J. T. Blandford

488 total citations
8 papers, 380 citations indexed

About

J. T. Blandford is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Nuclear and High Energy Physics. According to data from OpenAlex, J. T. Blandford has authored 8 papers receiving a total of 380 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Electrical and Electronic Engineering, 2 papers in Hardware and Architecture and 2 papers in Nuclear and High Energy Physics. Recurrent topics in J. T. Blandford's work include Radiation Effects in Electronics (8 papers), Semiconductor materials and devices (3 papers) and CCD and CMOS Imaging Sensors (2 papers). J. T. Blandford is often cited by papers focused on Radiation Effects in Electronics (8 papers), Semiconductor materials and devices (3 papers) and CCD and CMOS Imaging Sensors (2 papers). J. T. Blandford collaborates with scholars based in United States. J. T. Blandford's co-authors include J.C. Pickel, R. Koga, Donald K. Nichols, William E. Price and W. A. Kolasinski and has published in prestigious journals such as IEEE Transactions on Nuclear Science.

In The Last Decade

J. T. Blandford

8 papers receiving 354 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
J. T. Blandford United States	8	352	111	48	36	31	8	380
J.B. Langworthy United States	9	275 0.8×	39 0.4×	37 0.8×	33 0.9×	49 1.6×	17	328
C. Barillot France	8	316 0.9×	78 0.7×	44 0.9×	26 0.7×	43 1.4×	20	345
H.S. Kim United States	13	432 1.2×	79 0.7×	29 0.6×	14 0.4×	18 0.6×	19	448
Andrew Michael Chugg United Kingdom	13	332 0.9×	70 0.6×	69 1.4×	30 0.8×	47 1.5×	29	362
B. Sagnes France	12	450 1.3×	182 1.6×	53 1.1×	36 1.0×	29 0.9×	22	466
N. Buard France	12	415 1.2×	99 0.9×	55 1.1×	43 1.2×	27 0.9×	30	443
W.G. Abdel-Kader United States	14	322 0.9×	57 0.5×	60 1.3×	59 1.6×	44 1.4×	22	359
M.-C. Calvet France	16	698 2.0×	266 2.4×	58 1.2×	28 0.8×	37 1.2×	37	716
S. E. Diehl United States	13	415 1.2×	124 1.1×	18 0.4×	17 0.5×	18 0.6×	15	421
Alan D. Tipton United States	9	430 1.2×	146 1.3×	44 0.9×	41 1.1×	33 1.1×	13	452

Countries citing papers authored by J. T. Blandford

Since Specialization

Citations

This map shows the geographic impact of J. T. Blandford's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. T. Blandford with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. T. Blandford more than expected).

Fields of papers citing papers by J. T. Blandford

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. T. Blandford. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. T. Blandford. The network helps show where J. T. Blandford may publish in the future.

Co-authorship network of co-authors of J. T. Blandford

This figure shows the co-authorship network connecting the top 25 collaborators of J. T. Blandford. A scholar is included among the top collaborators of J. T. Blandford based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. T. Blandford. J. T. Blandford is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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8 of 8 papers shown

1.

Blandford, J. T. & J.C. Pickel. (1985). Use of CF-252 to Determine Parameters for SEU Rate Calculation. IEEE Transactions on Nuclear Science. 32(6). 4282–4286. 27 indexed citations

2.

Pickel, J.C., et al.. (1985). Heavy Ion Induced Permanent Damage in MNOS Gate Insulators. IEEE Transactions on Nuclear Science. 32(6). 4176–4179. 18 indexed citations

3.

Nichols, Donald K., William E. Price, W. A. Kolasinski, et al.. (1985). Trends in Parts Susceptibility to Single Event Upset from Heavy Ions. IEEE Transactions on Nuclear Science. 32(6). 4189–4194. 31 indexed citations

4.

Blandford, J. T., et al.. (1984). Cosmic Ray Induced Permanent Damage in MNOS EAROMs. IEEE Transactions on Nuclear Science. 31(6). 1568–1570. 14 indexed citations

5.

Pickel, J.C. & J. T. Blandford. (1981). CMOS RAM Cosmic-Ray-Induced-Error-Rate Analysis. IEEE Transactions on Nuclear Science. 28(6). 3962–3967. 38 indexed citations

6.

Pickel, J.C. & J. T. Blandford. (1980). Cosmic-Ray-Induced Errors in MOS Devices. IEEE Transactions on Nuclear Science. 27(2). 1006–1015. 112 indexed citations

7.

Pickel, J.C. & J. T. Blandford. (1978). Cosmic Ray Induced in MOS Memory Cells. IEEE Transactions on Nuclear Science. 25(6). 1166–1171. 133 indexed citations

8.

Blandford, J. T., et al.. (1976). Radiation Hardened 64-BIT CMOS/SOS RAM. IEEE Transactions on Nuclear Science. 23(6). 1728–1731. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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