B. E. Artz

737 citations

26 papers · 552 indexed · h-index 10

Impact in

Safety, Risk, Reliability and Quality top 2%
- Traffic and Road Safety
Social Psychology top 5%
- Human-Automation Interaction and Safety
- Safety Warnings and Signage

Papers in ⓘ

Electrical and Electronic Engineering 11
- Semiconductor materials and devices 3
- Integrated Circuits and Semiconductor Failure Analysis 3
- Silicon and Solar Cell Technologies 3
Social Psychology 7
- Human-Automation Interaction and Safety 6

Co-authors: L. C. Davis (1 shared paper)Larry Cathey (8 shared papers)Mike Blommer (7 shared papers)Jeff Greenberg (7 shared papers)Reates Curry (5 shared papers)Peter R. Grant (4 shared papers)Louis Tijerina (3 shared papers)Dev S. Kochhar (3 shared papers)
Journals: Journal of Applied Physics (2 papers)IEEE Transactions on Electron Devices (1 paper)Vehicle System Dynamics (1 paper)Journal of Electronic Packaging (1 paper)X-Ray Spectrometry (2 papers)
Partner nations: United States Canada

In The Last Decade

B. E. Artz

24 papers receiving 489 citations

Peers

Countries citing papers authored by B. E. Artz

Since Specialization

Citations

This map shows the geographic impact of B. E. Artz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. E. Artz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. E. Artz more than expected).

Fields of papers citing papers by B. E. Artz

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. E. Artz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. E. Artz. The network helps show where B. E. Artz may publish in the future.

Co-authors

The 22 scholars most cited alongside B. E. Artz, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with B. E. Artz Line = papers co-authored together B. E. Artz links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 26 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Thermal conductivity of metal-matrix composites Journal of Applied Physics ·L. C. Davis, B. E. Artz	1995	142
2	Driver Distraction: Evaluation with Event Detection Paradigm Transportation Research Record Journal of the Transportation Research Board ·Jeff Greenberg, Louis Tijerina, Reates Curry, B. E. Artz, Larry Cathey, Dev S. Kochhar, Ksenia Kozak, Mike Blommer, Peter R. Grant	2003	106
3	Evaluation of Lane Departure Warnings for Drowsy Drivers Proceedings of the Human Factors and Ergonomics Society Annual Meeting ·Ksenia Kozak, Jochen Pohl, Wolfgang Birk, Jeff Greenberg, B. E. Artz, Mike Blommer, Larry Cathey, Reates Curry	2006	86
4	THE EFFECT OF LATERAL MOTION CUES DURING SIMULATED DRIVING Jeffry Allen Greenberg, B. E. Artz, Larry Cathey	2003	51
5	EVALUATION OF DRIVER DISTRACTION USING AN EVENT DETECTION PARADIGM Jeff Greenberg, Louis Tijerina, Reates Curry, B. E. Artz, Larry Cathey, Peter R. Grant, Dev S. Kochhar, Ksenia Kozak, Mike Blommer	2003	41
6	Analysing classes of motion drive algorithms based on paired comparison techniques Vehicle System Dynamics ·Peter R. Grant, Mike Blommer, B. E. Artz, Jeff Greenberg	2009	15
7	Leading Indicators of Drowsiness in Simulated Driving Proceedings of the Human Factors and Ergonomics Society Annual Meeting ·Ksenia Kozak, Reates Curry, Jeff Greenberg, B. E. Artz, Mike Blommer, Larry Cathey	2005	15
8	A finite element method for determining structural displacements resulting from electrostatic forces B. E. Artz, Larry Cathey	2003	12
9	Examples of image processing using a computer controlled SEM Scanning ·B. E. Artz	1983	12
10	Electron-beam-induced current determination of minority-carrier diffusion length and surface recombination velocity in mercury-cadmium-telluride Journal of Applied Physics ·B. E. Artz	1985	11
11	Surface phenomena of potential concern to longevity of dispenser cathodes Applications of Surface Science ·E. N. Sickafus, M. A. Smith, John Hammond, B. E. Artz, John Bomback	1979	9
12	Triode characteristics and vacuum considerations of evaporated silicon microdevices Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·M. Aslam, Pete Klimecky, G. P. Myers, H.H. Busta, B.J. Zimmerman, B. E. Artz, L. Cathey, Richard Elder	1993	8
13	The influence of study design on results in HMI testing for active safety 20th International Technical Conference on the Enhanced Safety of Vehicles (ESV)National Highway Traffic Safety Administration ·Mikael Ljung, Mike Blommer, Reates Curry, B. E. Artz, Jeff Greenberg, Dev S. Kochhar, Louis Tijerina, Martin Fagerstrom, Lotta Jakobsson	2007	7
14	X‐ray fluorescence analysis of catalytic converters using single‐element standards and theoretical corrections for interelement effects X-Ray Spectrometry ·B. E. Artz	1977	6
15	A Note on the Implementation of Temperature Dependent Coefficient of Thermal Expansion (CTE) in ABAQUS Journal of Electronic Packaging ·Yi-Hsin Pao, Edward Jih, B. E. Artz, Larry Cathey	1992	6
16	A comparison of cleaning procedures for removing potassium from wafers exposed to KOH IEEE Transactions on Electron Devices ·M. Aslam, B. E. Artz, S. L. Kaberline, T. J. Prater	1993	5
17	Analyzing Classes of Motion Drive Algorithms Based on Paired Comparison Techniques Peter R. Grant, Mike Blommer, Larry Cathey, B. E. Artz, Jeff Greenberg	2003	5
18	Fabrication and characterization of electron beam evaporated silicon field emitter arrays Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·G. P. Myers, M. Aslam, Pete Klimecky, L. Cathey, Richard Elder, B. E. Artz	1993	5
19	A Universal Data Base Approach For Quantitative WDXRF Analysis With General Purpose Data Acquisition Algorithms Advances in X-ray Analysis ·M. J. Rokosz, B. E. Artz	1985	2
20	Using DEC Operating System for X-Ray Diffraction and X-Ray Fluorescence Analysis Advances in X-ray Analysis ·B. E. Artz, E. C. Kao, Michael Short	1978	2

About B. E. Artz

B. E. Artz is a scholar working on Electrical and Electronic Engineering, Social Psychology, Safety, Risk, Reliability and Quality, Surfaces, Coatings and Films and Radiation, having authored 26 papers that have together received 552 indexed citations. Recurring topics across this work include Traffic and Road Safety (7 papers), Human-Automation Interaction and Safety (6 papers), Electron and X-Ray Spectroscopy Techniques (5 papers), X-ray Spectroscopy and Fluorescence Analysis (4 papers), Semiconductor materials and devices (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Nuclear Physics and Applications (3 papers) and Silicon and Solar Cell Technologies (3 papers). The work is most often cited by research in Safety, Risk, Reliability and Quality (194 citations), Social Psychology (252 citations), Ceramics and Composites (51 citations), Physical Therapy, Sports Therapy and Rehabilitation (32 citations) and Automotive Engineering (86 citations). B. E. Artz has collaborated with scholars based in United States and Canada. Frequent co-authors include L. C. Davis, Larry Cathey, Mike Blommer, Jeff Greenberg, Reates Curry, Peter R. Grant, Louis Tijerina, Dev S. Kochhar, Wolfgang Birk and Jochen Pohl. Their work appears in journals such as Journal of Applied Physics, IEEE Transactions on Electron Devices, Vehicle System Dynamics, Journal of Electronic Packaging and X-Ray Spectrometry.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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