Uwe Mühle

963 total citations
47 papers, 768 citations indexed

About

Uwe Mühle is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, Uwe Mühle has authored 47 papers receiving a total of 768 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 16 papers in Materials Chemistry and 13 papers in Surfaces, Coatings and Films. Recurrent topics in Uwe Mühle's work include Semiconductor materials and devices (16 papers), Electron and X-Ray Spectroscopy Techniques (13 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). Uwe Mühle is often cited by papers focused on Semiconductor materials and devices (16 papers), Electron and X-Ray Spectroscopy Techniques (13 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). Uwe Mühle collaborates with scholars based in Germany, United States and Austria. Uwe Mühle's co-authors include David Rafaja, Bernd Kieback, Markus Löffler, Ehrenfried Zschech, M. Kathrein, W. Weber, Ulrich Martin, A. Michaelis, Mathias Herrmann and Björn Matthey and has published in prestigious journals such as ACS Nano, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

Uwe Mühle

45 papers receiving 746 citations

Peers

Countries citing papers authored by Uwe Mühle

Since Specialization

Citations

This map shows the geographic impact of Uwe Mühle's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Uwe Mühle with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Uwe Mühle more than expected).

Fields of papers citing papers by Uwe Mühle

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Uwe Mühle. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Uwe Mühle. The network helps show where Uwe Mühle may publish in the future.

Co-authorship network of co-authors of Uwe Mühle

This figure shows the co-authorship network connecting the top 25 collaborators of Uwe Mühle. A scholar is included among the top collaborators of Uwe Mühle based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Uwe Mühle. Uwe Mühle is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	The decomposition process in high-purity Al-1.7 at.% Cu alloys with trace elements: preservation of quenched-in vacancies by In, Sn and Pb influencing the $$\theta \, '$$ formation 2021 ·Journal of Materials Science ·Torsten E.M. Staab, (unknown), Uwe Mühle, Mohamed Elsayed, (unknown), Thomas Schubert, (unknown), R. Krause‐Rehberg, Bernd Kieback	8
2	Formation and crystallographic orientation of NiSi2–Si interfaces 2020 ·Journal of Applied Physics ·Florian Fuchs, (unknown), (unknown), Darius Pohl, Jörg Schuster, W. Weber, Uwe Mühle, Markus Löffler, Yordan M. Georgiev, Artur Erbe, Sibylle Gemming	11
3	Precipitation hardening of high entropy alloy CoCrFeMnNi containing titanium 2020 ·Journal of Alloys and Compounds ·(unknown), Uwe Mühle, Uwe Gaitzsch, (unknown), Thomas Weißgärber, Bernd Kieback	33
4	Reference-free grazing incidence x-ray fluorescence and reflectometry as a methodology for independent validation of x-ray reflectometry on ultrathin layer stacks and a depth-dependent characterization 2019 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·Philipp Hönicke, Blanka Detlefs, Emmanuel Nolot, Yves Kayser, Uwe Mühle, Beatrix Pollakowski, Burkhard Beckhoff	27
5	Optimization of the FIB Preparation on Polycrystalline Al Materials through the Orientation Determination by EBSD 2019 ·Practical Metallography ·Uwe Mühle, Markus Löffler, Thomas Schubert, Torsten E.M. Staab, R. Krause‐Rehberg, Bernd Kieback	1
6	The effect of Fe as constituent in Ni-base alloys on the oxygen evolution reaction in alkaline solutions at high current densities 2019 ·International Journal of Hydrogen Energy ·T. Rauscher, Christian Immanuel Bernäcker, Uwe Mühle, Bernd Kieback, Lars Röntzsch	16
7	Towards Reconfigurable Electronics: Silicidation of Top-Down Fabricated Silicon Nanowires 2019 ·Applied Sciences ·Muhammad Bilal Khan, (unknown), Jochen Kerbusch, Florian Fuchs, Markus Löffler, (unknown), Uwe Mühle, W. Weber, Sibylle Gemming, Jörg Schuster, Artur Erbe, Yordan M. Georgiev	19
8	Nanocrystalline non-equilibrium alloys of molybdenum with sodium 2018 ·Journal of Materials Science ·B. Bergk, Uwe Mühle, Bernd Kieback	3
9	Enabling Energy Efficiency and Polarity Control in Germanium Nanowire Transistors by Individually Gated Nanojunctions 2017 ·ACS Nano ·Jens Trommer, André Heinzig, Uwe Mühle, Markus Löffler, (unknown), Paul M. Jordan, (unknown), Tim Baldauf, Marion Geidel, B. Adolphi, Ehrenfried Zschech, Thomas Mikolajick, W. Weber	88
10	Nanomaterials: certain aspects of application, risk assessment and risk communication 2017 ·Archives of Toxicology ·Peter Laux, Jutta Tentschert, Christian Riebeling, Albert Braeuning, Otto Creutzenberg, (unknown), Valérie Fessard, Karl‐Heinz Haas, Andrea Haase, Kerstin Hund‐Rinke, Norbert Jakubowski, Peter Kearns, Alfonso Lampen, Hubert Rauscher, Reinhilde Schoonjans, Ángela Störmer, Axel Thielmann, Uwe Mühle, Andreas Luch	103
11	In-Situ Stretching Patterned Graphene Nanoribbons in the Transmission Electron Microscope 2017 ·Scientific Reports ·Zhongquan Liao, Leonardo Medrano Sandonas, Tao Zhang, Martin Gall, Arezoo Dianat, Rafael Gutiérrez, Uwe Mühle, Jürgen Gluch, Rainer Jordan, Gianaurelio Cuniberti, Ehrenfried Zschech	29
12	Non-equilibrium solid solution of molybdenum and sodium: Atomic scale experimental and first principles studies 2017 ·Acta Materialia ·B. Bergk, Uwe Mühle, Ivan Povstugar, Nikola Koutná, David Holec, Helmut Clemens, Bernd Kieback	6
13	<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices 2015 ·Journal of Visualized Experiments ·Zhongquan Liao, Martin Gall, Kong Boon Yeap, (unknown), (unknown), Uwe Mühle, Jürgen Gluch, (unknown), Oliver Aubel, (unknown), Meike Hauschildt, Ehrenfried Zschech	1
14	TEM-Präparation in drei Raumrichtungen zur Defektanalyse 2009 ·Practical Metallography ·(unknown), (unknown), Uwe Mühle, (unknown)	1
15	Focused Ion Beam (FIB)-basierte Zielpräparation an Transistoren der 70 nm-Generation zur Elektronenholographie 2009 ·Practical Metallography ·Uwe Mühle, (unknown), (unknown)	2
16	Präparation einer TEM-Probe aus einem metallographischen Schliff 2006 ·Practical Metallography ·Uwe Mühle, Sören Jansen, (unknown), D. Breuer	4
17	Off-axis Electron Holography for 2D Dopant Profiling in p- and n-Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) 2003 ·Microscopy and Microanalysis ·K. Vogel, (unknown), Hannes Lichte, H. Engelmann, Uwe Mühle, Bert Freitag	2
18	Microstructure and modeling of the high temperature deformation behavior of TBC-coated superalloys 2001 ·Materials Science and Engineering A ·Ulrich Martin, (unknown), Uwe Mühle, H. Oettel	2
19	Modulares Präparationskonzept für die TEM-Zielpräparation inhomogener Werkstoffe / A Modular Programme for the Preparation of Innomogeneous Materials for Examination in the Transmission Electron Microscope 1996 ·Practical Metallography ·V. Klemm, Ulrich Martin, Uwe Mühle, (unknown), (unknown)	4
20	Zur Ermittlung der chemischen Zusammensetzung von Ausscheidungen im analytischen Transmissionselektronenmikroskop (TEM) / Determining the Chemical Composition of Precipitates in the Analytical Transmission Electron Microscope 1995 ·Practical Metallography ·V. Klemm, Ulrich Martin, Uwe Mühle, (unknown)	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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