Yu‐Cheng Kao
- Electrical and Electronic Engineering top 10%
- Computer Networks and Communications top 5%
- Artificial Intelligence top 5%
- Industrial and Manufacturing Engineering top 5%
- Materials Chemistry
- Co-authors
- Wen‐Hwa LiaoWen‐Shing LeeYiting ChenMin KongPeng TianYung‐Hsien WuMing‐Hsien ChenYi-Ting Huang
- Topics
- Ferroelectric and Negative Capacitance Devices (8 papers)Semiconductor materials and devices (8 papers)ZnO doping and properties (7 papers)
- Cited by
- Industrial and Manufacturing EngineeringComputer Networks and CommunicationsBuilding and Construction
- Partner nations
- TaiwanUnited StatesSweden
In The Last Decade
Yu‐Cheng Kao
44 papers receiving 929 citations
Peers
Comparison fields: 5 of 87
- Electrical and Electronic Engineering 413
- Computer Networks and Communications 332
- Artificial Intelligence 238
- Industrial and Manufacturing Engineering 160
- Materials Chemistry 125
Countries citing papers authored by Yu‐Cheng Kao
This map shows the geographic impact of Yu‐Cheng Kao's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yu‐Cheng Kao with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yu‐Cheng Kao more than expected).
Fields of papers citing papers by Yu‐Cheng Kao
This network shows the impact of papers produced by Yu‐Cheng Kao. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yu‐Cheng Kao. The network helps show where Yu‐Cheng Kao may publish in the future.
Co-authorship network of co-authors of Yu‐Cheng Kao
This figure shows the co-authorship network connecting the top 25 collaborators of Yu‐Cheng Kao. A scholar is included among the top collaborators of Yu‐Cheng Kao based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yu‐Cheng Kao. Yu‐Cheng Kao is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 6 | |
| 3 | 3 | |
| 4 | 0 | |
| 5 | 11 | |
| 6 | 5 | |
| 7 | 14 | |
| 8 | 17 | |
| 9 | 2 | |
| 10 | 39 | |
| 11 | 10 | |
| 12 | 24 | |
| 13 | 37 | |
| 14 | 20 | |
| 15 | 1 | |
| 16 | 3 | |
| 17 | 120 | |
| 18 | 30 | |
| 19 | 8 | |
| 20 | 15 |
About Yu‐Cheng Kao
Yu‐Cheng Kao is a scholar working on Industrial and Manufacturing Engineering, Condensed Matter Physics and Materials Chemistry, having authored 47 papers that have together received 987 indexed citations. Recurring topics across this work include Ferroelectric and Negative Capacitance Devices (8 papers), Semiconductor materials and devices (8 papers) and ZnO doping and properties (7 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (160 citations), Computer Networks and Communications (332 citations) and Building and Construction (121 citations). Yu‐Cheng Kao has collaborated with scholars based in Taiwan, United States and Sweden. Frequent co-authors include Wen‐Hwa Liao, Wen‐Shing Lee, Yiting Chen, Min Kong, Peng Tian, Yung‐Hsien Wu, Ming‐Hsien Chen, Yi-Ting Huang, Hao‐Kai Peng and Ray‐Hua Horng. Their work appears in journals such as Scientific Reports, Small and Optics Express.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.