Piotr Edelman

648 total citations
42 papers, 497 citations indexed

About

Piotr Edelman is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Piotr Edelman has authored 42 papers receiving a total of 497 indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Electrical and Electronic Engineering, 10 papers in Surfaces, Coatings and Films and 9 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Piotr Edelman's work include Integrated Circuits and Semiconductor Failure Analysis (25 papers), Silicon and Solar Cell Technologies (22 papers) and Semiconductor materials and devices (11 papers). Piotr Edelman is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (25 papers), Silicon and Solar Cell Technologies (22 papers) and Semiconductor materials and devices (11 papers). Piotr Edelman collaborates with scholars based in United States, Germany and Poland. Piotr Edelman's co-authors include J. Łagowski, Worth B. Henley, L. Jastrzȩbski, Marshall Wilson, Andrew Hoff, Dmitriy Marinskiy, A. Morawski, T. Bryśkiewicz, David Coulas and Julian P. Noad and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Environmental Health Perspectives.

In The Last Decade

Piotr Edelman

33 papers receiving 446 citations

Peers

Countries citing papers authored by Piotr Edelman

Since Specialization

Citations

This map shows the geographic impact of Piotr Edelman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Piotr Edelman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Piotr Edelman more than expected).

Fields of papers citing papers by Piotr Edelman

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Piotr Edelman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Piotr Edelman. The network helps show where Piotr Edelman may publish in the future.

Co-authorship network of co-authors of Piotr Edelman

This figure shows the co-authorship network connecting the top 25 collaborators of Piotr Edelman. A scholar is included among the top collaborators of Piotr Edelman based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Piotr Edelman. Piotr Edelman is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Surface Voltage and μPCD Mapping of Defect in Epitaxial SiC 2016 ·Materials science forum ·Marshall Wilson, (unknown), (unknown), J. Łagowski, Piotr Edelman, Dmitriy Marinskiy, John D’Amico, (unknown), (unknown), (unknown)	3
2	Non-Visual Defect Monitoring with Surface Voltage Mapping: Application for Semiconductor IC and PV Technology 2015 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Piotr Edelman, Dmitriy Marinskiy, (unknown), John D’Amico, (unknown), Marshall Wilson, Carlos Almeida, J. Łagowski	1
3	Non-Visual Defect Monitoring with Surface Voltage Mapping 2015 ·ECS Journal of Solid State Science and Technology ·(unknown), Dmitriy Marinskiy, Piotr Edelman, Marshall Wilson, (unknown), J. Łagowski	4
4	Improved QSS-μPCD measurement with quality of decay control: Correlation with steady-state carrier lifetime 2012 ·Solar Energy Materials and Solar Cells ·Marshall Wilson, Piotr Edelman, J. Łagowski, Sara Olibet, Valentin D. Mihailetchi	14
5	Band offset diagnostics of advanced dielectrics 2008 ·Journal of Materials Science Materials in Electronics ·Piotr Edelman, Marshall Wilson, John D’Amico, (unknown), J. Łagowski	2
6	Digital SPV Diffusion Length Metrology (E8-Fe) for Ultra-High Purity Silicon Wafers 2008 ·ECS Transactions ·Marshall Wilson, (unknown), (unknown), John D’Amico, Piotr Edelman, (unknown), J. Łagowski	1
7	Non-contact C-V measurements of ultra thin dielectrics 2004 ·The European Physical Journal Applied Physics ·Piotr Edelman, (unknown), Marshall Wilson, John D’Amico, (unknown), Dmitriy Marinskiy, J. Łagowski	11
8	Non-Contact C-V Technique for high-k Applications 2003 ·AIP conference proceedings ·Piotr Edelman	1
9	A novel approach to monitoring of plasma processing equipment and plasma damage without test structures 2002 ·Andrew Hoff, K. Nauka, (unknown), Emil Persson, J. Łagowski, L. Jastrzȩbski, Piotr Edelman	4
10	Full wafer non-contact mapping of electrical properties of ultra-thin advanced dielectrics on Si 2002 ·Materials Science and Engineering B ·Piotr Edelman, J. Łagowski, (unknown), Marshall Wilson, (unknown), Dmitriy Marinskiy, J. Navarro	1
11	Monitoring of mobile sodium ions in SiO2 using corona charging 1997 ·F. A. Stevie, Eric Persson, (unknown), (unknown), Andrew Hoff, Piotr Edelman, J. Łagowski	1
12	A New, Real-Time Method for Measuring Mobile Charge and Injected Charge in SiO₂ on Si 1996 ·MRS Proceedings ·Piotr Edelman, J. Łagowski, (unknown), Andrew Hoff, L. Jastrzȩbski, Eric Persson	1
13	Contamination Monitoring Using Surface Photovoltage and Application to Process Line Control 1994 ·MRS Proceedings ·L. Jastrzȩbski, J. Łagowski, Worth B. Henley, Piotr Edelman	0
14	Method for the measurement of long minority carrier diffusion lengths exceeding wafer thickness 1993 ·Applied Physics Letters ·J. Łagowski, (unknown), L. Jastrzȩbski, Piotr Edelman	46
15	Non-contact deep level transient spectroscopy (DLTS) based on surface photovoltage 1992 ·Semiconductor Science and Technology ·J. Łagowski, Piotr Edelman, A. Morawski	11
16	Surface Charge Imaging in Semiconductor Wafers by Surface Photovoltage (SPV) 1992 ·MRS Proceedings ·Piotr Edelman, J. Łagowski, L. Jastrzȩbski	6
17	Photoluminescence and minority carrier diffusion length imaging in silicon and GaAs 1992 ·Semiconductor Science and Technology ·Piotr Edelman, Worth B. Henley, J. Łagowski	4
18	Non-Contact, Wafer-Scale Deep Level Transient Spectroscopy (DLTS) Based on Surface Photovoltage (SPV) 1991 ·MRS Proceedings ·J. Łagowski, A. Morawski, Piotr Edelman	1
19	Environmental and workplace contamination in the semiconductor industry: implications for future health of the workforce and community. 1990 ·Environmental Health Perspectives ·Piotr Edelman	50
20	Properties of very uniform InxGa1−xAs single crystals grown by liquid-phase electroepitaxy 1990 ·Journal of Applied Physics ·T. Bryśkiewicz, Piotr Edelman, Z. R. Wasilewski, David Coulas, Julian P. Noad	34

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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