L.E. Felton

901 citations
22 papers · 779 indexed · h-index 11
Topics
Electronic Packaging and Soldering Technologies (17 papers)3D IC and TSV technologies (9 papers)Copper Interconnects and Reliability (5 papers)
Partner nations
United StatesGermany

In The Last Decade

L.E. Felton

22 papers receiving 743 citations

Peers

L.E. Felton
Comparison fields: 5 of 58
  • Electrical and Electronic Engineering 674
  • Mechanical Engineering 452
  • Aerospace Engineering 122
  • Materials Chemistry 87
  • General Materials Science 69
Replace Y. C. Chan with:
Y. C. Chan Hong Kong
Shenghao Yang Taiwan
A. Zribi United States
G. Matijasevic United States
Abhijit Kar India
I. V. Plotnikov Russia
Vemal Raja Manikam Malaysia
Kazunari Maki Japan
M. S. Yeh Taiwan
А. И. Дикусар Moldova
L.E. Felton relative to Y. C. Chan Hong Kong Y. C. Chan's profile →
Citations per field
00.5×1.5×
Y. C. Chan · 1×
Citations per year

Countries citing papers authored by L.E. Felton

Since Specialization
Citations

This map shows the geographic impact of L.E. Felton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L.E. Felton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L.E. Felton more than expected).

Fields of papers citing papers by L.E. Felton

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L.E. Felton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L.E. Felton. The network helps show where L.E. Felton may publish in the future.

Co-authorship network of co-authors of L.E. Felton

This figure shows the co-authorship network connecting the top 25 collaborators of L.E. Felton. A scholar is included among the top collaborators of L.E. Felton based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with L.E. Felton. L.E. Felton is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 11
2 3
3 20
4 12
5 4
6 4
7 58
8 137
9 247
10 111
11 69
12 30
13 8
14 1
15 6
16 5
17 9
18 24
19 2
20 2

About L.E. Felton

L.E. Felton is a scholar working on General Materials Science, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 22 papers that have together received 779 indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (17 papers), 3D IC and TSV technologies (9 papers) and Copper Interconnects and Reliability (5 papers). The work is most often cited by research in General Materials Science (69 citations), Mechanical Engineering (452 citations) and Electrical and Electronic Engineering (674 citations). L.E. Felton has collaborated with scholars based in United States and Germany. Frequent co-authors include Wenge Yang, Robert W. Messler, D. B. Knorr, J.A. Schwarz, P. J. Ficalora, Daeyong Lee, Michael A. Zimmerman, Rafael Navarro, L. F. Coffin and Krishna Rajan. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and International Journal of Pharmaceutics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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