Marshall Wilson

834 total citations
61 papers, 632 citations indexed

About

Marshall Wilson is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Marshall Wilson has authored 61 papers receiving a total of 632 indexed citations (citations by other indexed papers that have themselves been cited), including 57 papers in Electrical and Electronic Engineering, 10 papers in Materials Chemistry and 9 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Marshall Wilson's work include Integrated Circuits and Semiconductor Failure Analysis (32 papers), Silicon and Solar Cell Technologies (27 papers) and Semiconductor materials and devices (25 papers). Marshall Wilson is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (32 papers), Silicon and Solar Cell Technologies (27 papers) and Semiconductor materials and devices (25 papers). Marshall Wilson collaborates with scholars based in United States, Germany and Singapore. Marshall Wilson's co-authors include G. M. Zaslavsky, D. A. Usikov, J. Łagowski, Dmitriy Marinskiy, John D’Amico, Piotr Edelman, L. Jastrzȩbski, Kristopher O. Davis, Winston V. Schoenfeld and Armin G. Aberle and has published in prestigious journals such as Solar Energy Materials and Solar Cells, Thin Solid Films and Japanese Journal of Applied Physics.

In The Last Decade

Marshall Wilson

53 papers receiving 564 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Marshall Wilson United States 12 440 158 111 98 75 61 632
Shai Levy Israel 10 169 0.4× 540 3.4× 139 1.3× 83 0.8× 10 0.1× 25 751
Christian Tanguy France 19 358 0.8× 539 3.4× 267 2.4× 20 0.2× 15 0.2× 46 893
Hao Tian United States 10 393 0.9× 345 2.2× 51 0.5× 13 0.1× 11 0.1× 43 497
Wenjun Li United States 14 302 0.7× 90 0.6× 39 0.4× 44 0.4× 3 0.0× 19 463
Adam M. Darr United States 13 346 0.8× 225 1.4× 76 0.7× 13 0.1× 4 0.1× 34 440
M. Hosoda Japan 13 344 0.8× 425 2.7× 82 0.7× 15 0.2× 3 0.0× 74 555
Randall Kirschman United States 10 317 0.7× 145 0.9× 82 0.7× 15 0.2× 3 0.0× 33 522
Nam Kim South Korea 15 227 0.5× 408 2.6× 214 1.9× 33 0.3× 3 0.0× 47 632
Yueheng Zhang China 13 209 0.5× 176 1.1× 95 0.9× 5 0.1× 7 0.1× 39 431
Dan Lev United States 11 769 1.7× 102 0.6× 66 0.6× 6 0.1× 9 0.1× 36 932

Countries citing papers authored by Marshall Wilson

Since Specialization
Citations

This map shows the geographic impact of Marshall Wilson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Marshall Wilson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Marshall Wilson more than expected).

Fields of papers citing papers by Marshall Wilson

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Marshall Wilson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Marshall Wilson. The network helps show where Marshall Wilson may publish in the future.

Co-authorship network of co-authors of Marshall Wilson

This figure shows the co-authorship network connecting the top 25 collaborators of Marshall Wilson. A scholar is included among the top collaborators of Marshall Wilson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Marshall Wilson. Marshall Wilson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Karhu, Robin, G. Polisski, Marshall Wilson, et al.. (2025). Non-Contact Full Wafer Imaging of Electrically Active Defects in 4H-SiC Epi with Comparison to End of Line Electrical Device Data. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 376. 63–69.
2.
Wilson, Marshall, et al.. (2023). Recent Progress in Non-Contact Electrical Characterization for SiC and Related Compounds. Materials science forum. 1089. 51–56. 2 indexed citations
3.
Sanchez, Edward, et al.. (2023). Optimizing Non-Contact Doping and Electrical Defect Metrology for Production of SiC Epitaxial Wafers. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 342. 99–104. 2 indexed citations
4.
5.
6.
Wilson, Marshall, et al.. (2018). Work function and induced band bending characterization for engineering of selective contact for solar cells. Advanced Materials Letters. 9(9). 629–631. 1 indexed citations
7.
Wilson, Marshall, et al.. (2017). Review—Recent Advancement in Charge- and Photo-Assisted Non-Contact Electrical Characterization of SiC, GaN, and AlGaN/GaN HEMT. ECS Journal of Solid State Science and Technology. 6(11). S3129–S3140. 9 indexed citations
8.
Ali, Haider, Anamaria Moldovan, Sebastian Mack, et al.. (2017). Influence of surface preparation and cleaning on the passivation of boron diffused silicon surfaces for high efficiency photovoltaics. Thin Solid Films. 636. 412–418. 11 indexed citations
9.
Wilson, Marshall, et al.. (2017). Piezoelectric modulation of surface voltage in GaN and AlGaN/GaN: charge screening effects and 2DEG. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10104. 101041E–101041E. 1 indexed citations
10.
Wilson, Marshall, et al.. (2016). Surface Voltage and μPCD Mapping of Defect in Epitaxial SiC. Materials science forum. 858. 353–356. 3 indexed citations
11.
Edelman, Piotr, Dmitriy Marinskiy, John D’Amico, et al.. (2015). Non-Visual Defect Monitoring with Surface Voltage Mapping: Application for Semiconductor IC and PV Technology. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 242. 472–477. 1 indexed citations
12.
Łagowski, J., et al.. (2013). Inline PL Inspection and Advanced Offline Evaluation of Passivation Defects, Charge and Interfaces. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 205-206. 128–135. 2 indexed citations
13.
D’Amico, John, Marshall Wilson, Carlos Almeida, J. Łagowski, & Sara Olibet. (2013). Advanced Interface Trap Metrology for Silicon PV. EU PVSEC. 877–882. 4 indexed citations
14.
Davis, Kristopher O., et al.. (2013). Influence of precursor gas ratio and firing on silicon surface passivation by APCVD aluminium oxide. physica status solidi (RRL) - Rapid Research Letters. 7(11). 942–945. 15 indexed citations
15.
Duttagupta, Shubham, Fen Lin, Marshall Wilson, et al.. (2012). State-of-the-art surface passivation of boron emitters using inline PECVD AlO<inf>x</inf>/SiN<inf>x</inf> stacks for industrial high-efficiency silicon wafer solar cells. National University of Singapore. 1036–1039. 5 indexed citations
16.
17.
Wilson, Marshall, et al.. (2011). Novel noncontact approach to monitoring the field-effect passivation of emitters. Energy Procedia. 8. 71–77. 3 indexed citations
18.
Peter, K., et al.. (2010). Multicrystalline solar grade silicon solar cells. 799–805. 8 indexed citations
19.
Wilson, Marshall, et al.. (1999). New COCOS(Corona Oxide Characterization of Semiconductor) method for monitoring the reliability of thin gate oxides.. Proc SPIE. 3895. 373–384.
20.
D’Amico, John, et al.. (1999). <title>Effect of Fe and Cu contamination on the reliability of ultrathin gate oxides</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3884. 124–135. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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