Riaz Naseer
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture top 2%
- Computer Networks and Communications top 10%
- Artificial Intelligence
- Safety, Risk, Reliability and Quality
- Co-authors
- Jeff DraperJeffrey DraperY. BoulghassoulSandeepan DasGuptaArthur F. WitulskiJ. N. DamoulakisL. W. Massengill
- Topics
- Radiation Effects in Electronics (9 papers)Semiconductor materials and devices (6 papers)VLSI and Analog Circuit Testing (5 papers)
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringComputer Networks and Communications
- Journals
- IEEE Transactions on Nuclear ScienceConference proceedings
- Partner nations
- United States
In The Last Decade
Riaz Naseer
9 papers receiving 411 citations
Peers
Comparison fields: 5 of 24
- Electrical and Electronic Engineering 416
- Hardware and Architecture 283
- Computer Networks and Communications 99
- Artificial Intelligence 25
- Safety, Risk, Reliability and Quality 11
Countries citing papers authored by Riaz Naseer
This map shows the geographic impact of Riaz Naseer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Riaz Naseer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Riaz Naseer more than expected).
Fields of papers citing papers by Riaz Naseer
This network shows the impact of papers produced by Riaz Naseer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Riaz Naseer. The network helps show where Riaz Naseer may publish in the future.
Co-authorship network of co-authors of Riaz Naseer
This figure shows the co-authorship network connecting the top 25 collaborators of Riaz Naseer. A scholar is included among the top collaborators of Riaz Naseer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Riaz Naseer. Riaz Naseer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 65 | |
| 2 | 98 | |
| 3 | SINGLE-EVENT EFFECTS CHARACTERIZATION AND SOFT ERROR MITIGATION IN 90nm COMMERCIAL-DENSITY SRAMs | 4 |
| 4 | 77 | |
| 5 | 97 | |
| 6 | 14 | |
| 7 | 24 | |
| 8 | 39 | |
| 9 | 26 |
About Riaz Naseer
Riaz Naseer is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Computer Networks and Communications, having authored 9 papers that have together received 444 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (9 papers), Semiconductor materials and devices (6 papers) and VLSI and Analog Circuit Testing (5 papers). The work is most often cited by research in Hardware and Architecture (283 citations), Electrical and Electronic Engineering (416 citations) and Computer Networks and Communications (99 citations). Riaz Naseer has collaborated with scholars based in United States. Frequent co-authors include Jeff Draper, Jeffrey Draper, Y. Boulghassoul, Sandeepan DasGupta, Arthur F. Witulski, J. N. Damoulakis and L. W. Massengill. Their work appears in journals such as IEEE Transactions on Nuclear Science and Conference proceedings.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.