Savir

610 total citations
11 papers, 473 citations indexed

About

Savir is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, Savir has authored 11 papers receiving a total of 473 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Hardware and Architecture, 8 papers in Electrical and Electronic Engineering and 4 papers in Control and Systems Engineering. Recurrent topics in Savir's work include VLSI and Analog Circuit Testing (8 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Radiation Effects in Electronics (3 papers). Savir is often cited by papers focused on VLSI and Analog Circuit Testing (8 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Radiation Effects in Electronics (3 papers). Savir collaborates with scholars based in United States. Savir's co-authors include Smith and Spencer and has published in prestigious journals such as IEEE Transactions on Computers.

In The Last Decade

Savir

11 papers receiving 439 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Savir United States 8 419 374 77 42 40 11 473
H. Y. Chang United States 10 331 0.8× 267 0.7× 114 1.5× 46 1.1× 40 1.0× 16 423
Dimitri Kagaris United States 11 307 0.7× 311 0.8× 55 0.7× 31 0.7× 21 0.5× 77 393
L.M. Huisman United States 12 494 1.2× 472 1.3× 60 0.8× 25 0.6× 28 0.7× 30 543
P.R. Menon United States 9 284 0.7× 276 0.7× 38 0.5× 53 1.3× 83 2.1× 17 395
P.R. Menon United States 16 885 2.1× 798 2.1× 64 0.8× 104 2.5× 84 2.1× 48 946
H.-K.T. Ma United States 9 458 1.1× 401 1.1× 24 0.3× 60 1.4× 101 2.5× 20 513
Srivaths Ravi United States 11 334 0.8× 296 0.8× 37 0.5× 40 1.0× 47 1.2× 43 419
G. Saucier France 14 438 1.0× 402 1.1× 28 0.4× 29 0.7× 144 3.6× 79 575
S. Venkataraman United States 12 702 1.7× 690 1.8× 107 1.4× 45 1.1× 16 0.4× 27 745
D. B. Armstrong Japan 8 451 1.1× 438 1.2× 69 0.9× 67 1.6× 112 2.8× 12 605

Countries citing papers authored by Savir

Since Specialization
Citations

This map shows the geographic impact of Savir's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Savir with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Savir more than expected).

Fields of papers citing papers by Savir

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Savir. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Savir. The network helps show where Savir may publish in the future.

Co-authorship network of co-authors of Savir

This figure shows the co-authorship network connecting the top 25 collaborators of Savir. A scholar is included among the top collaborators of Savir based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Savir. Savir is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

11 of 11 papers shown
1.
Savir, et al.. (1987). Fault Propagation Through Embedded Multiport Memories. IEEE Transactions on Computers. C-36(5). 592–602. 3 indexed citations
2.
Savir. (1986). The Bidirectional Double Latch (BDDL). IEEE Transactions on Computers. C-35(1). 65–66. 7 indexed citations
3.
Spencer & Savir. (1985). Layout Influences Testability. IEEE Transactions on Computers. C-34(3). 287–290. 12 indexed citations
4.
Savir, et al.. (1984). On Random Pattern Test Length. IEEE Transactions on Computers. C-33(6). 467–474. 160 indexed citations
5.
Savir. (1983). Good Controllability and Observability Do Not Guarantee Good Testability. IEEE Transactions on Computers. C-32(12). 1198–1200. 41 indexed citations
6.
Savir. (1983). A New Empirical Test for the Quality of Random Integer Generators. IEEE Transactions on Computers. C-32(10). 960–961. 7 indexed citations
7.
Savir. (1981). Syndrome-Testing of " Syndrome-Untestable" Combinational Circuits. IEEE Transactions on Computers. C-30(8). 606–608. 17 indexed citations
8.
Savir, et al.. (1981). The Weighted Syndrome Sums Approach to VLSI Testing. IEEE Transactions on Computers. C-30(12). 996–1000. 44 indexed citations
9.
Savir. (1980). Syndrome-Testable Design of Combinational Circuits. IEEE Transactions on Computers. C-29(6). 442–451. 151 indexed citations
10.
Savir. (1980). Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection. IEEE Transactions on Computers. C-29(5). 410–416. 24 indexed citations
11.
Savir. (1980). Detection of Single Intermittent Faults in Sequential Circuits. IEEE Transactions on Computers. C-29(7). 673–678. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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