Andreas Nickel

409 total citations
15 papers, 320 citations indexed

About

Andreas Nickel is a scholar working on Biomedical Engineering, Computational Mechanics and Electrical and Electronic Engineering. According to data from OpenAlex, Andreas Nickel has authored 15 papers receiving a total of 320 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Biomedical Engineering, 9 papers in Computational Mechanics and 5 papers in Electrical and Electronic Engineering. Recurrent topics in Andreas Nickel's work include Advanced Surface Polishing Techniques (10 papers), Surface Roughness and Optical Measurements (6 papers) and Advanced Measurement and Metrology Techniques (4 papers). Andreas Nickel is often cited by papers focused on Advanced Surface Polishing Techniques (10 papers), Surface Roughness and Optical Measurements (6 papers) and Advanced Measurement and Metrology Techniques (4 papers). Andreas Nickel collaborates with scholars based in Germany and Russia. Andreas Nickel's co-authors include T. Hänsel, Frank Frost, Axel Schindler, Renate Fechner, A. Schindler, Thomas Arnold, G. Böhm, Thomas Haensel, Frank Siewert and Heiner Lammert and has published in prestigious journals such as SHILAP Revista de lepidopterología, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment and Vakuum in Forschung und Praxis.

In The Last Decade

Andreas Nickel

14 papers receiving 303 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Andreas Nickel Germany 8 223 165 118 102 72 15 320
R. Hawley United States 5 129 0.6× 187 1.1× 77 0.7× 48 0.5× 26 0.4× 5 293
Holger Blaschke Germany 8 109 0.5× 221 1.3× 112 0.9× 36 0.4× 29 0.4× 40 312
Hiroaki Sumitani Japan 9 129 0.6× 24 0.1× 230 1.9× 26 0.3× 53 0.7× 45 346
V. Vervisch France 8 130 0.6× 149 0.9× 183 1.6× 144 1.4× 12 0.2× 27 340
Ralf Steinkopf Germany 9 174 0.8× 75 0.5× 103 0.9× 15 0.1× 70 1.0× 26 314
David M. Aikens United States 10 144 0.6× 168 1.0× 66 0.6× 11 0.1× 122 1.7× 25 285
C. Hernandez France 9 88 0.4× 15 0.1× 100 0.8× 233 2.3× 53 0.7× 25 324
Peter Kuerz Germany 16 151 0.7× 32 0.2× 449 3.8× 22 0.2× 32 0.4× 27 516
Tsutomu Shoki Japan 13 71 0.3× 27 0.2× 366 3.1× 20 0.2× 32 0.4× 54 414
Vaughn G. Draggoo United States 8 119 0.5× 200 1.2× 90 0.8× 34 0.3× 29 0.4× 14 277

Countries citing papers authored by Andreas Nickel

Since Specialization
Citations

This map shows the geographic impact of Andreas Nickel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Andreas Nickel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Andreas Nickel more than expected).

Fields of papers citing papers by Andreas Nickel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Andreas Nickel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Andreas Nickel. The network helps show where Andreas Nickel may publish in the future.

Co-authorship network of co-authors of Andreas Nickel

This figure shows the co-authorship network connecting the top 25 collaborators of Andreas Nickel. A scholar is included among the top collaborators of Andreas Nickel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Andreas Nickel. Andreas Nickel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

15 of 15 papers shown
1.
Nickel, Andreas, et al.. (2019). On construction of jet-drop optical measuring systems: analysis of optical, dynamic and metrological parameters in visualization of surface of product. SHILAP Revista de lepidopterología. 89–95. 1 indexed citations
2.
Nickel, Andreas, et al.. (2019). Possibilities to improve accuracy of contact measurements by using corundum tips and video recording of contact area. SHILAP Revista de lepidopterología. 68–75. 4 indexed citations
3.
Курлов, В. Н., et al.. (2018). QUESTIONS OF CONSTRUCTION OF TELESCOPIC DEVICES OF ACTIVE CONTROL OF THE SIZES OF PRODUCTS WITH CORUNDUM TIPS. Dynamics of Systems Mechanisms and Machines. 6(2). 29–37. 1 indexed citations
4.
Arnold, Thomas, G. Böhm, Renate Fechner, et al.. (2009). Ultra-precision surface finishing by ion beam and plasma jet techniques—status and outlook. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 616(2-3). 147–156. 162 indexed citations
5.
Haensel, Thomas, Andreas Nickel, & Axel Schindler. (2008). Ion Beam Figuring of Strongly Curved Surfaces with a (X, Y, Z) Linear Three-Axes System. JWD6–JWD6. 15 indexed citations
6.
Hänsel, T., Frank Frost, Andreas Nickel, & T. Schindler. (2007). Ultra‐precision Surface Finishing by Ion Beam Techniques. Vakuum in Forschung und Praxis. 19(5). 24–30. 22 indexed citations
7.
Schindler, Axel, T. Hänsel, Andreas Nickel, et al.. (2005). Ion Beam Figuring (IBF) Solutions for High Performance Optics Surface Finishing from Meter to Millimeter Spatial Wavelength Range(Advances in non-traditional machining). Proceedings of International Conference on Leading Edge Manufacturing in 21st century LEM21. 2005.2(0). 589–594.
8.
Siewert, Frank, Heiner Lammert, Tino Noll, et al.. (2005). Advanced metrology: an essential support for the surface finishing of high performance x-ray optics. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5921. 592101–592101. 28 indexed citations
10.
Schindler, Axel, et al.. (2004). Finishing procedure for high-performance synchrotron optics. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5180. 64–64. 33 indexed citations
11.
Schindler, Axel, T. Hänsel, Frank Frost, et al.. (2002). Ion beam finishing technology for high precision optics production. OTuB5–OTuB5. 11 indexed citations
12.
Haensel, Thomas, et al.. (2002). Local thickness correction of nanometer thin films by means of ion beam etching. OWB2–OWB2. 2 indexed citations
13.
Schindler, Axel, et al.. (2001). <title>Precision optical asphere fabrication by plasma jet chemical etching (PJCE) and ion beam figuring</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4451. 242–248. 21 indexed citations
14.
Haensel, Thomas, Andreas Nickel, & Axel Schindler. (2001). <title>Stitching interferometry of aspherical surfaces</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4449. 265–275. 4 indexed citations
15.
Flamm, D., et al.. (1999). Reactive ion beam etching: a fabrication process for the figuring of precision aspheric optical surfaces in fused silica. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3739. 167–167. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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