Yannick Bonhomme
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing 18
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- Integrated Circuits and Semiconductor Failure Analysis 17
- Radiation Effects in Electronics 7
- Semiconductor materials and devices 6
- Advancements in Photolithography Techniques 4
- Low-power high-performance VLSI design 3
- Electrical Fault Detection and Protection 2
- Electrostatic Discharge in Electronics 2
- Co-authors
- Patrick GirardC. LandraultS. PravossoudovitchL. GuillerA. VirazelHideo FujiwaraTomokazu YonedaFabrice Auzanneau
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringControl and Systems Engineering
- Journals
- Journal of Electronic Testing (3 papers)Journal of Low Power Electronics (1 paper)Design, Automation, and Test in Europe (1 paper)
- Partner nations
- FranceUnited StatesSwitzerland
In The Last Decade
Yannick Bonhomme
25 papers receiving 380 citations
Peers
Comparison fields: 5 of 22
- Hardware and Architecture 347
- Electrical and Electronic Engineering 379
- Control and Systems Engineering 54
- Computer Networks and Communications 25
- Software 3
Countries citing papers authored by Yannick Bonhomme
This map shows the geographic impact of Yannick Bonhomme's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yannick Bonhomme with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yannick Bonhomme more than expected).
Fields of papers citing papers by Yannick Bonhomme
This network shows the impact of papers produced by Yannick Bonhomme. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yannick Bonhomme. The network helps show where Yannick Bonhomme may publish in the future.
Co-authorship network
The 11 scholars most cited alongside Yannick Bonhomme, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2015 | 13 | |
| 2 | 2014 | 10 | |
| 3 | 2013 | 3 | |
| 4 | 2012 | 2 | |
| 5 | 2011 | 12 | |
| 6 | 2011 | 7 | |
| 7 | 2010 | 1 | |
| 8 | 2009 | 4 | |
| 9 | 2009 | 5 | |
| 10 | Test Power: A Big Issue in Large SOC Design | 2008 | 2 |
| 11 | 2007 | 1 | |
| 12 | 2006 | 4 | |
| 13 | 2005 | 1 | |
| 14 | Test Application Time Reduction with a Dynamically Reconfigurable Scan Tree Architecture | 2005 | 3 |
| 15 | 2004 | 38 | |
| 16 | 2004 | 2 | |
| 17 | 2003 | 22 | |
| 18 | 2003 | 84 | |
| 19 | Power Conscious Testing | 2003 | 1 |
| 20 | 2002 | 114 |
About Yannick Bonhomme
Yannick Bonhomme is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Computer Networks and Communications, having authored 25 papers that have together received 396 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (18 papers), Integrated Circuits and Semiconductor Failure Analysis (17 papers), Radiation Effects in Electronics (7 papers), Semiconductor materials and devices (6 papers), Advancements in Photolithography Techniques (4 papers), Low-power high-performance VLSI design (3 papers), Electrical Fault Detection and Protection (2 papers) and Electrostatic Discharge in Electronics (2 papers). The work is most often cited by research in Hardware and Architecture (347 citations), Electrical and Electronic Engineering (379 citations) and Control and Systems Engineering (54 citations). Yannick Bonhomme has collaborated with scholars based in France, United States and Switzerland. Frequent co-authors include Patrick Girard, C. Landrault, S. Pravossoudovitch, L. Guiller, A. Virazel, Hideo Fujiwara, Tomokazu Yoneda, Fabrice Auzanneau, Wafa Hassen and Antoine Dupret. Their work appears in journals such as Journal of Electronic Testing, Journal of Low Power Electronics, Design, Automation, and Test in Europe, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 and HAL (Le Centre pour la Communication Scientifique Directe).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.