Ian Lacey

410 citations
44 papers · 319 · h-index 12

Impact in

Papers in

    • Advanced Measurement and Metrology Techniques 33
    • Advanced X-ray Imaging Techniques 23
    • X-ray Spectroscopy and Fluorescence Analysis 2

Ian Lacey

39 papers receiving 313 citations

Peers

Ian Lacey
Comparison fields: 5 of 29
  • Radiation 154
  • Statistics, Probability and Uncertainty 78
  • Computer Vision and Pattern Recognition 162
  • Mechanical Engineering 264
  • Computational Mechanics 134
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Citations per field
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Citations per year

Countries citing papers authored by Ian Lacey

Since Specialization
Citations

This map shows the geographic impact of Ian Lacey's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ian Lacey with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ian Lacey more than expected).

Fields of papers citing papers by Ian Lacey

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ian Lacey. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ian Lacey. The network helps show where Ian Lacey may publish in the future.

Co-authors

The 25 scholars most cited alongside Ian Lacey, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Ian Lacey Line = papers co-authored together Ian Lacey links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 44 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201530
2 201425
3 201321
4 201419
5 201918
6 201615
7 201614
8 201913
9 201912
10 202012
11 201812
12 201911
13 201710
14 202010
15 201810
16 20178
17 20157
18 20187
19 20216
20 20216

About Ian Lacey

Ian Lacey is a scholar working on Mechanical Engineering, Radiation, Computer Vision and Pattern Recognition, Computational Mechanics and Statistics, Probability and Uncertainty, having authored 44 papers that have together received 319 indexed citations. Recurring topics across this work include Advanced Measurement and Metrology Techniques (33 papers), Advanced X-ray Imaging Techniques (23 papers), Optical measurement and interference techniques (21 papers), Surface Roughness and Optical Measurements (16 papers), Scientific Measurement and Uncertainty Evaluation (9 papers), Advanced Surface Polishing Techniques (5 papers), Advancements in Photolithography Techniques (3 papers) and X-ray Spectroscopy and Fluorescence Analysis (2 papers). The work is most often cited by research in Radiation (154 citations), Statistics, Probability and Uncertainty (78 citations), Computer Vision and Pattern Recognition (162 citations), Mechanical Engineering (264 citations) and Computational Mechanics (134 citations). Ian Lacey has collaborated with scholars based in United States, Germany and France. Frequent co-authors include Valeriy V. Yashchuk, Nikolay A. Artemiev, Wayne R. McKinney, H. A. Padmore, Brian V. Smith, A. Just, Simon Rochester, Ralf D. Geckeler, Gary P. Centers and Keiko Munechika. Their work appears in journals such as Review of Scientific Instruments, Journal of Synchrotron Radiation, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Optical Engineering and Synchrotron Radiation News.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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