Steven M. Hues

435 total citations
28 papers, 321 citations indexed

About

Steven M. Hues is a scholar working on Computational Mechanics, Electrical and Electronic Engineering and Materials Chemistry. According to data from OpenAlex, Steven M. Hues has authored 28 papers receiving a total of 321 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Computational Mechanics, 10 papers in Electrical and Electronic Engineering and 10 papers in Materials Chemistry. Recurrent topics in Steven M. Hues's work include Ion-surface interactions and analysis (12 papers), Metal and Thin Film Mechanics (6 papers) and Semiconductor materials and devices (6 papers). Steven M. Hues is often cited by papers focused on Ion-surface interactions and analysis (12 papers), Metal and Thin Film Mechanics (6 papers) and Semiconductor materials and devices (6 papers). Steven M. Hues collaborates with scholars based in United States and Germany. Steven M. Hues's co-authors include Richard J. Colton, Greg Gillen, Ernst Meyer, H.‐J. Güntherodt, Jeffrey R. Wyatt, Robert L. Mowery, Randall W. Nelson, R. Bhadra, Eric E. Fullerton and Iván K. Schuller and has published in prestigious journals such as Physical review. B, Condensed matter, Journal of Applied Physics and Chemistry of Materials.

In The Last Decade

Steven M. Hues

27 papers receiving 295 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Steven M. Hues United States 10 147 114 106 90 78 28 321
I. Cravetchi Canada 9 128 0.9× 140 1.2× 71 0.7× 110 1.2× 55 0.7× 13 336
Ona Balachninaitė Lithuania 10 157 1.1× 166 1.5× 108 1.0× 55 0.6× 59 0.8× 34 333
В. Е. Рогалин Russia 9 142 1.0× 205 1.8× 116 1.1× 54 0.6× 112 1.4× 83 374
P. Chi United States 9 94 0.6× 280 2.5× 248 2.3× 42 0.5× 157 2.0× 22 398
Ο. Ganschow Germany 11 57 0.4× 175 1.5× 215 2.0× 44 0.5× 123 1.6× 19 364
Haiying Song China 11 107 0.7× 86 0.8× 47 0.4× 47 0.5× 128 1.6× 55 328
James W. McCamy United States 12 138 0.9× 319 2.8× 65 0.6× 48 0.5× 316 4.1× 26 511
William L. Harrington United States 10 69 0.5× 288 2.5× 263 2.5× 58 0.6× 149 1.9× 12 463
В. И. Орлов Russia 13 113 0.8× 214 1.9× 31 0.3× 75 0.8× 171 2.2× 71 483
E. J. H. Collart United Kingdom 15 172 1.2× 566 5.0× 181 1.7× 69 0.8× 161 2.1× 64 652

Countries citing papers authored by Steven M. Hues

Since Specialization
Citations

This map shows the geographic impact of Steven M. Hues's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Steven M. Hues with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Steven M. Hues more than expected).

Fields of papers citing papers by Steven M. Hues

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Steven M. Hues. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Steven M. Hues. The network helps show where Steven M. Hues may publish in the future.

Co-authorship network of co-authors of Steven M. Hues

This figure shows the co-authorship network connecting the top 25 collaborators of Steven M. Hues. A scholar is included among the top collaborators of Steven M. Hues based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Steven M. Hues. Steven M. Hues is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Efaw, Corey M., Michael O. Thompson, Darrell G. Schlom, et al.. (2025). Achieving 0.05 Ω-mm contact resistance in non-alloyed Ti/Au ohmics to β-Ga2O3 by removing surface carbon. APL Materials. 13(6). 61122–61122. 1 indexed citations
2.
Letourneau, Steven, Matthew Lawson, Devika Choudhury, et al.. (2023). Atomic Layer Processing of MoS2. 1–3. 1 indexed citations
3.
Mane, Anil U., Devika Choudhury, Steven Letourneau, et al.. (2023). Thermal Atomic Layer Etching of MoS2 Using MoF6 and H2O. Chemistry of Materials. 35(3). 927–936. 9 indexed citations
4.
Letourneau, Steven, Matthew Lawson, Anil U. Mane, et al.. (2022). Nucleation and growth of molybdenum disulfide grown by thermal atomic layer deposition on metal oxides. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 40(6). 4 indexed citations
5.
Szakal, Christopher, Steven M. Hues, J. Bennett, & Greg Gillen. (2009). Effect of Cluster Ion Analysis Fluence on Interface Quality in SIMS Molecular Depth Profiling. The Journal of Physical Chemistry C. 114(12). 5338–5343. 5 indexed citations
6.
Hues, Steven M., et al.. (1994). Measurement of nanomechanical properties of metals using the atomic force microscope. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(3). 2211–2214. 45 indexed citations
7.
Hues, Steven M., et al.. (1994). Effect of PZT and PMN actuator hysteresis and creep on nanoindentation measurements using force microscopy. Review of Scientific Instruments. 65(5). 1561–1565. 51 indexed citations
8.
Hues, Steven M., Richard J. Colton, Ernst Meyer, & H.‐J. Güntherodt. (1993). Scanning Probe Microscopy of Thin Films. MRS Bulletin. 18(1). 41–49. 43 indexed citations
9.
Schreifels, John A., R.E. Morris, Noel H. Turner, Robert L. Mowery, & Steven M. Hues. (1991). Adsorption of a metal deactivator additive onto metal surfaces. Energy & Fuels. 5(2). 263–268. 11 indexed citations
10.
Kim, C., S. B. Qadri, A. C. Ehrlich, et al.. (1991). Structural, elastic and transport properties of Ag/Al multilayer thin films prepared by ion-beam sputtering. Surface and Coatings Technology. 49(1-3). 143–149. 6 indexed citations
11.
Hues, Steven M., et al.. (1991). Structure and elastic properties of Al-doped Mo/Ni superlattices. Physical review. B, Condensed matter. 44(19). 10848–10856. 6 indexed citations
12.
13.
Hues, Steven M., Richard J. Colton, & Jeffrey R. Wyatt. (1989). A direct current plasma discharge cleaning method to eliminate background signals in secondary ion mass spectrometry. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 7(5). 3126–3128. 3 indexed citations
14.
Hues, Steven M., Richard J. Colton, Robert L. Mowery, K. J. McGrath, & Jeffrey R. Wyatt. (1989). Determination of hydrogen in perfluorinated polyalkylethers using time-of-flight secondary ion mass spectrometry, infrared spectroscopy, and nuclear magnetic resonance spectrometry. Applied Surface Science. 35(4). 507–519. 13 indexed citations
15.
Gillen, Greg, et al.. (1989). Secondary ion yield matrix effects in SIMS depth profiles of Si/Ge multilayers. Surface and Interface Analysis. 14(11). 771–780. 14 indexed citations
16.
Hues, Steven M., R. Bhadra, M. Grimsditch, Eric E. Fullerton, & Iván K. Schuller. (1989). Effect of high-energy ion irradiation on the elastic moduli of Ag/Co superlattices. Physical review. B, Condensed matter. 39(17). 12966–12968. 15 indexed citations
17.
Song, S. N., et al.. (1989). Structural studies of artificial Si/Nb superlattice films. Journal of Applied Physics. 66(11). 5360–5366. 8 indexed citations
18.
Hues, Steven M., Richard J. Colton, Jeffrey R. Wyatt, & J. Schultz. (1989). A pulsed alkali-ion gun for time-of-flight secondary ion mass spectrometry. Review of Scientific Instruments. 60(7). 1239–1244. 3 indexed citations
19.
Hues, Steven M., et al.. (1986). Oxygen-induced segregation effects in sputter depth-profiling. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 15(1-6). 206–209. 29 indexed citations
20.
Hues, Steven M., et al.. (1986). A variable temperature sample stage for the Cameca IMS 3F secondary ion microanalyzer. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 4(4). 1942–1943. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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