Y. Yahagi

733 total citations · 1 hit paper
15 papers, 564 citations indexed

About

Y. Yahagi is a scholar working on Electrical and Electronic Engineering, Radiation and Hardware and Architecture. According to data from OpenAlex, Y. Yahagi has authored 15 papers receiving a total of 564 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 9 papers in Radiation and 3 papers in Hardware and Architecture. Recurrent topics in Y. Yahagi's work include Radiation Effects in Electronics (11 papers), Radiation Detection and Scintillator Technologies (8 papers) and Nuclear reactor physics and engineering (3 papers). Y. Yahagi is often cited by papers focused on Radiation Effects in Electronics (11 papers), Radiation Detection and Scintillator Technologies (8 papers) and Nuclear reactor physics and engineering (3 papers). Y. Yahagi collaborates with scholars based in Japan and United States. Y. Yahagi's co-authors include Eishi Ibe, Tadanobu Toba, Hitoshi Taniguchi, Kenichi Shimbo, Mamoru Baba, Takashi Nakamura, S. Yamamoto, Masahiko Sato, S. U. Chung and Yasuyuki Takahashi and has published in prestigious journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Nuclear Science and Radiation Protection Dosimetry.

In The Last Decade

Y. Yahagi

15 papers receiving 529 citations

Hit Papers

Impact of Scaling on Neutron-Induced Soft Error in SRAMs ... 2010 2026 2015 2020 2010 100 200 300
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule
    2010 376 citations Eishi Ibe, Hitoshi Taniguchi et al. IEEE Transactions on Electron Devices profile →

Peers

Y. Yahagi
Austin Lesea United States
Allison Taber United States
K.A. LaBel United States
Steven M. Guertin United States
M.-C. Calvet France
H. Puchner United States
D.G. Mavis United States
B. Gill United States
M.P. Baze United States
Y. Boulghassoul United States
Austin Lesea United States
Y. Yahagi
Citations per year, relative to Y. Yahagi Y. Yahagi (= 1×) peers Austin Lesea

Countries citing papers authored by Y. Yahagi

Since Specialization
Citations

This map shows the geographic impact of Y. Yahagi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Yahagi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Yahagi more than expected).

Fields of papers citing papers by Y. Yahagi

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y. Yahagi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Yahagi. The network helps show where Y. Yahagi may publish in the future.

Co-authorship network of co-authors of Y. Yahagi

This figure shows the co-authorship network connecting the top 25 collaborators of Y. Yahagi. A scholar is included among the top collaborators of Y. Yahagi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Y. Yahagi. Y. Yahagi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

15 of 15 papers shown
1.
Yahagi, Y., et al.. (2013). Estimation of Conducted Emission from Automotive Components by Using Noise Equivalent Circuit. IEICE Technical Report; IEICE Tech. Rep.. 113(310). 7–10. 1 indexed citations
2.
Ibe, Eishi, Hitoshi Taniguchi, Y. Yahagi, Kenichi Shimbo, & Tadanobu Toba. (2010). Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule. IEEE Transactions on Electron Devices. 57(7). 1527–1538. 376 indexed citations breakdown →
3.
Nakamura, Takashi, et al.. (2008). Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices. WORLD SCIENTIFIC eBooks. 57 indexed citations
4.
Nakamura, Takashi, et al.. (2008). Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices. World Scientific Publishing Co. Pte. Ltd. eBooks. 4 indexed citations
5.
Baba, Mamoru, H. Okamura, Masayuki Hagiwara, et al.. (2007). Installation and application of an intense 7Li(p,n) Neutron source for 20-90 MeV region. Radiation Protection Dosimetry. 126(1-4). 13–17. 16 indexed citations
6.
Yahagi, Y., et al.. (2007). A Novel Feature of Neutron-Induced Multi-Cell Upsets in 130 and 180 nm SRAMs. IEEE Transactions on Nuclear Science. 54(4). 1030–1036. 23 indexed citations
7.
Chung, S. U., et al.. (2006). Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling. IEICE technical report. Speech. 106(425). 103–108. 37 indexed citations
8.
9.
10.
Yahagi, Y., Eishi Ibe, S. Yamamoto, et al.. (2005). Versatility of SEU function and its derivation from the irradiation tests with well-defined white neutron beams. IEEE Transactions on Nuclear Science. 52(5). 1562–1567. 12 indexed citations
11.
Ibe, Eishi, et al.. (2005). Single Event Effects as a Reliability Issue of IT Infrastructure. 1. 555–560. 3 indexed citations
12.
Ibe, Eishi, et al.. (2004). Single Event Effects of Semiconductor Devices at the Ground (特集 シンポジウム「半導体シングルイベント事象の物理と応用」). 30(3). 263–281. 2 indexed citations
13.
Yahagi, Y., Eishi Ibe, Yasuyuki Takahashi, et al.. (2004). Threshold energy of neutron-induced single event upset as a critical factor. 669–670. 15 indexed citations
14.
15.
Inoue, Takashi, et al.. (2002). Precision rubbing supported by fine process analysis. Journal of the Society for Information Display. 10(4). 329–337. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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