Z. Liliental

703 total citations · 1 hit paper
17 papers, 525 citations indexed

About

Z. Liliental is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Z. Liliental has authored 17 papers receiving a total of 525 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 10 papers in Atomic and Molecular Physics, and Optics and 9 papers in Materials Chemistry. Recurrent topics in Z. Liliental's work include Semiconductor materials and interfaces (5 papers), Surface and Thin Film Phenomena (5 papers) and Semiconductor materials and devices (5 papers). Z. Liliental is often cited by papers focused on Semiconductor materials and interfaces (5 papers), Surface and Thin Film Phenomena (5 papers) and Semiconductor materials and devices (5 papers). Z. Liliental collaborates with scholars based in United States, Poland and Czechia. Z. Liliental's co-authors include Stephen M. Goodnick, C. W. Wilmsen, Ondrej L. Krivanek, D. Fathy, D. K. Ferry, J. Taftø, R. W. Carpenter, O. L. Krivanek, John F. Wager and J. S. Escher and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Z. Liliental

17 papers receiving 499 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Surface roughness at the Si(100)-SiO2interface

1985 423 citations Stephen M. Goodnick, D. K. Ferry et al. Physical review. B, Condensed matter profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Z. Liliental United States	8	411	192	124	83	50	17	525
J. H. Dinan United States	10	262 0.6×	190 1.0×	132 1.1×	52 0.6×	48 1.0×	21	357
K. Werner Netherlands	13	424 1.0×	308 1.6×	131 1.1×	67 0.8×	57 1.1×	36	509
F. Ermanis United States	13	366 0.9×	330 1.7×	124 1.0×	39 0.5×	38 0.8×	20	488
R. W. Streater Canada	12	250 0.6×	250 1.3×	105 0.8×	78 0.9×	42 0.8×	31	359
R. Bierwolf Germany	7	249 0.6×	325 1.7×	170 1.4×	61 0.7×	55 1.1×	9	431
E. Koppensteiner Austria	13	276 0.7×	294 1.5×	191 1.5×	71 0.9×	38 0.8×	27	458
P. D. Augustus United Kingdom	14	315 0.8×	273 1.4×	135 1.1×	36 0.4×	73 1.5×	27	450
S. M. Mokler United Kingdom	14	345 0.8×	273 1.4×	154 1.2×	50 0.6×	101 2.0×	32	476
W. Nijman Netherlands	8	245 0.6×	246 1.3×	100 0.8×	30 0.4×	34 0.7×	12	347
K. E. Strege United States	11	358 0.9×	343 1.8×	116 0.9×	50 0.6×	33 0.7×	18	508

Countries citing papers authored by Z. Liliental

Since Specialization

Citations

This map shows the geographic impact of Z. Liliental's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Z. Liliental with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Z. Liliental more than expected).

Fields of papers citing papers by Z. Liliental

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Z. Liliental. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Z. Liliental. The network helps show where Z. Liliental may publish in the future.

Co-authorship network of co-authors of Z. Liliental

This figure shows the co-authorship network connecting the top 25 collaborators of Z. Liliental. A scholar is included among the top collaborators of Z. Liliental based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Z. Liliental. Z. Liliental is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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17 of 17 papers shown

Liliental, Z., R. W. Carpenter, & J. C. Kelly. (1986). The structure of rapidly thermally annealed nitrogen-implanted silicon. Thin Solid Films. 138(1). 141–150. 8 indexed citations

Liliental, Z., O. L. Krivanek, John F. Wager, & Stephen M. Goodnick. (1985). Structure of the InP/SiO2 interface. Applied Physics Letters. 46(9). 889–891. 8 indexed citations

Krivanek, O. L. & Z. Liliental. (1985). High-resolution microanalysis of semiconductor interfaces. Ultramicroscopy. 18(1-4). 355–360. 1 indexed citations

Goodnick, Stephen M., D. K. Ferry, C. W. Wilmsen, et al.. (1985). Surface roughness at the Si(100)-SiO2interface. Physical review. B, Condensed matter. 32(12). 8171–8186. 423 indexed citations breakdown →

Liliental, Z., Chris Kocot, J. Washburn, & R. Gronsky. (1985). TEM investigation of titanium-silicide Schottky contacts on GaAs. Ultramicroscopy. 18(1-4). 361–369. 1 indexed citations

Krivanek, O. L., et al.. (1985). A combined high-resolution electron microscopy, x-ray photoemission spectroscopy, and electrical properties study of the InP–SiO2 interface. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 3(4). 1081–1086. 9 indexed citations

Liliental, Z., R. W. Carpenter, & J. S. Escher. (1984). Electron microscopy study of the AuGe/Ni/Au contacts on GaAs and GaAlAs. Ultramicroscopy. 14(1-2). 135–144. 13 indexed citations

Liliental, Z., et al.. (1983). Nitrogen Ion Implantation in Silicon: Structure of the Subsurface Region. MRS Proceedings. 25. 3 indexed citations

Liliental, Z.. (1983). On the point and line defects which are common to both degraded light emitting diodes and plastically deformed GaAs. Journal of Applied Physics. 54(4). 2097–2102. 3 indexed citations

10.

Liliental, Z., R. W. Carpenter, & Richard T. Tuenge. (1983). How epitaxial are Pd2SiSi interfaces?. Thin Solid Films. 104(1-2). 17–29. 7 indexed citations

11.

Taftø, J. & Z. Liliental. (1982). Studies of the cation atom distribution in ZnCr_xFe_2−xO₄spinels using the channeling effect in electron-induced X-ray emission. Journal of Applied Crystallography. 15(3). 260–265. 29 indexed citations

12.

Liliental, Z.. (1979). The effect of Ag impurity on the real structure of ZnTe. physica status solidi (a). 55(2). 639–645. 2 indexed citations

13.

Liliental, Z.. (1979). The effect of real structure on optical properties of ZnTe. physica status solidi (a). 55(2). K173–K178. 1 indexed citations

14.

Liliental, Z., et al.. (1979). Electron microscopic investigations of precipitates in Cu-doped ZnTe. physica status solidi (a). 56(2). 679–685. 3 indexed citations

15.

Auleytner, J., et al.. (1979). On X-ray and electron microscopic characterization of lattice defects in AIIBVI semiconductor compounds. physica status solidi (a). 55(2). 603–609. 4 indexed citations

16.

Liliental, Z., et al.. (1976). The effect of diffusion of Ag on the real structure of ZnTe crystals. physica status solidi (a). 34(1). K5–K6. 3 indexed citations

17.

Liliental, Z., et al.. (1974). Some remarks on the real structure investigation of ZnTe and CdTe crystals by transmission microscopy. physica status solidi (a). 23(2). K115–K116. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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