M. Ospelt

635 total citations
24 papers, 545 citations indexed

About

M. Ospelt is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, M. Ospelt has authored 24 papers receiving a total of 545 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Atomic and Molecular Physics, and Optics, 16 papers in Electrical and Electronic Engineering and 5 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in M. Ospelt's work include Semiconductor materials and interfaces (17 papers), Semiconductor materials and devices (11 papers) and Surface and Thin Film Phenomena (10 papers). M. Ospelt is often cited by papers focused on Semiconductor materials and interfaces (17 papers), Semiconductor materials and devices (11 papers) and Surface and Thin Film Phenomena (10 papers). M. Ospelt collaborates with scholars based in Switzerland, Germany and France. M. Ospelt's co-authors include H. von Känel, J. Henz, P. Wächter, E. Müller, L. Tapfer, H.‐U. Nissen, Kurt A. Mäder, A. Gruhle, Wolfgang Bacsa and Thomas Graf and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

M. Ospelt

24 papers receiving 527 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
M. Ospelt Switzerland	15	437	334	125	89	57	24	545
K. E. Strege United States	11	343 0.8×	358 1.1×	116 0.9×	50 0.6×	40 0.7×	18	508
A. Ruiz Spain	14	464 1.1×	383 1.1×	224 1.8×	95 1.1×	66 1.2×	47	610
Robert G. Long United States	10	476 1.1×	342 1.0×	118 0.9×	49 0.6×	41 0.7×	17	560
L. J. Chen Taiwan	13	257 0.6×	209 0.6×	86 0.7×	58 0.7×	86 1.5×	23	377
Yukinobu Shinoda Japan	14	304 0.7×	385 1.2×	157 1.3×	82 0.9×	25 0.4×	33	487
A. Leycuras France	18	345 0.8×	558 1.7×	182 1.5×	116 1.3×	90 1.6×	53	686
W.R. MacEwan United Kingdom	17	519 1.2×	396 1.2×	169 1.4×	46 0.5×	79 1.4×	46	658
C. Schwarz Switzerland	10	342 0.8×	156 0.5×	82 0.7×	91 1.0×	43 0.8×	15	401
R. Bierwolf Germany	7	325 0.7×	249 0.7×	170 1.4×	61 0.7×	17 0.3×	9	431
John E. Davey United States	15	305 0.7×	363 1.1×	182 1.5×	79 0.9×	52 0.9×	39	510

Countries citing papers authored by M. Ospelt

Since Specialization

Citations

This map shows the geographic impact of M. Ospelt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Ospelt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Ospelt more than expected).

Fields of papers citing papers by M. Ospelt

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Ospelt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Ospelt. The network helps show where M. Ospelt may publish in the future.

Co-authorship network of co-authors of M. Ospelt

This figure shows the co-authorship network connecting the top 25 collaborators of M. Ospelt. A scholar is included among the top collaborators of M. Ospelt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Ospelt. M. Ospelt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Känel, H. von, J. Henz, M. Ospelt, & A. Gruhle. (1991). The permeable base transistor. Physica Scripta. T35. 287–292. 6 indexed citations

Känel, H. von, E. Müller, H.‐U. Nissen, et al.. (1991). Silicon heteroepitaxy: interface structure and physical properties. Journal of Crystal Growth. 111(1-4). 889–896. 5 indexed citations

Ospelt, M., et al.. (1991). Determination of elastic properties of Si/Ge superlattices and Si1-xGex films from surface acoustic modes by Brillouin scattering. Applied Surface Science. 50(1-4). 303–307. 18 indexed citations

Müller, E., H.‐U. Nissen, Kurt A. Mäder, M. Ospelt, & H. von Känel. (1991). Occurrence of two ordered structures in Si–Ge systems. Philosophical Magazine Letters. 64(4). 183–189. 15 indexed citations

Bacsa, Wolfgang, et al.. (1990). <title>Interface structural characterization of strained-layer (001) SimGen superlattices by Raman spectroscopy</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1284. 195–206. 1 indexed citations

Känel, H. von, J. Henz, M. Ospelt, et al.. (1990). Epitaxy of metal silicides. Thin Solid Films. 184(1-2). 295–308. 45 indexed citations

Henz, J., et al.. (1990). Fabrication and electrical properties of ultrathin CoSi2/Si heterostructures. Surface Science. 228(1-3). 9–12. 10 indexed citations

Elmiger, M., J. Henz, H. von Känel, M. Ospelt, & P. Wächter. (1989). Characterization of crystal surfaces, thin films and superlattices by brillouin scattering from surface acoustic modes. Surface and Interface Analysis. 14(1-2). 18–22. 29 indexed citations

Müller, E., H.‐U. Nissen, M. Ospelt, & H. von Känel. (1989). Chemical ordering and boundary structure in strained-layer Si-Ge superlattices. Physical Review Letters. 63(17). 1819–1822. 63 indexed citations

10.

Bacsa, Wolfgang, M. Ospelt, J. Henz, H. von Känel, & P. Wächter. (1989). Confined phonons in strained short-period (001) Si/Ge superlattices. Thin Solid Films. 183(1-2). 65–70. 4 indexed citations

11.

Henz, J., M. Ospelt, & H. von Känel. (1989). Growth and characterization of metal/semiconductor superlattices. Surface Science. 211-212. 716–723. 14 indexed citations

12.

Duboz, J. Y., P. A. Badoz, E. Rosencher, et al.. (1988). Electrical transport properties in epitaxial codeposited CoSi2 layers on 〈111〉 Si. Applied Physics Letters. 53(9). 788–790. 36 indexed citations

13.

Ospelt, M., J. Henz, E. Kaldis, & P. Wächter. (1988). 2p-core level spectroscopy of La1.85Sr0.15CuO4, CuO and NaCuO2: Mixed valency in the superconductor. Physica C Superconductivity. 153-155. 159–160. 22 indexed citations

14.

Bacsa, Wolfgang, H. von Känel, Kurt A. Mäder, M. Ospelt, & P. Wächter. (1988). Inelastic light scattering from strained-layer superlattices. Superlattices and Microstructures. 4(6). 717–721. 9 indexed citations

15.

Ospelt, M., et al.. (1988). Schottky barriers of epitaxial NiSi2 on Si(111). Applied Physics Letters. 52(3). 227–229. 35 indexed citations

16.

Känel, H. von, J. Henz, M. Ospelt, & P. Wächter. (1988). Growth of high quality CoSi2/Si - superstructures on Si (111). Superlattices and Microstructures. 4(1). 27–31. 10 indexed citations

17.

Henz, J., H. von Känel, M. Ospelt, & P. Wächter. (1987). Growth of epitaxial ultrathin continuous CoSi2 layers on Si(111). Surface Science. 189-190. 1055–1061. 31 indexed citations

18.

Henz, J., M. Ospelt, & H. von Känel. (1987). On the growth of CoSi2 and CoSi2/Si heterostructures on Si(111). Solid State Communications. 63(6). 445–449. 39 indexed citations

19.

Känel, H. von, Thomas Graf, J. Henz, M. Ospelt, & P. Wächter. (1986). On the stability of thin epitaxial NiSi2 layers on Si (111). Superlattices and Microstructures. 2(4). 363–368. 14 indexed citations

20.

Zogg, H., Patrick Maier, & M. Ospelt. (1985). A note on the epitaxial relationships of the BaF2/Si(111) heterostructure. Thin Solid Films. 129(3-4). 329–333. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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