Peter Z. Takacs

1.7k citations

107 papers · 1.3k indexed · h-index 19

Radiation top 2%
- Advanced X-ray Imaging Techniques 19
Computational Mechanics top 2%
- Surface Roughness and Optical Measurements 50
Structural Biology top 10%
Surfaces, Coatings and Films top 5%
Mechanical Engineering top 5%
- Advanced Measurement and Metrology Techniques 52
Computer Vision and Pattern Recognition
- Optical measurement and interference techniques 24
Biomedical Engineering
- Advanced Surface Polishing Techniques 23
Electrical and Electronic Engineering
- CCD and CMOS Imaging Sensors 16
Aerospace Engineering
- Calibration and Measurement Techniques 14
- Infrared Target Detection Methodologies 13

Co-authors: E. L. Church Shinan Qian Wayne R. McKinney John C. Sutherland Valeriy V. Yashchuk Thomas A. Leonard E. J. Desmond P. O’Connor
Cited by: Radiation Computational Mechanics Structural Biology
Journals: Proceedings of the National Academy of Sciences (1 paper)Wear (1 paper)Review of Scientific Instruments (2 papers)
Partner nations: United States Czechia France

In The Last Decade

Peter Z. Takacs

101 papers receiving 1.2k citations

Peers

Countries citing papers authored by Peter Z. Takacs

Since Specialization

Citations

This map shows the geographic impact of Peter Z. Takacs's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Z. Takacs with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Z. Takacs more than expected).

Fields of papers citing papers by Peter Z. Takacs

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Peter Z. Takacs. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Z. Takacs. The network helps show where Peter Z. Takacs may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Peter Z. Takacs, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Peter Z. Takacs Line = papers co-authored together Peter Z. Takacs links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Binary pseudo-random array standards for calibration of 3D optical surface profilers used for metrology with significantly curved x-ray optics eScholarship (California Digital Library) ·Keiko Munechika,Kaito Yamada,Simon Rochester,Harold Barnard,Weilun Chao,Ian Lacey,Carlos Piña-Hernandez,Peter Z. Takacs,Valeriy V. Yashchuk	2024	1
2	Performance of plane wavefront Fizeau interferometers in power spectral density measurements with tilted plane optics eScholarship (California Digital Library) ·Valeriy V. Yashchuk,Keiko Munechika,Simon Rochester,Peter Z. Takacs,Ian Lacey,Kaito Yamada	2024	0
3	Surface profiling interferometer OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) ·Peter Z. Takacs	2023	0
4	DABAM: an open-source database of X-ray mirrors metrology Journal of Synchrotron Radiation ·Manuel Sánchez del Río,Davide Bianchi,Daniele Cocco,Mark Glass,Mourad Idir,Jim Metz,Lorenzo Raimondi,Luca Rebuffi,R. Reininger,Xianbo Shi,Frank Siewert,Sibylle Spielmann-Jaeggi,Peter Z. Takacs,Muriel Tomasset,T.W. Tonnessen,Amparo Vivo,Valeriy V. Yashchuk	2016	15
5	Standardization of methods for extracting statistics from surface profile measurements Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Peter Z. Takacs	2014	3
6	Status of multi-beam long trace-profiler development Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Mikhail V. Gubarev,Daniel J. Merthe,Kiranmayee Kilaru,Thomas Kester,Brian D. Ramsey,Wayne R. McKinney,Peter Z. Takacs,Andrew Dahir,Valeriy V. Yashchuk	2013	2
7	CCD characterization and measurements automation Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·I. Kotov,Jonathan H. Frank,A.I. Kotov,P. Kubánek,P. O’Connor,M. Prouza,V. Radeka,Peter Z. Takacs	2011	10
8	Model-independent Characterization of Charge Diffusion in Thick Fully Depleted CCDs Publications of the Astronomical Society of the Pacific ·David M. Lawrence,P. O’Connor,James S. Frank,Peter Z. Takacs	2011	3
9	PSF and MTF measurement methods for thick CCD sensor characterization Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Peter Z. Takacs,I. Kotov,Jonathan H. Frank,P. O’Connor,V. Radeka,David M. Lawrence	2010	15
10	LSST sensor requirements and characterization of the prototype LSST CCDs Journal of Instrumentation ·V. Radeka,Jonathan H. Frank,John C. Geary,D. K. Gilmore,I. Kotov,P. O’Connor,Peter Z. Takacs,J. A. Tyson	2009	19
11	Calibrations of LSST camera and telescope systems Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·David Burke,T. S. Axelrod,C. F. Claver,James S. Frank,John C. Geary,K. Gilmore,Željko Ivezić,Victor L. Krabbendam,D. G. Monet,P. O’Connor,J. Oliver,E.B. Olszewski,Philip A. Pinto,Abhijit Saha,Chris Smith,C. W. Stubbs,Peter Z. Takacs,Anthony Tyson	2006	1
12	Improvements in the accuracy and the repeatability of long trace profiler measurements Applied Optics ·Peter Z. Takacs,E. L. Church,Cynthia J. Bresloff,Lahsen Assoufid	1999	53
13	<title>Light scattering from non-Gaussian surfaces</title> Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·E. L. Church,Peter Z. Takacs	1995	11
14	Specification of the Figure and Finish of EUV Mirrors in Terms of Performance Requirements E. L. Church,Peter Z. Takacs	1994	0
15	Specifying the Surface Finish of X-Ray Mirrors E. L. Church,Peter Z. Takacs	1993	1
16	Surface roughness and scattering: papers from the first topical meeting Applied Optics ·Jean M. Bennett,Peter Z. Takacs	1993	2
17	Subsurface And Volume Scattering From Smooth Surfaces Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·E. L. Church,Peter Z. Takacs	1990	4
18	Fabrication Of An 8:1 Ellipsoidal Mirror For A Synchrotron X-Ray Microprobe Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Keith Jones,Peter Z. Takacs,Jerome Hastings,John M. Casstevens,Christopher D. Pionke	1987	11
19	Sputter deposition system for controlled fabrication of multilayers Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Robert P. Di Nardo,Peter Z. Takacs,C. F. Majkrzak,P. Stefan	1985	1
20	Evaluation of CVD silicon carbide for synchrotron radiation mirrors Nuclear Instruments and Methods in Physics Research ·Peter Z. Takacs	1982	4

About Peter Z. Takacs

Peter Z. Takacs is a scholar working on Computational Mechanics, Radiation and Mechanical Engineering, having authored 107 papers that have together received 1.3k indexed citations. Recurring topics across this work include Advanced Measurement and Metrology Techniques (52 papers), Surface Roughness and Optical Measurements (50 papers), Optical measurement and interference techniques (24 papers), Advanced Surface Polishing Techniques (23 papers), Advanced X-ray Imaging Techniques (19 papers), CCD and CMOS Imaging Sensors (16 papers), Calibration and Measurement Techniques (14 papers) and Infrared Target Detection Methodologies (13 papers). The work is most often cited by research in Radiation (399 citations), Computational Mechanics (470 citations) and Structural Biology (22 citations). Peter Z. Takacs has collaborated with scholars based in United States, Czechia and France. Frequent co-authors include E. L. Church, Shinan Qian, Wayne R. McKinney, John C. Sutherland, Valeriy V. Yashchuk, Thomas A. Leonard, E. J. Desmond, P. O’Connor, I. Kotov and Lahsen Assoufid. Their work appears in journals such as Proceedings of the National Academy of Sciences, Wear and Review of Scientific Instruments.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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