposited Energy Density During Plasma Processing. Plasma Processes and Polymers. 6(8). 484–489. 29 indexed citations
7.
Bruce, Robert L., Sebastian Engelmann, T. Lin, et al.. (2009). Study of ion and vacuum ultraviolet-induced effects on styrene- and ester-based polymers exposed to argon plasma. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 27(3). 1142–1155. 59 indexed citations
8.
Engelmann, Sebastian, Robert L. Bruce, R. J. Phaneuf, et al.. (2009). Plasma-surface interactions of advanced photoresists with C4F8∕Ar discharges: Plasma parameter dependencies. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 27(1). 92–106. 21 indexed citations
9.
Nest, D., et al.. (2009). Modelling vacuum ultraviolet photon penetration depth and C=O bond depletion in 193 nm photoresist. Journal of Physics D Applied Physics. 42(15). 152001–152001. 15 indexed citations
10.
Nest, D., David B. Graves, Sebastian Engelmann, et al.. (2009). Understanding the Roughening and Degradation of 193 nm Photoresist during Plasma Processing: Synergistic Roles of Vacuum Ultraviolet Radiation and Ion Bombardment. Plasma Processes and Polymers. 6(10). 649–657. 57 indexed citations
11.
Engelmann, Sebastian, Robert L. Bruce, F. Weilnboeck, et al.. (2009). Dependence of photoresist surface modifications during plasma-based pattern transfer on choice of feedgas composition: Comparison of C4F8- and CF4-based discharges. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 27(3). 1165–1179. 16 indexed citations
12.
Nest, D., et al.. (2009). Absolute vacuum ultraviolet flux in inductively coupled plasmas and chemical modifications of 193 nm photoresist. Applied Physics Letters. 94(17). 46 indexed citations
13.
Nest, D., David B. Graves, Robert L. Bruce, et al.. (2008). Molecular dynamics simulations of near-surface modification of polystyrene: Bombardment with Ar+ and Ar+/radical chemistries. Journal of Applied Physics. 104(3). 38 indexed citations
14.
Nest, D., David B. Graves, Sebastian Engelmann, et al.. (2008). Synergistic effects of vacuum ultraviolet radiation, ion bombardment, and heating in 193nm photoresist roughening and degradation. Applied Physics Letters. 92(15). 62 indexed citations
15.
Pargon, E., D. Nest, & David B. Graves. (2007). Ar + bombardment of 193nm photoresist: Morphological effects. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 25(4). 1236–1243. 12 indexed citations
16.
Engelmann, Sebastian, Robert L. Bruce, R. J. Phaneuf, et al.. (2007). Plasma-surface interactions of model polymers for advanced photoresists using C4F8∕Ar discharges and energetic ion beams. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 25(4). 1353–1364. 66 indexed citations
17.
Nest, D., David B. Graves, Robert L. Bruce, et al.. (2007). Near-surface modification of polystyrene by Ar+: Molecular dynamics simulations and experimental validation. Applied Physics Letters. 91(23). 52 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by F. Weilnboeck Breakdown of academic impact, for papers by M. C. Peignon Breakdown of academic impact, for papers by Peter A. Atanasov Breakdown of academic impact, for papers by D. Theirich Breakdown of academic impact, for papers by Felix Mitschker Breakdown of academic impact, for papers by M. Naddaf Breakdown of academic impact, for papers by A. C. Fozza Breakdown of academic impact, for papers by Silvia Varagnolo Breakdown of academic impact, for papers by Lionel Teulé‐Gay Breakdown of academic impact, for papers by Catherine B. Labelle
Rankless by CCL
2026