A. Lawerenz
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- Silicon and Solar Cell Technologies 29
- Thin-Film Transistor Technologies 18
- Integrated Circuits and Semiconductor Failure Analysis 6
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- Semiconductor materials and interfaces 11
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- Silicon Nanostructures and Photoluminescence 6
- Diamond and Carbon-based Materials Research 3
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- Laser Material Processing Techniques 5
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- Advanced Surface Polishing Techniques 5
A. Lawerenz
43 papers receiving 386 citations
Peers
Comparison fields: 5 of 44
- Electrical and Electronic Engineering 356
- Atomic and Molecular Physics, and Optics 114
- Materials Chemistry 118
- Computational Mechanics 51
- Ceramics and Composites 10
Countries citing papers authored by A. Lawerenz
This map shows the geographic impact of A. Lawerenz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Lawerenz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Lawerenz more than expected).
Fields of papers citing papers by A. Lawerenz
This network shows the impact of papers produced by A. Lawerenz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Lawerenz. The network helps show where A. Lawerenz may publish in the future.
Co-authorship network
The 25 scholars most cited alongside A. Lawerenz, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2019 | 2 | |
| 2 | 2013 | 1 | |
| 3 | 2013 | 14 | |
| 4 | 2013 | 12 | |
| 5 | 2012 | 13 | |
| 6 | 2012 | 7 | |
| 7 | 2012 | 7 | |
| 8 | 2010 | 12 | |
| 9 | 2010 | 6 | |
| 10 | 2009 | 4 | |
| 11 | 2009 | 1 | |
| 12 | 2008 | 2 | |
| 13 | 2005 | 15 | |
| 14 | 2003 | 9 | |
| 15 | Measurement of the electrical activity of defects in multicrystalline silicon | 2000 | 1 |
| 16 | Multicrystalline Si1–XGeX Alloys for Solar Cell Applications | 1997 | 3 |
| 17 | 1986 | 6 | |
| 18 | 1983 | 1 | |
| 19 | 1982 | 1 | |
| 20 | [Detection of cancerogenic substances in water, demonstrated by 2 examples of water preparation]. | 1967 | 1 |
About A. Lawerenz
A. Lawerenz is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 44 papers that have together received 409 indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (29 papers), Thin-Film Transistor Technologies (18 papers), Semiconductor materials and interfaces (11 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Silicon Nanostructures and Photoluminescence (6 papers), Laser Material Processing Techniques (5 papers), Advanced Surface Polishing Techniques (5 papers) and Diamond and Carbon-based Materials Research (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (356 citations), Atomic and Molecular Physics, and Optics (114 citations) and Materials Chemistry (118 citations). A. Lawerenz has collaborated with scholars based in Germany, China and United States. Frequent co-authors include A. Laades, Kevin Lauer, M. Bähr, H. Metzner, H. Übensee, Hans Joachim Möller, S. Riedel, M. Werner, C. Funke and Heinrich Möller. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.