R. Schorer

496 total citations
18 papers, 389 citations indexed

About

R. Schorer is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, R. Schorer has authored 18 papers receiving a total of 389 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 14 papers in Atomic and Molecular Physics, and Optics and 12 papers in Materials Chemistry. Recurrent topics in R. Schorer's work include Silicon Nanostructures and Photoluminescence (10 papers), Semiconductor materials and interfaces (9 papers) and Semiconductor Quantum Structures and Devices (7 papers). R. Schorer is often cited by papers focused on Silicon Nanostructures and Photoluminescence (10 papers), Semiconductor materials and interfaces (9 papers) and Semiconductor Quantum Structures and Devices (7 papers). R. Schorer collaborates with scholars based in Germany, Italy and United States. R. Schorer's co-authors include G. Abstreiter, Stefano de Gironcoli, Elisa Molinari, K. Eberl, E. Friess, E. E. Häller, H. Kibbel, H. Presting, W. Wegscheider and T. Ruf and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Thin Solid Films.

In The Last Decade

R. Schorer

17 papers receiving 376 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R. Schorer Germany 9 266 258 222 68 33 18 389
Z.-H. Huang United States 10 127 0.5× 181 0.7× 127 0.6× 50 0.7× 28 0.8× 24 315
J. S. Park United States 7 336 1.3× 292 1.1× 159 0.7× 60 0.9× 47 1.4× 9 451
A. J. Mayur United States 14 415 1.6× 280 1.1× 162 0.7× 49 0.7× 31 0.9× 38 505
S. Marklund Sweden 10 175 0.7× 235 0.9× 115 0.5× 38 0.6× 38 1.2× 16 307
V. D. Tkachev Belarus 11 294 1.1× 148 0.6× 247 1.1× 44 0.6× 64 1.9× 25 390
F. Voillot France 14 288 1.1× 344 1.3× 189 0.9× 38 0.6× 19 0.6× 36 453
G. Hadjisavvas Greece 12 251 0.9× 145 0.6× 280 1.3× 153 2.3× 23 0.7× 19 419
P. Hiesinger Germany 12 276 1.0× 336 1.3× 186 0.8× 104 1.5× 22 0.7× 24 472
D. V. Yurasov Russia 10 289 1.1× 230 0.9× 178 0.8× 69 1.0× 56 1.7× 71 378
Jan Van Steenbergen Belgium 15 638 2.4× 240 0.9× 190 0.9× 142 2.1× 24 0.7× 29 665

Countries citing papers authored by R. Schorer

Since Specialization
Citations

This map shows the geographic impact of R. Schorer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Schorer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Schorer more than expected).

Fields of papers citing papers by R. Schorer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Schorer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Schorer. The network helps show where R. Schorer may publish in the future.

Co-authorship network of co-authors of R. Schorer

This figure shows the co-authorship network connecting the top 25 collaborators of R. Schorer. A scholar is included among the top collaborators of R. Schorer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Schorer. R. Schorer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

18 of 18 papers shown
1.
Hänsch, W., D. J. Gravesteijn, R. Schorer, et al.. (1997). Defect-free strain relaxation in locally MBE-grown SiGe heterostructures. Thin Solid Films. 294(1-2). 27–32. 8 indexed citations
2.
Schorer, R., et al.. (1995). Angular dispersion of confined optical phonons in superlattices studied by micro-Raman spectroscopy. Solid State Communications. 93(10). 847–851. 18 indexed citations
3.
Fuchs, H. D., W. Walukiewicz, E. E. Häller, et al.. (1995). GermaniumGe70/74Ge isotope heterostructures: An approach to self-diffusion studies. Physical review. B, Condensed matter. 51(23). 16817–16821. 60 indexed citations
4.
Schorer, R., et al.. (1995). Optical anisotropy of superlattices: Resonant Raman scattering in in-plane geometry. Solid State Communications. 93(12). 1025–1029. 4 indexed citations
5.
Schorer, R. & G. Abstreiter. (1994). Phonons in semiconductor superlattices studied by in-plane Raman scattering. Philosophical Magazine B. 70(3). 671–686. 3 indexed citations
6.
Schorer, R., G. Abstreiter, Stefano de Gironcoli, et al.. (1994). Vibrational properties of Si/Ge superlattices: Theory and in-plane Raman scattering experiments. Solid-State Electronics. 37(4-6). 757–760. 6 indexed citations
7.
Spitzer, J., T. Ruf, M. Cardona, et al.. (1994). Raman scattering by optical phonons in isotopic70(Ge)n74(Ge)nsuperlattices. Physical Review Letters. 72(10). 1565–1568. 56 indexed citations
8.
Schorer, R., G. Abstreiter, H. Kibbel, & H. Presting. (1994). Resonant-Raman-scattering study on short-period Si/Ge superlattices. Physical review. B, Condensed matter. 50(24). 18211–18218. 13 indexed citations
9.
Schorer, R., G. Abstreiter, Stefano de Gironcoli, et al.. (1994). In-plane Raman scattering of (001)-Si/Ge superlattices: Theory and experiment. Physical review. B, Condensed matter. 49(8). 5406–5414. 57 indexed citations
10.
Abstreiter, G., J. Olajos, R. Schorer, P. Vogl, & W. Wegscheider. (1993). Properties of Sn/Ge superlattices. Semiconductor Science and Technology. 8(1S). S6–S8. 5 indexed citations
11.
Koynov, S., R. Schwarz, T. Fischer, & R. Schorer. (1993). Properties and stability of hydrogenated amorphous silicon films with a low hydrogen content prepared by cyclic chemical vapour deposition and hydrogenation. Materials Science and Engineering B. 17(1-3). 82–86.
12.
Schorer, R., et al.. (1993). Raman scattering of α-Sn/Ge superlattices on Ge (001). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 11(3). 1069–1072. 11 indexed citations
13.
Lütjering, G., et al.. (1993). Sn and Sb segregation and their possible use as surfactant for short-period Si/Ge superlattices. Journal of Crystal Growth. 127(1-4). 440–442. 28 indexed citations
14.
Gironcoli, Stefano de, Elisa Molinari, R. Schorer, & G. Abstreiter. (1993). Interface mode in Si/Ge superlattices: Theory and experiments. Physical review. B, Condensed matter. 48(12). 8959–8962. 42 indexed citations
15.
Schorer, R., W. Wegscheider, K. Eberl, et al.. (1992). In-plane Raman scattering of [001]-grown Si/Ge superlattices. Thin Solid Films. 222(1-2). 269–273. 4 indexed citations
16.
Schorer, R., et al.. (1991). Structural stability of short-period Si/Ge superlattices studied with Raman spectroscopy. Physical review. B, Condensed matter. 44(4). 1772–1781. 61 indexed citations
17.
Friess, E., R. Schorer, K. Eberl, & G. Abstreiter. (1991). Stability and interdiffusion of short-period Si/Ge strained layer superlattices. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(4). 2045–2047. 6 indexed citations
18.
Eberl, K., W. Wegscheider, R. Schorer, & G. Abstreiter. (1991). Microscopic symmetry properties of (001) Si/Ge monolayer superlattices. Physical review. B, Condensed matter. 43(6). 5188–5191. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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