S. J. Murry

820 citations
24 papers · 622 indexed · h-index 12
Topics
Spectroscopy and Laser Applications (22 papers)Semiconductor Quantum Structures and Devices (11 papers)Advanced Semiconductor Detectors and Materials (10 papers)

In The Last Decade

S. J. Murry

24 papers receiving 607 citations

Peers

S. J. Murry
Comparison fields: 5 of 24
  • Electrical and Electronic Engineering 543
  • Spectroscopy 457
  • Atomic and Molecular Physics, and Optics 371
  • Atmospheric Science 92
  • Materials Chemistry 27
Replace D. Zhang with:
D. Zhang United States
John T. Pham United States
J. Devenson Lithuania
Sergey Suchalkin United States
E. E. Orlova Russia
Chih‐Hsiang Lin United States
Stefan Hugger Germany
A.Y. Cho United States
Kamil Pierściński Poland
Richard L. Tober United States
S. J. Murry relative to D. Zhang United States D. Zhang's profile →
Citations per field
00.5×3.5×
D. Zhang · 1×
Citations per year

Countries citing papers authored by S. J. Murry

Since Specialization
Citations

This map shows the geographic impact of S. J. Murry's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. J. Murry with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. J. Murry more than expected).

Fields of papers citing papers by S. J. Murry

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. J. Murry. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. J. Murry. The network helps show where S. J. Murry may publish in the future.

Co-authorship network of co-authors of S. J. Murry

This figure shows the co-authorship network connecting the top 25 collaborators of S. J. Murry. A scholar is included among the top collaborators of S. J. Murry based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. J. Murry. S. J. Murry is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 1
2 1
3 43
4 1
5 6
6 62
7 1
8 47
9 1
10 11
11 107
12 87
13 23
14 23
15 51
16 9
17 36
18 62
19 29
20 5

About S. J. Murry

S. J. Murry is a scholar working on Spectroscopy, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 24 papers that have together received 622 indexed citations. Recurring topics across this work include Spectroscopy and Laser Applications (22 papers), Semiconductor Quantum Structures and Devices (11 papers) and Advanced Semiconductor Detectors and Materials (10 papers). The work is most often cited by research in Spectroscopy (457 citations), Atomic and Molecular Physics, and Optics (371 citations) and Electrical and Electronic Engineering (543 citations). S. J. Murry has collaborated with scholars based in United States, Canada and Germany. Frequent co-authors include Rui Q. Yang, Chi‐Wei Lin, S. S. Pei, D. Zhang, S. S. Pei, J. R. Meyer, Chih‐Hsiang Lin, S. R. Kurtz, I. Vurgaftman and Christian Félix. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of Crystal Growth.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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