E. N. Sickafus

975 total citations
27 papers, 758 citations indexed

About

E. N. Sickafus is a scholar working on Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Electrical and Electronic Engineering. According to data from OpenAlex, E. N. Sickafus has authored 27 papers receiving a total of 758 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Atomic and Molecular Physics, and Optics, 14 papers in Surfaces, Coatings and Films and 7 papers in Electrical and Electronic Engineering. Recurrent topics in E. N. Sickafus's work include Electron and X-Ray Spectroscopy Techniques (14 papers), Surface and Thin Film Phenomena (9 papers) and Advanced Chemical Physics Studies (8 papers). E. N. Sickafus is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (14 papers), Surface and Thin Film Phenomena (9 papers) and Advanced Chemical Physics Studies (8 papers). E. N. Sickafus collaborates with scholars based in United States, Brazil and Israel. E. N. Sickafus's co-authors include Richard E. Robertson, G. S. Y. Yeh, Christian Kukla, C. F. Eagen, Alex D. Colvin, B. E. Artz, M. A. Smith, John Hammond, D. B. Barker and V. S. Sundaram and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Journal of Applied Physics.

In The Last Decade

E. N. Sickafus

27 papers receiving 693 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
E. N. Sickafus United States 14 469 278 250 247 151 27 758
G.R. Massoumi Canada 17 222 0.5× 156 0.6× 206 0.8× 290 1.2× 319 2.1× 39 831
J.P. Langeron France 16 312 0.7× 185 0.7× 106 0.4× 279 1.1× 340 2.3× 43 765
M G C Cox United Kingdom 14 273 0.6× 68 0.2× 207 0.8× 167 0.7× 267 1.8× 17 671
S. Samarin Australia 19 268 0.6× 628 2.3× 110 0.4× 242 1.0× 246 1.6× 98 1.0k
Eiichi Nomura Japan 17 225 0.5× 354 1.3× 63 0.3× 591 2.4× 280 1.9× 46 1.1k
J. Brunner Switzerland 15 79 0.2× 80 0.3× 70 0.3× 158 0.6× 225 1.5× 30 520
C. Tomastik Austria 16 273 0.6× 192 0.7× 150 0.6× 241 1.0× 352 2.3× 40 954
A. Cachard France 13 73 0.2× 165 0.6× 50 0.2× 297 1.2× 181 1.2× 33 557
W. Miles Clift United States 16 129 0.3× 131 0.5× 66 0.3× 374 1.5× 388 2.6× 40 818
D. Gräf Germany 16 83 0.2× 341 1.2× 69 0.3× 802 3.2× 532 3.5× 45 1.2k

Countries citing papers authored by E. N. Sickafus

Since Specialization
Citations

This map shows the geographic impact of E. N. Sickafus's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. N. Sickafus with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. N. Sickafus more than expected).

Fields of papers citing papers by E. N. Sickafus

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. N. Sickafus. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. N. Sickafus. The network helps show where E. N. Sickafus may publish in the future.

Co-authorship network of co-authors of E. N. Sickafus

This figure shows the co-authorship network connecting the top 25 collaborators of E. N. Sickafus. A scholar is included among the top collaborators of E. N. Sickafus based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. N. Sickafus. E. N. Sickafus is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sickafus, E. N., et al.. (1981). Summary Abstract: Auger yield measurements without deconvolution. Journal of Vacuum Science and Technology. 18(2). 598–598. 2 indexed citations
2.
Sickafus, E. N.. (1980). A secondary electron emission correction for quantitative auger yield measurements. Surface Science. 100(3). 529–540. 60 indexed citations
3.
Sickafus, E. N. & Christian Kukla. (1979). Linearized secondary-electron cascades from the surface of metals. III. Line-shape synthesis. Physical review. B, Condensed matter. 19(8). 4056–4068. 35 indexed citations
4.
Sickafus, E. N., et al.. (1979). Surface phenomena of potential concern to longevity of dispenser cathodes. Applications of Surface Science. 2(2). 213–231. 9 indexed citations
5.
Sickafus, E. N.. (1977). Linearized secondary-electron cascades from the surfaces of metals. II. Surface and subsurface sources. Physical review. B, Solid state. 16(4). 1448–1458. 77 indexed citations
6.
Sickafus, E. N.. (1977). Linearized secondary-electron cascades from the surfaces of metals. I. Clean surfaces of homogeneous specimens. Physical review. B, Solid state. 16(4). 1436–1447. 152 indexed citations
7.
Eagen, C. F. & E. N. Sickafus. (1977). Transmission properties of a cylindrical mirror analyzer viewed in energy-angle space. Review of Scientific Instruments. 48(10). 1269–1277. 16 indexed citations
8.
Sickafus, E. N., et al.. (1975). Specimen position effects on energy shifts and signal intensity in a single-stage cylindrical-mirror analyzer. Surface Science. 51(1). 131–139. 28 indexed citations
9.
Sickafus, E. N.. (1974). Surface characterization by Auger electron spectrometry. Journal of Vacuum Science and Technology. 11(1). 299–311. 28 indexed citations
10.
Sickafus, E. N., et al.. (1974). Interstitial space in hardsphere clusters. Acta Crystallographica Section A. 30(6). 850–851. 4 indexed citations
11.
Sickafus, E. N., et al.. (1973). Auger Line Shape Comparison of N and S in Two Different Chemical Environments. Journal of Vacuum Science and Technology. 10(1). 43–46. 18 indexed citations
12.
Sickafus, E. N.. (1973). Electron-Excited Auger-Electron Spectrum of aNi(110)−c(2×2)SSurface: Line-Shape Analysis and Correlation with Ion-Neutralization Spectroscopy. Physical review. B, Solid state. 7(12). 5100–5114. 24 indexed citations
13.
Sickafus, E. N.. (1973). Self-consistent analysis of iVV-Auger fine structure. Surface Science. 36(2). 472–477. 7 indexed citations
14.
Sickafus, E. N., et al.. (1972). Elastic-Scattering Effects in Characteristic Electron-Energy-Loss Spectra of Ni(110) Adsorbate Surfaces. Physical review. B, Solid state. 6(10). 3714–3727. 30 indexed citations
15.
Sickafus, E. N.. (1972). Reply. Review of Scientific Instruments. 43(7). 1055–1056. 1 indexed citations
16.
Sickafus, E. N., et al.. (1971). Surface Molecular-Orbital Excitations in Electron Energy-Loss Spectra. Physical Review Letters. 27(15). 992–995. 30 indexed citations
17.
Sickafus, E. N.. (1970). Sulfur and carbon on the (110) surface of nickel. Surface Science. 19(1). 181–197. 66 indexed citations
18.
Sickafus, E. N. & Alex D. Colvin. (1970). A Multichannel Monitor for Repetitive Auger Electron Spectroscopy with Application to Surface Composition Changes. Review of Scientific Instruments. 41(9). 1349–1354. 9 indexed citations
19.
Sickafus, E. N.. (1966). Surface Spikes: A Perturbation of Growth Steps. Journal of Applied Physics. 37(7). 2607–2614. 1 indexed citations
20.
Sickafus, E. N.. (1966). Concave-Convex Growth Spirals. Journal of Applied Physics. 37(4). 1938–1938. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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