S. Russo

538 total citations
28 papers, 337 citations indexed

About

S. Russo is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, S. Russo has authored 28 papers receiving a total of 337 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 5 papers in Mechanical Engineering and 5 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in S. Russo's work include Silicon Carbide Semiconductor Technologies (19 papers), Electronic Packaging and Soldering Technologies (10 papers) and Semiconductor materials and devices (8 papers). S. Russo is often cited by papers focused on Silicon Carbide Semiconductor Technologies (19 papers), Electronic Packaging and Soldering Technologies (10 papers) and Semiconductor materials and devices (8 papers). S. Russo collaborates with scholars based in Italy, Switzerland and Czechia. S. Russo's co-authors include S. De, A. Testa, R. Letor, T. Scimone, Salvatore Patanè, Andrea Irace, Giovanni Breglio, Giacomo Scelba, Michele Calabretta and P. Spirito and has published in prestigious journals such as The Astrophysical Journal, IEEE Transactions on Power Electronics and IEEE Transactions on Industry Applications.

In The Last Decade

S. Russo

28 papers receiving 329 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. Russo Italy 12 272 29 28 25 25 28 337
M.S. Towers United Kingdom 12 383 1.4× 21 0.7× 103 3.7× 8 0.3× 39 1.6× 42 432
Aaron D. Brovont United States 11 329 1.2× 20 0.7× 33 1.2× 6 0.2× 29 1.2× 32 343
Xun Gong China 9 423 1.6× 16 0.6× 46 1.6× 13 0.5× 21 0.8× 35 486
Yiou He United States 7 295 1.1× 20 0.7× 45 1.6× 39 1.6× 13 0.5× 10 343
Ivana Kovacevic-Badstuebner Switzerland 12 398 1.5× 6 0.2× 53 1.9× 15 0.6× 26 1.0× 55 423
Claudinor B. Nascimento Brazil 12 271 1.0× 58 2.0× 39 1.4× 5 0.2× 97 3.9× 51 365
Charalampos Papadopoulos Switzerland 10 310 1.1× 16 0.6× 23 0.8× 3 0.1× 8 0.3× 35 373
Boxue Hu United States 15 658 2.4× 20 0.7× 44 1.6× 46 1.8× 74 3.0× 57 688
Teruo Suzuki Japan 11 225 0.8× 5 0.2× 70 2.5× 11 0.4× 9 0.4× 47 335
Maxim Zyskin United Kingdom 7 157 0.6× 160 5.5× 37 1.3× 21 0.8× 11 0.4× 21 299

Countries citing papers authored by S. Russo

Since Specialization
Citations

This map shows the geographic impact of S. Russo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Russo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Russo more than expected).

Fields of papers citing papers by S. Russo

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Russo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Russo. The network helps show where S. Russo may publish in the future.

Co-authorship network of co-authors of S. Russo

This figure shows the co-authorship network connecting the top 25 collaborators of S. Russo. A scholar is included among the top collaborators of S. Russo based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Russo. S. Russo is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Russo, S., Gianfranco Piana, Luca Patruno, & Alberto Carpinteri. (2023). Preliminary Flutter Stability Assessment of the Double-Deck George Washington Bridge. Applied Sciences. 13(11). 6389–6389. 2 indexed citations
2.
Piccione, Giuseppe, Michele Calabretta, S. Russo, et al.. (2022). Multchip SiC-based compact module for automotive applications: A high speed thermal study. Microelectronics Reliability. 138. 114700–114700. 2 indexed citations
3.
Triolo, Claudia, Francesca Garescì, S. Russo, et al.. (2021). Study of the Thermomechanical Strain Induced by Current Pulses in SiC-Based Power MOSFET. IEEE Electron Device Letters. 42(7). 1089–1092. 8 indexed citations
4.
Sitta, Alessandro, S. Russo, Angelo Messina, et al.. (2020). An integrated approach to optimize solder joint reliability. 1–5. 5 indexed citations
5.
De, S., S. Foti, T. Scimone, et al.. (2019). Motor Overvoltage Mitigation on SiC MOSFET Drives Exploiting an Open-End Winding Configuration. IEEE Transactions on Power Electronics. 34(11). 11128–11138. 24 indexed citations
6.
Russo, S., et al.. (2019). Thermal Analysis Approach for Predicting Power Device Lifetime. IEEE Transactions on Device and Materials Reliability. 19(1). 159–163. 15 indexed citations
7.
8.
Sitta, Alessandro, et al.. (2018). Numerical approach to predict power device reliability. 1–5. 5 indexed citations
9.
De, S., S. Foti, T. Scimone, et al.. (2017). Over-voltage mitigation on SiC based motor drives through an open end winding configuration. 4332–4337. 15 indexed citations
10.
Garescì, Francesca, et al.. (2016). Reliability model application for power devices using mechanical strain real time mapping. 127–130. 4 indexed citations
11.
12.
13.
Roos, L., et al.. (2013). CABAC : A CCD Clocking and Biasing Chip for LSST Camera. HAL (Le Centre pour la Communication Scientifique Directe). 1 indexed citations
14.
Scandurra, Antonino, et al.. (2013). Molding Compounds Adhesion and Influence on Reliability of Plastic Packages for SiC-Based Power MOS Devices. IEEE Transactions on Components Packaging and Manufacturing Technology. 3(7). 1094–1106. 3 indexed citations
15.
Testa, A., S. De, Salvatore Patanè, et al.. (2010). Reliability of planar, Super-Junction and trench low voltage power MOSFETs. Microelectronics Reliability. 50(9-11). 1789–1795. 9 indexed citations
16.
Testa, A., S. De, Salvatore Patanè, et al.. (2010). Reliability assessment of low-voltage MOSFETs driving inductive loads. 1016–1021. 1 indexed citations
17.
Letor, R., et al.. (2008). Life time prediction and design for reliability of Smart Power devices for automotive exterior lighting. 1–5. 11 indexed citations
18.
Russo, S., Aldo Di Carlo, Wouter Ruythooren, Joff Derluyn, & Marianne Germain. (2006). Scaling effects in AlGaN/GaN HEMTs: Comparison between Monte Carlo simulations and experimental data. Journal of Computational Electronics. 5(2-3). 109–113. 2 indexed citations
19.
Berrilli, F., D. Del Moro, S. Russo, Giuseppe Consolini, & T. Straus. (2005). Spatial Clustering of Photospheric Structures. The Astrophysical Journal. 632(1). 677–683. 26 indexed citations
20.
Irace, Andrea, Giovanni Breglio, P. Spirito, R. Letor, & S. Russo. (2005). Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. Microelectronics Reliability. 45(9-11). 1706–1710. 23 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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