Shih‐Nan Hsiao

862 citations
73 papers · 623 indexed · h-index 13

Shih‐Nan Hsiao

69 papers receiving 601 citations

Peers

Shih‐Nan Hsiao
Comparison fields: 5 of 38
  • Electronic, Optical and Magnetic Materials 338
  • Atomic and Molecular Physics, and Optics 344
  • General Materials Science 16
  • Electrical and Electronic Engineering 234
  • Mechanics of Materials 91
Replace O. Kohmoto with:
O. Kohmoto Japan
A.R. Chezan Netherlands
Miki Moriyama Japan
Sven Hamann Germany
Masakatsu Senda Japan
A.E.M. De Veirman Netherlands
S. Yamanaka Japan
Krzysztof Mars Poland
K. Maex Belgium
Cristina Bormio-Nunes Brazil
Shih‐Nan Hsiao relative to O. Kohmoto Japan O. Kohmoto's profile →
Citations per field
00.5×10×17.2×
O. Kohmoto · 1×
Citations per year

Countries citing papers authored by Shih‐Nan Hsiao

Since Specialization
Citations

This map shows the geographic impact of Shih‐Nan Hsiao's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shih‐Nan Hsiao with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shih‐Nan Hsiao more than expected).

Fields of papers citing papers by Shih‐Nan Hsiao

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Shih‐Nan Hsiao. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shih‐Nan Hsiao. The network helps show where Shih‐Nan Hsiao may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Shih‐Nan Hsiao, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Shih‐Nan Hsiao Line = papers co-authored together Shih‐Nan Hsiao links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20250
2 20252
3 20250
4 202415
5 20243
6 20241
7 20241
8 20245
9 20239
10 202316
11 202211
12 20220
13 20213
14 20157
15 20143
16 20126
17 201211
18 20122
19 20118
20 20076

About Shih‐Nan Hsiao

Shih‐Nan Hsiao is a scholar working on Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics and General Materials Science, having authored 73 papers that have together received 623 indexed citations. Recurring topics across this work include Magnetic properties of thin films (44 papers), Magnetic Properties and Applications (31 papers), Semiconductor materials and devices (19 papers), Plasma Diagnostics and Applications (18 papers), Copper Interconnects and Reliability (17 papers), Magnetic Properties of Alloys (16 papers), Diamond and Carbon-based Materials Research (8 papers) and Metal and Thin Film Mechanics (8 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (338 citations), Atomic and Molecular Physics, and Optics (344 citations) and General Materials Science (16 citations). Shih‐Nan Hsiao has collaborated with scholars based in Taiwan, Japan and India. Frequent co-authors include F.T. Yuan, Masaru Hori, Makoto Sekine, Kenji Ishikawa, Takayoshi Tsutsumi, H. W. Chang, Nikolay Britun, T.S. Chin, Jen‐Hwa Hsu and Tsung‐Shune Chin. Their work appears in journals such as Journal of Applied Physics, IEEE Transactions on Magnetics, Applied Surface Science, Journal of Magnetism and Magnetic Materials and Vacuum.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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