Ο. Ganschow

459 total citations
19 papers, 364 citations indexed

About

Ο. Ganschow is a scholar working on Computational Mechanics, Electrical and Electronic Engineering and Analytical Chemistry. According to data from OpenAlex, Ο. Ganschow has authored 19 papers receiving a total of 364 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Computational Mechanics, 8 papers in Electrical and Electronic Engineering and 6 papers in Analytical Chemistry. Recurrent topics in Ο. Ganschow's work include Ion-surface interactions and analysis (15 papers), Analytical chemistry methods development (6 papers) and Electron and X-Ray Spectroscopy Techniques (5 papers). Ο. Ganschow is often cited by papers focused on Ion-surface interactions and analysis (15 papers), Analytical chemistry methods development (6 papers) and Electron and X-Ray Spectroscopy Techniques (5 papers). Ο. Ganschow collaborates with scholars based in Germany. Ο. Ganschow's co-authors include A. Benninghoven, L. Wiedmann, U. Kaiser, R. Jede, D. Lipinsky, Guido Dünnebier, Karin Seifert, Naili Wang, P. Steffens and P. Sander and has published in prestigious journals such as Applied Physics Letters, Applied Surface Science and Surface Science.

In The Last Decade

Ο. Ganschow

19 papers receiving 333 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Ο. Ganschow Germany 11 215 175 123 101 58 19 364
William L. Harrington United States 10 263 1.2× 288 1.6× 149 1.2× 73 0.7× 46 0.8× 12 463
S.F. Belykh Russia 12 324 1.5× 155 0.9× 186 1.5× 55 0.5× 47 0.8× 44 371
J.C. Banks United States 12 213 1.0× 181 1.0× 185 1.5× 78 0.8× 17 0.3× 31 437
N. Warmoltz United States 6 237 1.1× 481 2.7× 242 2.0× 68 0.7× 16 0.3× 14 636
G. A. Schwind United States 12 243 1.1× 397 2.3× 209 1.7× 99 1.0× 106 1.8× 28 587
A. E. Bell United States 13 263 1.2× 372 2.1× 217 1.8× 101 1.0× 120 2.1× 32 646
Steven M. Hues United States 10 106 0.5× 114 0.7× 78 0.6× 19 0.2× 38 0.7× 28 321
Hideo Sakairi Japan 11 144 0.7× 119 0.7× 191 1.6× 55 0.5× 15 0.3× 21 351
P. R. Malmberg United States 11 108 0.5× 152 0.9× 130 1.1× 17 0.2× 35 0.6× 23 322
G. W. Blackmore United Kingdom 16 113 0.5× 577 3.3× 287 2.3× 42 0.4× 15 0.3× 49 677

Countries citing papers authored by Ο. Ganschow

Since Specialization
Citations

This map shows the geographic impact of Ο. Ganschow's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ο. Ganschow with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ο. Ganschow more than expected).

Fields of papers citing papers by Ο. Ganschow

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ο. Ganschow. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ο. Ganschow. The network helps show where Ο. Ganschow may publish in the future.

Co-authorship network of co-authors of Ο. Ganschow

This figure shows the co-authorship network connecting the top 25 collaborators of Ο. Ganschow. A scholar is included among the top collaborators of Ο. Ganschow based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ο. Ganschow. Ο. Ganschow is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

19 of 19 papers shown
1.
Ganschow, Ο., R. Jede, & U. Kaiser. (1990). Progress in solids analysis by sputtered neutral mass spectrometry. Vacuum. 41(7-9). 1654–1660. 4 indexed citations
2.
Ryssel, H., et al.. (1989). Ion-beam mixed MoSi2 layers: The dependence of composition on mixing temperature. Applied Surface Science. 38(1-4). 235–242. 10 indexed citations
3.
Jede, R., et al.. (1988). Quantitative depth profile and bulk analysis with high dynamic range by electron gas sputtered neutral mass spectrometry. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 6(4). 2271–2279. 75 indexed citations
4.
5.
Lipinsky, D., et al.. (1985). High sensitivity quasisimultaneous secondary neutral, secondary ion, and residual gas mass spectrometry by a new electron impact postionizer. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 3(5). 2035–2036. 5 indexed citations
6.
Lipinsky, D., R. Jede, Ο. Ganschow, & A. Benninghoven. (1985). Performance of a new ion optics for quasisimultaneous secondary ion, secondary neutral, and residual gas mass spectrometry. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 3(5). 2007–2017. 47 indexed citations
7.
Jede, R., Eberhard Manske, Ο. Ganschow, & A. Benninghoven. (1985). Poisoning by iron of silver catalysts for partial oxidation of methanol. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 3(4). 1883–1884. 2 indexed citations
8.
Sander, P., U. Kaiser, R. Jede, et al.. (1985). Secondary ion and sputtered neutral formation from oxygen loaded Si(100). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 3(5). 1946–1954. 17 indexed citations
9.
Kaiser, U., P. Sander, Ο. Ganschow, & A. Benninghoven. (1984). Characterization of native and heterooxide layers on compound semiconductors by combined use of surface analysis methods. Analytical and Bioanalytical Chemistry. 319(6-7). 877–882. 4 indexed citations
10.
Kaiser, U., Ο. Ganschow, L. Wiedmann, & A. Benninghoven. (1983). Thermal stability of oxide films on Cd0.2  Hg0.8Te: A combined SIMS, AES, and XPS study. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 1(2). 657–661. 10 indexed citations
11.
Wang, Naili, U. Kaiser, Ο. Ganschow, L. Wiedmann, & A. Benninghoven. (1983). Oxidation of cobalt at room temperature, studied by combined static SIMS, static AES, XPS and work function investigations. Surface Science. 124(1). 51–67. 35 indexed citations
12.
13.
Ganschow, Ο. & P. Steffens. (1982). A new x-ray generator for XPS applications. Journal of Vacuum Science and Technology. 21(3). 845–852. 3 indexed citations
14.
Ganschow, Ο., et al.. (1981). Quasisimultaneous SIMS, AES, XPS, and TDMS study of preferential sputtering, diffusion, and mercury evaporation in CdxHg1−xTe. Surface Science. 104(2-3). 365–383. 58 indexed citations
15.
Ganschow, Ο., et al.. (1979). Combined SIMS, AES, and XPS investigations of tantalum oxide layers. Applied Physics A. 18(2). 113–117. 21 indexed citations
16.
Benninghoven, A., Ο. Ganschow, P. Steffens, & L. Wiedmann. (1978). Static aes-the adequate mode of aes for surface reaction and submonolayer adsorption studies. Journal of Electron Spectroscopy and Related Phenomena. 14(1). 19–25. 15 indexed citations
17.
Benninghoven, A., Ο. Ganschow, & L. Wiedmann. (1978). Quasisimultaneous SIMS, AES, and XPS investigations of the oxidation of Mo, Ti, and Co in the monolayer range. Journal of Vacuum Science and Technology. 15(2). 506–509. 21 indexed citations
18.
Wiedmann, L., Ο. Ganschow, & A. Benninghoven. (1978). Contamination of clean metal surfaces associated with electron bombardment in conventional AES analysis. Journal of Electron Spectroscopy and Related Phenomena. 13(3). 243–246. 5 indexed citations
19.
Benninghoven, A., et al.. (1977). Quasisimultaneous SIMS-AES-XPS investigation of the oxidation of Ti in the monolayer range. Applied Physics Letters. 31(5). 341–343. 19 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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