Immediate Impact
7 standout
Citing Papers
Machine tool calibration: Measurement, modeling, and compensation of machine tool errors
2023 Standout
Structural parameters of nanoparticles affecting their toxicity for biomedical applications: a review
2023 Standout
Works of Erin Mclellan being referenced
In-line E-beam wafer metrology and defect inspection: the end of an era for image-based critical dimensional metrology? New life for defect inspection
2013
Plasmonic and Diffractive Coupling in 2D Arrays of Nanoparticles produced by Electron Beam Lithography
2006
Author Peers
| Author | Last Decade | Papers | Cites | |||
|---|---|---|---|---|---|---|
| Erin Mclellan | 83 | 42 | 50 | 8 | 114 | |
| U. Haak | 50 | 25 | 47 | 11 | 94 | |
| Yao-Ching Ku | 97 | 15 | 24 | 6 | 107 | |
| D. S. Alles | 94 | 26 | 36 | 12 | 111 | |
| Ian M. Barton | 80 | 56 | 75 | 9 | 169 | |
| Tomislav Vučina | 70 | 25 | 24 | 12 | 126 | |
| K.P. Müller | 119 | 17 | 36 | 14 | 132 | |
| Kyupil Lee | 91 | 48 | 29 | 13 | 139 | |
| J.S. Schoenwald | 69 | 47 | 90 | 7 | 154 | |
| Bernhard Kneer | 171 | 96 | 69 | 11 | 191 | |
| Steven F. Nagle | 84 | 20 | 54 | 9 | 132 |
All Works
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