V. Türck
- Acoustics and Ultrasonics top 2%
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- Semiconductor Quantum Structures and Devices 22
- Quantum and electron transport phenomena 5
- Surface and Thin Film Phenomena 3
- Condensed Matter Physics top 10%
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- Semiconductor Lasers and Optical Devices 7
- Advanced Semiconductor Detectors and Materials 4
- Semiconductor materials and devices 3
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- Quantum Dots Synthesis And Properties 13
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- Nanowire Synthesis and Applications 4
V. Türck
28 papers receiving 782 citations
Peers
Comparison fields: 5 of 40
- Acoustics and Ultrasonics 99
- Atomic and Molecular Physics, and Optics 594
- Condensed Matter Physics 111
- Electrical and Electronic Engineering 477
- Materials Chemistry 327
Countries citing papers authored by V. Türck
This map shows the geographic impact of V. Türck's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Türck with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Türck more than expected).
Fields of papers citing papers by V. Türck
This network shows the impact of papers produced by V. Türck. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Türck. The network helps show where V. Türck may publish in the future.
Co-authorship network
The 25 scholars most cited alongside V. Türck, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2006 | 97 | |
| 2 | 2004 | 32 | |
| 3 | 2003 | 17 | |
| 4 | 2002 | 0 | |
| 5 | 2002 | 4 | |
| 6 | 2002 | 1 | |
| 7 | 2001 | 21 | |
| 8 | 2000 | 12 | |
| 9 | 2000 | 176 | |
| 10 | 1999 | 13 | |
| 11 | 1999 | 16 | |
| 12 | 1998 | 1 | |
| 13 | 1998 | 2 | |
| 14 | 1998 | 12 | |
| 15 | 1997 | 7 | |
| 16 | 1997 | 8 | |
| 17 | 1996 | 54 | |
| 18 | 1996 | 22 | |
| 19 | 1996 | 20 | |
| 20 | 1995 | 10 |
About V. Türck
V. Türck is a scholar working on Acoustics and Ultrasonics, Atomic and Molecular Physics, and Optics, Materials Chemistry, Electrical and Electronic Engineering and Surfaces, Coatings and Films, having authored 29 papers that have together received 798 indexed citations. Recurring topics across this work include Semiconductor Quantum Structures and Devices (22 papers), Quantum Dots Synthesis And Properties (13 papers), Semiconductor Lasers and Optical Devices (7 papers), Quantum and electron transport phenomena (5 papers), Nanowire Synthesis and Applications (4 papers), Advanced Semiconductor Detectors and Materials (4 papers), Surface and Thin Film Phenomena (3 papers) and Semiconductor materials and devices (3 papers). The work is most often cited by research in Acoustics and Ultrasonics (99 citations), Atomic and Molecular Physics, and Optics (594 citations), Condensed Matter Physics (111 citations), Electrical and Electronic Engineering (477 citations) and Materials Chemistry (327 citations). V. Türck has collaborated with scholars based in Germany, Italy and Russia. Frequent co-authors include D. Bimberg, Udo W. Pohl, Diederik S. Wiersma, R. Heitz, O. Stier, Sven Rodt, R. Engelhardt, Renato Torre, Sushil Mujumdar and R. Steingrüber. Their work appears in journals such as Applied Physics Letters, Journal of Crystal Growth, Physical review. B, Condensed matter, Journal of Quantitative Spectroscopy and Radiative Transfer and Journal of Electronic Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.