Y. C. Chan

1.3k citations
57 papers · 1.1k · h-index 18

Impact in

Papers in

    • Electronic Packaging and Soldering Technologies 33
    • 3D IC and TSV technologies 24
    • Thin-Film Transistor Technologies 7
    • Electrowetting and Microfluidic Technologies 6
    • Intermetallics and Advanced Alloy Properties 12
    • Advanced Welding Techniques Analysis 8

Y. C. Chan

57 papers receiving 1.1k citations

Peers

Y. C. Chan
Comparison fields: 5 of 46
  • General Materials Science 60
  • Mechanical Engineering 692
  • Electrical and Electronic Engineering 1.1k
  • Electronic, Optical and Magnetic Materials 99
  • Aerospace Engineering 99
Replace Agata Skwarek with:
Agata Skwarek Poland
Vivek Chidambaram Singapore
Nan Jiang China
K. Sakamoto Japan
Hsiang‐Yao Hsiao Taiwan
Kil-Won Moon United States
L.E. Felton United States
Guang Chen China
A.E. Hammad Egypt
Omid Mokhtari Japan
Y. C. Chan relative to Agata Skwarek Poland Agata Skwarek's profile →
Citations per field
00.5×1.5×2.1×
Agata Skwarek · 1×
Citations per year

Countries citing papers authored by Y. C. Chan

Since Specialization
Citations

This map shows the geographic impact of Y. C. Chan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. C. Chan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. C. Chan more than expected).

Fields of papers citing papers by Y. C. Chan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y. C. Chan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. C. Chan. The network helps show where Y. C. Chan may publish in the future.

Co-authors

The 25 scholars most cited alongside Y. C. Chan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Y. C. Chan Line = papers co-authored together Y. C. Chan links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 57 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2009104
2 2011102
3 2002102
4 201076
5 200657
6 200357
7 199753
8 200350
9 200947
10 200540
11 200030
12 200029
13 200027
14 201625
15 200923
16 200422
17 201418
18 200818
19 200717
20 201616

About Y. C. Chan

Y. C. Chan is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering, Biomedical Engineering, Electronic, Optical and Magnetic Materials and Mechanics of Materials, having authored 57 papers that have together received 1.1k indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (33 papers), 3D IC and TSV technologies (24 papers), Intermetallics and Advanced Alloy Properties (12 papers), Advanced Welding Techniques Analysis (8 papers), Copper Interconnects and Reliability (7 papers), Thin-Film Transistor Technologies (7 papers), Electrowetting and Microfluidic Technologies (6 papers) and Silicon Nanostructures and Photoluminescence (5 papers). The work is most often cited by research in General Materials Science (60 citations), Mechanical Engineering (692 citations), Electrical and Electronic Engineering (1.1k citations), Electronic, Optical and Magnetic Materials (99 citations) and Aerospace Engineering (99 citations). Y. C. Chan has collaborated with scholars based in Hong Kong, Taiwan and United Kingdom. Frequent co-authors include Ahmed Sharif, M.O. Alam, K.C. Hung, K.C. Yung, Asit Kumar Gain, Xin Gu, Jun Shen, J.K.L. Lai, Mobinul Islam and Rashed Adnan Islam. Their work appears in journals such as Journal of Alloys and Compounds, Journal of Materials Science Materials in Electronics, Journal of Electronic Materials, Journal of Electronic Packaging and Microelectronics Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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